On the public citation graph
Murray lecture tensile testing at the micrometer scale: Opportunities in experimental mechanics
0 signed · 98 inferred · view as graph
Inferred edges come from two machine sources: sweeps of open repository metadata (mostly SSRN and Zenodo), and a bulk OpenAlex citation snapshot. Every row below is labelled with the one it came from. Neither is a complete citation index — absence here is not evidence of absence.
Is this your work? Sign in with ORCID and put your name on the
claims that are yours.
Reference health. See whether every reference in this work resolves to a
known work and none has been retracted — and get a dated CiteStamped
badge you can embed.
What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
inferredcites →https://doi.org/10.1002/mawe.19800111006openalex-snapshot
Mechanical Properties of Silicon Nitride
inferredcites →https://doi.org/10.1007/978-3-642-59497-7_315openalex-snapshot
Effect of Temperature on Mechanical Properties of Polysilicon
inferredcites →https://doi.org/10.1007/bf02321369openalex-snapshot
Experimental solid mechanics in the nineteenth century
inferredcites →https://doi.org/10.1007/bf02411051openalex-snapshot
A new microtensile tester for the study of MEMS materials with the aid of atomic force microscopy
inferredcites →https://doi.org/10.1007/bf02411059openalex-snapshot
In-situ tensile testing of nano-scale specimens in SEM and TEM
inferredcites →https://doi.org/10.1016/0262-8856(83)90064-1openalex-snapshot
Determination of displacements using an improved digital correlation method
inferredcites →https://doi.org/10.1016/s1359-6454(99)00294-3openalex-snapshot
Materials issues in microelectromechanical systems (MEMS)
inferredcites →https://doi.org/10.1016/s1359-6462(01)01067-3openalex-snapshot
Tensile properties of free-standing aluminum thin films
inferredcites →https://doi.org/10.1038/scientificamerican0901-48openalex-snapshot
Plenty of Room, Indeed
inferredcites →https://doi.org/10.1063/1.1420553openalex-snapshot
The Manipulation of Single Biomolecules
inferredcites →https://doi.org/10.1109/84.623107openalex-snapshot
A new technique for measuring the mechanical properties of thin films
inferredcites →https://doi.org/10.1109/84.870062openalex-snapshot
Effect of support compliance and residual stress on the shape of doubly supported surface-micromachined beams
inferredcites →https://doi.org/10.1109/84.896765openalex-snapshot
Evaluation of size effect on mechanical properties of single crystal silicon by nanoscale bending test using AFM
inferredcites →https://doi.org/10.1109/84.946774openalex-snapshot
Effect of specimen size on Young's modulus and fracture strength of polysilicon
inferredcites →https://doi.org/10.1109/isdrs.2001.984532openalex-snapshot
Mechanical properties of MEMS materials
inferredcites →https://doi.org/10.1109/jmems.2002.805044openalex-snapshot
Investigation of strain in microstructures by a novel moire method
inferredcites →https://doi.org/10.1109/jmems.2003.814130openalex-snapshot
Fracture strength of polysilicon at stress concentrations
inferredcites →https://doi.org/10.1109/memsys.1997.581881openalex-snapshot
Measurements of Young's modulus, Poisson's ratio, and tensile strength of polysilicon
inferredcites →https://doi.org/10.1115/imece1996-1369openalex-snapshot
Micromechanical Structures for Fracture Testing of Brittle Thin Films
inferredcites →https://doi.org/10.1115/imece1997-0945openalex-snapshot
Mechanical Testing of Thicker MEMS Materials
inferredcites →https://doi.org/10.1117/12.250969openalex-snapshot
New test structures and techniques for measurement of mechanical properties of MEMS materials
inferredcites →https://doi.org/10.1117/12.361209openalex-snapshot
