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MeV TOF SIMS Analysis of Hybrid Organic/Inorganic Compounds in the Low Energy Region
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What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
inferredcites →https://doi.org/10.1002/sia.3520openalex-snapshot
Comparison of MeV monomer ion and keV cluster ToF‐SIMS
inferredcites →https://doi.org/10.1016/0167-5087(82)90053-9openalex-snapshot
Comparison of biomolecule desorption yields for low and high energy primary ions
inferredcites →https://doi.org/10.1016/j.apsusc.2008.05.108openalex-snapshot
Yield enhancement of molecular ions with MeV ion-induced electronic excitation
inferredcites →https://doi.org/10.1016/j.chroma.2010.01.033openalex-snapshot
A concise review of mass spectrometry imaging
inferredcites →https://doi.org/10.1016/j.nimb.2010.02.091openalex-snapshot
SRIM – The stopping and range of ions in matter (2010)
inferredcites →https://doi.org/10.1016/j.nimb.2014.02.068openalex-snapshot
Development of a TOF SIMS setup at the Zagreb heavy ion microbeam facility
inferredcites →https://doi.org/10.1016/j.nimb.2017.10.019openalex-snapshot
Mass spectrometric investigation of material sputtered under swift heavy ion bombardment
inferredcites →https://doi.org/10.1016/s0168-583x(01)01164-8openalex-snapshot
The unitary convolution approximation for heavy ions
inferredcites →https://doi.org/10.1021/jasms.0c00080openalex-snapshot
Dependence of Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Secondary Molecular Ion Yield from Phthalocyanine Blue on Primary Ion Stopping Power
inferredcites →https://doi.org/10.1103/physrevb.67.155414openalex-snapshot
Electronic and nuclear thermal spike effects in sputtering of metals with energetic heavy ions
inferredcites →https://doi.org/10.1116/6.0000171openalex-snapshot
Ionization probability of sputtered indium atoms under impact of slow highly charged ions
What points at this work
Incoming claims: where this work appears in other papers’ reference lists and arguments.
inferred← citeshttps://doi.org/10.2139/ssrn.4670269openalex-extracted
Multi-Spectroscopic Characterization of Organic Salt Components in Complex Mixture System
inferred← citeshttps://doi.org/10.1002/adma.73548openalex-snapshot
Multi‐Dimensional Insights Into the Surface and Interfaces of Battery Materials by Time‐of‐Flight Secondary Ion Mass Spectrometry
inferred← citeshttps://doi.org/10.1007/s41365-026-01911-8openalex-snapshot
Monte Carlo simulation of the focusing effect of a tapered glass capillary used in MeV-SIMS on heavy-ion beam with MeV-range energy
inferred← citeshttps://doi.org/10.1016/j.foodchem.2024.139195openalex-snapshot
Multi-spectroscopic characterization of organic salt components in medicinal plant
inferred← citeshttps://doi.org/10.1021/acs.analchem.5c05152openalex-snapshot
Selecting the Optimal Ion Beam for Sequential MeV Secondary Ion Mass Spectrometry and Particle-Induced X-ray Emission in the Characterization of Biological and Cultural Heritage Materials
inferred← citeshttps://doi.org/10.1038/s41598-022-16042-4openalex-snapshot
Depth profiling of Cr-ITO dual-layer sample with secondary ion mass spectrometry using MeV ions in the low energy region
inferred← citeshttps://doi.org/10.1039/9781837674763-part1openalex-snapshot
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