Surface ionizing dose deposited by low energy electrons (10 eV–10 keV) in eleven monoatomic materials: Monte Carlo calculations and analytical expressions
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Monte-Carlo simulation and analytical expressions for the extrapolated range and transmission rate of low energy electrons [10 eV–10 keV] in 11 monoatomic materials
Geant4 physics processes for microdosimetry and secondary electron emission simulation: Extension of MicroElec to very low energies and 11 materials (C, Al, Si, Ti, Ni, Cu, Ge, Ag, W, Kapton and SiO2)
Parameterized study and experimental validation of the time resolved heat source for material irradiation under hollow-cathode nanosecond pulsed electron beam
Modelling the Impact of Graphene Coating of Different Thicknesses on Polyimide Substrate on the Secondary Electron Yield
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