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Automated analysis of holointerferograms for the determination of surface displacement

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What this work says

Outgoing claims: the papers this work cites, builds on, or argues with.

inferredcites →https://doi.org/10.1007/bf02328622openalex-snapshot
A geometrical approach to holographic interferometry
inferredcites →https://doi.org/10.1016/0263-2241(88)90037-1openalex-snapshot
Digital processing of holographic interference patterns using Fourier-transform methods
inferredcites →https://doi.org/10.1021/ac60214a047openalex-snapshot
Smoothing and Differentiation of Data by Simplified Least Squares Procedures.
inferredcites →https://doi.org/10.1080/716099655openalex-snapshot
Holographic and Speckle Interferometry
inferredcites →https://doi.org/10.1117/12.7973025openalex-snapshot
On-Line Acquisition And Analysis For Holographic Nondestructive Evaluation
inferredcites →https://doi.org/10.1117/12.7973571openalex-snapshot
Improved Fringe Carrier Technique For Unambiguous Determination Of Holographically Recorded Displacements
inferredcites →https://doi.org/10.1117/12.933953openalex-snapshot
Holographic Nondestructive Evaluation With On-Line Acquisition And Processing
inferredcites →https://doi.org/10.1117/12.933954openalex-snapshot
Automatic Computer Analysis Of Double Exposure Hologram In Industrial Nondestructive Control
inferredcites →https://doi.org/10.1117/12.958329openalex-snapshot
System For The Automatic Analysis Of Interferograms Obtained By Holographic Interferometry
inferredcites →https://doi.org/10.1145/321607.321609openalex-snapshot
A New Method of Interpolation and Smooth Curve Fitting Based on Local Procedures
inferredcites →https://doi.org/10.1364/josaa.3.000847openalex-snapshot
Digital holographic interference-phase measurement using the Fourier-transform method

What points at this work

Incoming claims: where this work appears in other papers’ reference lists and arguments.

inferred← citeshttps://doi.org/10.1002/3527604154.biblioopenalex-snapshot
Bibliography
inferred← citeshttps://doi.org/10.1007/978-3-540-48078-5_3openalex-snapshot
Quantitative Determination of Displacements and Strains from Holograms
inferred← citeshttps://doi.org/10.1007/978-3-540-48078-5_6openalex-snapshot
Computer-Aided Evaluation of Holographic Interferograms
inferred← citeshttps://doi.org/10.1007/bf02325145openalex-snapshot
Thermal bending associated with heat conduction by holographic interferometry
inferred← citeshttps://doi.org/10.1007/bf02325840openalex-snapshot
Panoramic holointerferometry
inferred← citeshttps://doi.org/10.1007/bf02328443openalex-snapshot
Residual-stress determination by single-axis holographic interferometry and hole drilling—Part I: Theory
inferred← citeshttps://doi.org/10.1016/0030-3992(95)00064-xopenalex-snapshot
Application of the holographic carrier fringe and FFT technique for deformation measurement
inferred← citeshttps://doi.org/10.1016/0257-8972(94)02267-topenalex-snapshot
Holographic interferometry applied to the study of residual deformations induced by a pulsed ion implanter
inferred← citeshttps://doi.org/10.1111/j.1747-1567.2001.tb00030.xopenalex-snapshot
THE USE OF CARRIER FRINGES AND FFT IN HOLOGRAPHIC NONDESTRUCTIVE TESTING
inferred← citeshttps://doi.org/10.1117/12.163188openalex-snapshot
Holographic interferometry using substrate guided waves
inferred← citeshttps://doi.org/10.1364/ao.39.002638openalex-snapshot
Generation of carrier fringes in holography and shearography
inferred← citeshttps://doi.org/10.1515/mms-2016-0028openalex-snapshot
A Review of Surface Deformation and Strain Measurement Using Two-Dimensional Digital Image Correlation
inferred← citeshttps://doi.org/10.1557/proc-354-33openalex-snapshot
Residual Deformations Induced By The Thermal Shock During Pulsed Ion Implantation
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