On the public citation graph
Effect of photographic-film nonlinearities on the processing of moiré-fringe data
0 signed · 17 inferred · view as graph
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What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
inferredcites →https://doi.org/10.1007/bf02324049openalex-snapshot
Basic optical law in the interpretation of moiré patterns applied to the analysis of strains—part 1
inferredcites →https://doi.org/10.1007/bf02326267openalex-snapshot
Techniques of fringe interpolation in moiré patterns
What points at this work
Incoming claims: where this work appears in other papers’ reference lists and arguments.
inferred← citeshttps://doi.org/10.1002/9781119994091.ch12openalex-snapshot
Photoelasticity Applications
inferred← citeshttps://doi.org/10.1002/9781119994091.ch13openalex-snapshot
Techniques that Measure Displacements
inferred← citeshttps://doi.org/10.1002/9781119994091.ch9openalex-snapshot
Optical Methods – Computer Vision
inferred← citeshttps://doi.org/10.1007/0-306-46948-0_45openalex-snapshot
An Extension of Holographic Moiré to Micromechanics
inferred← citeshttps://doi.org/10.1007/978-94-009-4416-9_40openalex-snapshot
Detection of Fringe Pattern Information Using a Computer Based Method
inferred← citeshttps://doi.org/10.1007/bf02408440openalex-snapshot
Techniques for the determination of absolute retardation in photoelasticity
inferred← citeshttps://doi.org/10.1007/bf02410478openalex-snapshot
Overview of optical techniques that measure displacements: Murray lecture
inferred← citeshttps://doi.org/10.1007/bf02410533openalex-snapshot
Strain measurements in the nanometer range in a particulate composite using computer-aided moiré
inferred← citeshttps://doi.org/10.1007/bf02427986openalex-snapshot
Frequency Modulation Interpretation of Fringes and Computation of Strains
inferred← citeshttps://doi.org/10.1016/b978-008043020-1/50024-7openalex-snapshot
Moiré in science and engineering
inferred← citeshttps://doi.org/10.1088/0022-3735/5/9/001openalex-snapshot
Use of gratings in strain analysis
inferred← citeshttps://doi.org/10.1117/1.1566004openalex-snapshot
Measurement of mechanical properties of materials in the micrometer range using electronic holographic moire
inferred← citeshttps://doi.org/10.1117/1.602341openalex-snapshot
Computer assisted holographic moire contouring
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