Materials characterization for MEMS: a comparison of uniaxial and bending tests
inferredcites →https://doi.org/10.1126/science.287.5453.637openalex-snapshot
Strength and Breaking Mechanism of Multiwalled Carbon Nanotubes Under Tensile Load
inferredcites →https://doi.org/10.1520/stp10992sopenalex-snapshot
Tensile Tests of Various Thin Films
inferredcites →https://doi.org/10.1520/stp38008sopenalex-snapshot
Microspecimen Tensile Tests of A533-B Steel
inferredcites →https://doi.org/10.1557/jmr.1993.1542openalex-snapshot
A new method for measuring the strength and ductility of thin films
inferredcites →https://doi.org/10.1557/proc-505-51openalex-snapshot
Fracture Tests Of Polysilicon Film
inferredcites →https://doi.org/10.1557/proc-518-191openalex-snapshot
Polysilicon Tensile Testing With Electrostatic Gripping
inferredcites →https://doi.org/10.1557/proc-518-57openalex-snapshot
Round-Robin Tests of Modulus and Strength of Polysilicou
inferredcites →https://doi.org/10.1557/proc-657-ee5.5openalex-snapshot
Young's Modulus and Fracture Strength of Three Polysilicons
inferredcites →https://doi.org/10.1557/proc-687-b10.6/p6.6openalex-snapshot
Mechanical Testing of Free-Standing Thin Films
inferredcites →https://doi.org/10.1557/proc-687-b6.3openalex-snapshot
Mechanical Properties of Thin Film Silicon Carbide
What points at this work
Incoming claims: where this work appears in other papers’ reference lists and arguments.
inferred← citeshttps://doi.org/10.2139/ssrn.4812214openalex-extracted
Intermittent In-Situ High-Resolution X-Ray Microscopy of 400-Nm Porous Glass Under Uniaxial Compression: Study of Pore Changes and Crack Formation
inferred← citeshttps://doi.org/10.1002/9783527616732.ch7openalex-snapshot
Analysis of Microstructure, Surface Topography and Mechanical Properties of Microcast Specimens Made of the Dental Gold Alloy Stabilor G
inferred← citeshttps://doi.org/10.1002/cepa.2337openalex-snapshot
Determination of actual material properties in existing structures using small specimens
inferred← citeshttps://doi.org/10.1007/978-0-387-30877-7_30openalex-snapshot
Mechanical Testing at the Micro/Nanoscale
inferred← citeshttps://doi.org/10.1007/978-0-387-73582-5_3openalex-snapshot
X-ray Lithography Techniques, LIGA-Based Microsystem Manufacturing: The Electrochemistry of Through-Mold Deposition and Material Properties
inferred← citeshttps://doi.org/10.1007/978-0-387-77747-4_3openalex-snapshot
Materials, Structures and Packaging
inferred← citeshttps://doi.org/10.1007/978-1-4419-6018-4_7openalex-snapshot
Continuous Improvement: Tools and Techniques for Reliability Improvement
inferred← citeshttps://doi.org/10.1007/978-1-4614-0210-7_4openalex-snapshot
A nano-tensile tester for creep studies
inferred← citeshttps://doi.org/10.1007/978-1-4614-0216-9_64openalex-snapshot
Rate Dependent Material Properties of an OFHC copper Film
inferred← citeshttps://doi.org/10.1007/978-3-319-63405-0_2openalex-snapshot
Femtosecond Laser Machining of Micro-tensile Specimens for High Throughput Mechanical Testing
inferred← citeshttps://doi.org/10.1007/978-3-642-41446-6_19openalex-snapshot
Stress-Driven Artificial Hair Cell for Flow Sensing
inferred← citeshttps://doi.org/10.1007/s00542-007-0536-5openalex-snapshot
Thermal stability of electrodeposited LIGA Ni–W alloys for high temperature MEMS applications
inferred← citeshttps://doi.org/10.1007/s00542-009-1009-9openalex-snapshot
Identification of mechanical defects in MEMS using dynamic measurements for application in production monitoring
inferred← citeshttps://doi.org/10.1007/s00542-009-1014-zopenalex-snapshot
Calibration of residual stress difference of MetalMUMPs silicon nitride films
inferred← citeshttps://doi.org/10.1007/s11340-009-9278-xopenalex-snapshot
A High-frequency High-temperature Optical Strain/Displacement Gage
