On the public citation graph
The influence of grating characteristics on moiré fringe multiplication
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What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
inferredcites →https://doi.org/10.1007/bf02326128openalex-snapshot
New optical methods of moiré fringe multiplication
inferredcites →https://doi.org/10.1016/b978-0-12-160050-1.50006-6openalex-snapshot
AN INTRODUCTION TO PHYSICAL OPTICS
inferredcites →https://doi.org/10.1016/b978-0-121-60050-1.x5001-8openalex-snapshot
Introduction to Applied Optics for Engineers
inferredcites →https://doi.org/10.1115/1.3607700openalex-snapshot
Multiplication and Interpolation of Moire´ Fringe Orders by Purely Optical Techniques
inferredcites →https://doi.org/10.1117/12.949559openalex-snapshot
Computer Generated Fringe Patterns In Speckle Analysis
inferredcites →https://doi.org/10.1364/ao.6.001938openalex-snapshot
Analysis of Moiré Fringe Multiplication Phenomena
What points at this work
Incoming claims: where this work appears in other papers’ reference lists and arguments.
inferred← citeshttps://doi.org/10.1007/0-306-46948-0_12openalex-snapshot
Theory of Moiré Fringe Formation with an Electron Beam
inferred← citeshttps://doi.org/10.1016/0143-8166(90)90012-xopenalex-snapshot
Sensitivity and resolution limitations of various moiré methods
inferred← citeshttps://doi.org/10.1016/b0-08-043749-4/08049-6openalex-snapshot
Nano-moiré Method and Nanoscopic Crack-tip Deformation
inferred← citeshttps://doi.org/10.1016/b978-0-12-822944-6.00158-4openalex-snapshot
Nano-moiré Method and Nanoscopic Crack-tip Deformation
inferred← citeshttps://doi.org/10.1016/j.jmatprotec.2004.01.042openalex-snapshot
A novel nano-Moiré method with scanning tunneling microscope (STM)
inferred← citeshttps://doi.org/10.1016/j.ultramic.2009.11.015openalex-snapshot
Scanning moiré fringe imaging by scanning transmission electron microscopy
inferred← citeshttps://doi.org/10.1088/0957-0233/15/9/007openalex-snapshot
A study on the digital nano-moiré method and its phase shifting technique
inferred← citeshttps://doi.org/10.1108/09540910310505107openalex-snapshot
Thermal strain analysis of an electronics package using the SEM Moiré technique
inferred← citeshttps://doi.org/10.1109/eptc.2003.1271497openalex-snapshot
Strain analysis of IC packages using a scanning Moire method
inferred← citeshttps://doi.org/10.11395/jjsem.13.s172openalex-snapshot
Dynamic Deformation Observation and Measurement of Porous Materials by Moiré Method Using High-Speed Digital Camera
inferred← citeshttps://doi.org/10.1364/ol.34.000112openalex-snapshot
Fabrication of micromodel grid for various moiré methods by femtosecond laser exposure
inferred← citeshttps://doi.org/10.5772/24036openalex-snapshot
Measurement of Strain Distribution of Composite Materials by Electron Moire Method
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