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Geometric moiré methods with enhanced sensitivity by optical/digital fringe multiplication
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What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
inferredcites →https://doi.org/10.1007/bf02326400openalex-snapshot
Sharpening and multiplication of moiré fringes
inferredcites →https://doi.org/10.1007/bf02327564openalex-snapshot
Diffraction theory of optical interference moiré and a device for production of variable virtual reference gratings: A moiré microscope
inferredcites →https://doi.org/10.1016/0030-4018(85)90292-5openalex-snapshot
Moiré signals in reflection
inferredcites →https://doi.org/10.1016/c2013-0-05523-5openalex-snapshot
Moiré Fringes in Strain Analysis
inferredcites →https://doi.org/10.1117/12.57681openalex-snapshot
Higher sensitivity moire interferometry for micromechanics studies
inferredcites →https://doi.org/10.1364/ao.32.004713openalex-snapshot
Interferometric methods with enhanced sensitivity by optical/digital fringe multiplication
inferredcites →https://doi.org/10.1364/josaa.2.000111openalex-snapshot
Diffraction effects in moiré deflectometry
What points at this work
Incoming claims: where this work appears in other papers’ reference lists and arguments.
inferred← citeshttps://doi.org/10.1016/0956-7151(94)90452-9openalex-snapshot
Experimental characterization of the local strain field in a heterogeneous elastoplastic material
inferred← citeshttps://doi.org/10.1016/j.ndteint.2004.09.003openalex-snapshot
Development of the marks tracking technique for strain field and volume variation measurements
inferred← citeshttps://doi.org/10.1023/a:1004874911909openalex-snapshot
The use of digital images to determine deformation throughout a microstructure Part I Deformation mapping technique
inferred← citeshttps://doi.org/10.1111/j.1475-1305.2001.tb01237.xopenalex-snapshot
Three Optical Procedures for Local Large‐Strain Measurement
inferred← citeshttps://doi.org/10.1117/1.1391436openalex-snapshot
Sensitivity enhancement of far-infrared Fizeau interferometry by digital image processing
inferred← citeshttps://doi.org/10.1117/12.2035685openalex-snapshot
Research status and developing trends of grating nanometer measuring technology
inferred← citeshttps://doi.org/10.11648/j.optics.s.2015040301.20openalex-snapshot
Deformation Measurement Method Using Moiré Fringes at High Scanning Speed Under a Laser Scanning Microscope
inferred← citeshttps://doi.org/10.1243/0309324981512878openalex-snapshot
Moiré strain analysis: An introduction, review and critique, including related techniques and future potential
inferred← citeshttps://doi.org/10.1364/ao.32.004713openalex-snapshot
Interferometric methods with enhanced sensitivity by optical/digital fringe multiplication
inferred← citeshttps://doi.org/10.20965/ijat.2015.p0494openalex-snapshot
Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales
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