inferred← citeshttps://doi.org/10.1007/s11340-010-9367-xopenalex-snapshot
The Evolution of the Field of Biomechanics Through the Lens of Experimental Mechanics
inferred← citeshttps://doi.org/10.1007/s11340-010-9378-7openalex-snapshot
Quantitative Stereovision in a Scanning Electron Microscope
inferred← citeshttps://doi.org/10.1007/s11340-010-9395-6openalex-snapshot
Evaluation of the Material Properties of an OFHC Copper Film at High Strain Rates Using a Micro-Testing Machine
inferred← citeshttps://doi.org/10.1007/s11340-012-9693-2openalex-snapshot
A Force Domain Analog-to-Digital Converter Applied to Microscale Tensile Test
inferred← citeshttps://doi.org/10.1007/s11668-009-9212-7openalex-snapshot
Creep and Fatigue Failure in Single- and Double Hot Arm MEMS Thermal Actuators
inferred← citeshttps://doi.org/10.1007/s11837-016-2100-1openalex-snapshot
Development of a High-Temperature Tensile Tester for Micromechanical Characterization of Materials Supporting Meso-Scale ICME Models
inferred← citeshttps://doi.org/10.1016/b978-0-323-95478-5.00005-4openalex-snapshot
Silicon and Related Materials
inferred← citeshttps://doi.org/10.1016/b978-044452190-3.00002-1openalex-snapshot
Silicon and Related Materials
inferred← citeshttps://doi.org/10.1016/j.actamat.2008.03.034openalex-snapshot
On-chip laboratory suite for testing of free-standing metal film mechanical properties, Part II – Experiments
inferred← citeshttps://doi.org/10.1016/j.commatsci.2007.07.023openalex-snapshot
Estimation of elasticity modulus and fracture strength of thin perforated SiN membranes with finite element simulations
inferred← citeshttps://doi.org/10.1016/j.ijsolstr.2006.08.031openalex-snapshot
Identification of elastic property and loading fields from full-field displacement measurements
inferred← citeshttps://doi.org/10.1016/j.jbiomech.2011.04.024openalex-snapshot
Elasticity and stress relaxation of a very small vocal fold
inferred← citeshttps://doi.org/10.1016/j.jmrt.2013.03.003openalex-snapshot
Comparative study of mechanical properties using standard and micro-specimens of base materials Inconel 625, Inconel 718 and Ti-6Al-4V
inferred← citeshttps://doi.org/10.1016/j.matdes.2009.07.013openalex-snapshot
Material selection for microelectronic heat sinks: An application of the Ashby approach
inferred← citeshttps://doi.org/10.1016/j.measurement.2006.10.014openalex-snapshot
Dynamic testing of micromechanical structures under thermo-electro-mechanical influences
inferred← citeshttps://doi.org/10.1016/j.msea.2009.07.046openalex-snapshot
Gage length and sample size effect on measured properties during tensile testing
inferred← citeshttps://doi.org/10.1016/j.msea.2019.138297openalex-snapshot
Fracture strength of hot-pressed silicon carbide at the microscale
inferred← citeshttps://doi.org/10.1016/j.prostr.2020.02.018openalex-snapshot
Development of a miniaturized specimen to perform uniaxial tensile tests on high performance materials
inferred← citeshttps://doi.org/10.1016/j.scriptamat.2005.03.004openalex-snapshot
High cycle fatigue and fracture behavior of LIGA Nickel
inferred← citeshttps://doi.org/10.1016/j.scriptamat.2024.116396openalex-snapshot
Intermittent in-situ high-resolution X-ray microscopy of 400-nm porous glass under uniaxial compression: Study of pore changes and crack formation
inferred← citeshttps://doi.org/10.1016/j.sna.2007.04.023openalex-snapshot
Characteristics of a commercially available silicon-on-insulator MEMS material
inferred← citeshttps://doi.org/10.1016/j.tsf.2006.01.046openalex-snapshot
Thermo-mechanical evolution of multilayer thin films: Part I. Mechanical behavior of Au/Cr/Si microcantilevers
inferred← citeshttps://doi.org/10.1038/s41528-017-0006-9openalex-snapshot
