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Phase-measuring profilometry using sinusoidal grating

https://doi.org/10.1007/bf02322487
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What this work says

Outgoing claims: the papers this work cites, builds on, or argues with.

inferredcites →https://doi.org/10.1007/bf02321416openalex-snapshot
Computerized fringe analysis in photomechanics
inferredcites →https://doi.org/10.1007/bf02325175openalex-snapshot
Automatic analysis of moiré fringe patterns by using an image-processing system
inferredcites →https://doi.org/10.1007/bf02325996openalex-snapshot
Phase-stepped fractional moiré
inferredcites →https://doi.org/10.1016/0143-8166(91)90029-sopenalex-snapshot
On-line automated phase-measuring profilometry
inferredcites →https://doi.org/10.1117/12.942874openalex-snapshot
Small Angle Moire Contouring
inferredcites →https://doi.org/10.1117/12.962775openalex-snapshot
Field Shift Moire, A New Technique For Absolute Range Measurement
inferredcites →https://doi.org/10.1364/ao.22.003421openalex-snapshot
Digital wave-front measuring interferometry: some systematic error sources
inferredcites →https://doi.org/10.1364/ao.23.003105openalex-snapshot
Automated phase-measuring profilometry of 3-D diffuse objects
inferredcites →https://doi.org/10.1364/ao.24.003053openalex-snapshot
Phase-shifting speckle interferometry
inferredcites →https://doi.org/10.1364/ao.24.003780openalex-snapshot
High precision deformation measurement by digital phase shifting holographic interferometry
inferredcites →https://doi.org/10.1364/ao.27.003782openalex-snapshot
Spin filtering processes and automatic extraction of fringe centerlines in digitial interferometric patterns
inferredcites →https://doi.org/10.1364/ao.27.005082openalex-snapshot
Accuracy of phase shifting interferometry

What points at this work

Incoming claims: where this work appears in other papers’ reference lists and arguments.

inferred← citeshttps://doi.org/10.1002/j.2168-0159.2012.tb05996.xopenalex-snapshot
P‐25: 3‐D Surface Profilometry for Accurate Extraction of Depth Profile with LC Phase Modulator
inferred← citeshttps://doi.org/10.1007/bf00326227openalex-snapshot
A machine vision technique for subpixel estimation of three-dimensional profilometry
inferred← citeshttps://doi.org/10.1007/s12043-013-0666-5openalex-snapshot
Optimization for sinusoidal profiles in surface relief gratings recorded on photoresist
inferred← citeshttps://doi.org/10.1016/j.ijleo.2015.07.003openalex-snapshot
Optimized design of composite grating in real-time three-dimensional shape measurement
inferred← citeshttps://doi.org/10.1016/j.ijleo.2017.04.043openalex-snapshot
Specular reflection compensation in homography fringe projection profilometry
inferred← citeshttps://doi.org/10.1016/j.measurement.2010.05.005openalex-snapshot
Multi-beam laser probe for measuring position and orientation of freeform surface
inferred← citeshttps://doi.org/10.1016/j.optlaseng.2011.03.013openalex-snapshot
A composite-structured-light 3D measurement method based on fringe parameter calibration
inferred← citeshttps://doi.org/10.1016/j.optlaseng.2020.106373openalex-snapshot
Effect of surface normal variability on local surface strain measurements in StereoDIC
inferred← citeshttps://doi.org/10.1080/02533839.1993.9677538openalex-snapshot
A minimum zone method for evaluating flatness error of gage blocks measured by phase‐shifting interferometry
inferred← citeshttps://doi.org/10.1109/eptc.1997.723923openalex-snapshot
Measurement of thermally induced warpage of BGA packages/substrates using phase-stepping shadow moire
inferred← citeshttps://doi.org/10.1109/iccv.2011.6126384openalex-snapshot
Pushing the limits of digital imaging using structured illumination
inferred← citeshttps://doi.org/10.1117/1.1405416openalex-snapshot
Noncontact probe for profilometric measurement of small-form parts
inferred← citeshttps://doi.org/10.1117/1.1483087openalex-snapshot
Novel coordinate mapping algorithm for three-dimensional profile noncontact measurement
inferred← citeshttps://doi.org/10.1117/1.3407430openalex-snapshot
Phase error correction by π-shift odd-step fringe projection and speckle filtering in phase measuring profilometry
inferred← citeshttps://doi.org/10.1117/1.600838openalex-snapshot
Noncontact profilometric measurement of large-form parts
inferred← citeshttps://doi.org/10.1117/1.oe.57.3.034105openalex-snapshot
Improved three-dimensional profile measuring method based on intensity-ratio measurement
inferred← citeshttps://doi.org/10.1201/9781420034219.ch11openalex-snapshot
Out-Of-Plane Deformation, Flatness And Shape Measurement
inferred← citeshttps://doi.org/10.1364/ao.499498openalex-snapshot
Phase retrieval for dual-projection pattern based on orthogonal frequency encoding to suppress superposing effects
inferred← citeshttps://doi.org/10.1364/ao.51.002624openalex-snapshot
Multi-spatial-frequency and phase-shifting profilometry using a liquid crystal phase modulator
inferred← citeshttps://doi.org/10.1364/ao.51.007724openalex-snapshot
Three-dimensional shape measurement of a highly reflected, specular surface with structured light method
inferred← citeshttps://doi.org/10.1364/ao.56.000d84openalex-snapshot
Active computational imaging for circumventing resolution limits at macroscopic scales
inferred← citeshttps://doi.org/10.1364/dh.2009.jtub7openalex-snapshot
On-axis phase-shifting profilometry with two spatial frequencies using concentric-circular patterns
inferred← citeshttps://doi.org/10.1364/oe.17.007818openalex-snapshot
Profilometry without phase unwrapping using multi-frequency and four-step phase-shift sinusoidal fringe projection
inferred← citeshttps://doi.org/10.4028/www.scientific.net/amr.756-759.678openalex-snapshot
The Measurement of 3D Object Shape Based on Fourier Transform Profilometry
inferred← citeshttps://doi.org/10.4028/www.scientific.net/kem.295-296.171openalex-snapshot
A High Precision Three-Dimensional Optical Sensor Using Fourier Transform Profilometry
inferred← citeshttps://doi.org/10.5302/j.icros.2013.13.9039openalex-snapshot
Profilometry based on Structured Illumination with Hypercentric Optics
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