Research on flexible display at Ulsan National Institute of Science and Technology
inferred← citeshttps://doi.org/10.1039/c2sm27566jopenalex-snapshot
Parylene conformal coating encapsulation as a method for advanced tuning of mechanical properties of an artificial hair cell
inferred← citeshttps://doi.org/10.1063/1.4919765openalex-snapshot
Mechanical characterization between room temperature and 1000 °C of SiC free-standing thin films by a novel high-temperature micro-tensile setup
inferred← citeshttps://doi.org/10.1063/1.4991532openalex-snapshot
Bending induced electrical response variations in ultra-thin flexible chips and device modeling
inferred← citeshttps://doi.org/10.1088/0960-1317/15/7/022openalex-snapshot
MEMS actuators and sensors: observations on their performance and selection for purpose
inferred← citeshttps://doi.org/10.1088/0960-1317/19/8/082001openalex-snapshot
Demonstration of anin situon-chip tensile tester
inferred← citeshttps://doi.org/10.1088/0960-1317/25/3/035028openalex-snapshot
Electrothermomechanical modeling of out-of-plane deformation in single-stepped beams actuated by resistive heating
inferred← citeshttps://doi.org/10.1109/jmems.2009.2029210openalex-snapshot
Wafer-Scale Microtensile Testing of Thin Films
inferred← citeshttps://doi.org/10.1109/jmems.2017.2687861openalex-snapshot
MEMS for Nanopositioning: Design and Applications
inferred← citeshttps://doi.org/10.1111/j.1460-2695.2005.00951.xopenalex-snapshot
A review of deformation and fatigue of metals at small size scales
inferred← citeshttps://doi.org/10.1111/j.1475-1305.2008.00392.xopenalex-snapshot
Mechanical Property Measurement at the Micro/Nano‐scale1
inferred← citeshttps://doi.org/10.1111/j.1475-1305.2009.00692.xopenalex-snapshot
A Methodology for Accurately Measuring Mechanical Properties on the Micro‐Scale
inferred← citeshttps://doi.org/10.1115/1.4062106openalex-snapshot
Elastic–Plastic Properties of Mesoscale Electrodeposited LIGA Nickel Alloy Films: Analysis of Measurement Uncertainties
inferred← citeshttps://doi.org/10.1126/sciadv.1700685openalex-snapshot
Nanotwinned metal MEMS films with unprecedented strength and stability
inferred← citeshttps://doi.org/10.1146/annurev.matsci.36.062705.134551openalex-snapshot
Microscale Characterization of Mechanical Properties
inferred← citeshttps://doi.org/10.1557/jmr.2014.183openalex-snapshot
Emerging materials for microelectromechanical systems at elevated temperatures
inferred← citeshttps://doi.org/10.1557/proc-795-u11.35openalex-snapshot
Thermal-Mechanical Evaluation of Plated Electro-Magnetic NiFe for MEMS Generators
inferred← citeshttps://doi.org/10.18260/1-2--19859openalex-snapshot
Laboratory Experiment in Engineering Materials for Upper-Level Undergraduate and Graduate Students
inferred← citeshttps://doi.org/10.18419/opus-883openalex-snapshot
Mechanical properties of ultra thin metallic films revealed by synchrotron techniques
inferred← citeshttps://doi.org/10.32920/ryerson.14643810.v1openalex-snapshot
Measurement of the properties of MetalMUMPS® thin films
inferred← citeshttps://doi.org/10.3390/s17081800openalex-snapshot
A Multiscale Material Testing System for In Situ Optical and Electron Microscopes and Its Application
inferred← citeshttps://doi.org/10.4028/www.scientific.net/kem.598.20openalex-snapshot
Experimental Analysis of Fatigue Life of Laser Weld Zones
inferred← citeshttps://doi.org/10.4028/www.scientific.net/msf.726.51openalex-snapshot
Material Properties Investigations With the Use of Microspecimen
Editorial review for independent work. ICSAC — the Institute for Complexity
Science and Advanced Computing — runs a structured editorial panel for researchers
publishing outside journals, and publishes on CiteStamp rails. Submission is free
and goes through ORCID: icsacinstitute.org/submit.