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XPS Studies of SiO 2 /Si System under External Bias
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Outgoing claims: the papers this work cites, builds on, or argues with.
inferredcites →https://doi.org/10.1002/(sici)1096-9918(200003)29:3<232::aid-sia731>3.0.co;2-6openalex-snapshot
Use of differential surface charging to separate chemical differences in x-ray photoelectron spectroscopy
inferredcites →https://doi.org/10.1002/sia.740210107openalex-snapshot
Film thickness measurements of SiO 2 by XPS
inferredcites →https://doi.org/10.1016/0009-2614(75)80276-4openalex-snapshot
X-ray photoelectron spectroscopy of thermally grown silicon dioxide films on silicon
inferredcites →https://doi.org/10.1016/0039-6028(79)90142-0openalex-snapshot
SiSiO2 interface characterization by ESCA
inferredcites →https://doi.org/10.1016/0039-6028(85)90521-7openalex-snapshot
Interpretation of XPS core level shifts and structure of thin silicon oxide layers
inferredcites →https://doi.org/10.1016/0039-6028(91)90036-ropenalex-snapshot
Measurements of interface state density by X-ray photoelectron spectroscopy
inferredcites →https://doi.org/10.1016/0042-207x(94)90087-6openalex-snapshot
Practical surface analysis
inferredcites →https://doi.org/10.1016/0368-2048(73)80022-2openalex-snapshot
Calibration of electron spectra
inferredcites →https://doi.org/10.1016/0368-2048(73)80034-9openalex-snapshot
Differential sample charging in ESCA
inferredcites →https://doi.org/10.1016/0368-2048(80)85010-9openalex-snapshot
Binding-energy reference in X-ray photoelectron spectroscopy of insulators
inferredcites →https://doi.org/10.1016/0368-2048(92)85008-uopenalex-snapshot
Charging effects in X-ray photoelectron spectroscopy
inferredcites →https://doi.org/10.1016/0378-5963(81)90126-4openalex-snapshot
Structures chimique et electronique de l'interface SiO2-Si
inferredcites →https://doi.org/10.1016/s0368-2048(99)00068-7openalex-snapshot
Mechanisms of charging in electron spectroscopy
inferredcites →https://doi.org/10.1016/s0920-2307(86)80001-9openalex-snapshot
Chemical and electronic structure of the SiO2/Si interface
inferredcites →https://doi.org/10.1021/ja993710hopenalex-snapshot
High-Resolution Lateral Differentiation Using a Macroscopic Probe: XPS of Organic Monolayers on Composite Au−SiO2 Surfaces
inferredcites →https://doi.org/10.1021/jp973254oopenalex-snapshot
Extra-atomic Relaxation and Core-Level Binding Energy Shifts at Silicon/Silicon Oxide Interfaces: Effects of Cluster Size on Physical Models
inferredcites →https://doi.org/10.1038/35019025openalex-snapshot
Controlled surface charging as a depth-profiling probe for mesoscopic layers
inferredcites →https://doi.org/10.1063/1.101450openalex-snapshot
Use of surface charging in x-ray photoelectron spectroscopic studies of ultrathin dielectric films on semiconductors
inferredcites →https://doi.org/10.1063/1.122042openalex-snapshot
Oxide thickness dependence of energy shifts in the Si 2p levels for the SiO2/Si structure, and its elimination by a palladium overlayer
inferredcites →https://doi.org/10.1063/1.342873openalex-snapshot
Effects of a depth-dependent specimen potential on x-ray photoelectron spectroscopic data
inferredcites →https://doi.org/10.1063/1.345659openalex-snapshot
A surface charging technique in photoemission spectroscopic studies of dielectric-semiconductor structures
inferredcites →https://doi.org/10.1063/1.361190openalex-snapshot
Modified surface charge spectroscopy for the characterization of insulator/semiconductor structures
inferredcites →https://doi.org/10.1063/1.362676openalex-snapshot
Electron spectroscopic analysis of the SiO2/Si system and correlation with metal–oxide–semiconductor device characteristics
inferredcites →https://doi.org/10.1063/1.366037openalex-snapshot
The role of extra-atomic relaxation in determining Si 2p binding energy shifts at silicon/silicon oxide interfaces
inferredcites →https://doi.org/10.1063/1.94565openalex-snapshot
Probing the transition layer at the SiO2-Si interface using core level photoemission
inferredcites →https://doi.org/10.1063/1.96380openalex-snapshot
Electron spectroscopy study of the Si–O bonding and the polarization screening near the Si-SiO2 interface
inferredcites →https://doi.org/10.1103/physrevb.38.13407openalex-snapshot
Effect of electrostatic screening on energy positions of electron spectra near SiO2 /Si interfaces
inferredcites →https://doi.org/10.1103/physrevb.53.10942openalex-snapshot
Theory of Si 2pcore-level shifts at the Si(001)- SiO2 interface
inferredcites →https://doi.org/10.1103/physrevlett.43.1683openalex-snapshot
High-Resolution X-Ray Photoelectron Spectroscopy as a Probe of Local Atomic Structure: Application to Amorphous Si O2 and the Si-Si O2 Interface
inferredcites →https://doi.org/10.1116/1.570218openalex-snapshot
Local atomic and electronic structure of oxide/GaAs and SiO2/Si interfaces using high-resolution XPS
inferredcites →https://doi.org/10.1116/1.575649openalex-snapshot
Summary Abstract: X-ray photoelectron spectroscopy surface charge buildup used to study residue in deep features on integrated circuits
inferredcites →https://doi.org/10.1116/1.580824openalex-snapshot
Studies of electrical and chemical properties of SiO2/Si after rapid thermal nitridation using surface charge spectroscopy and x-ray photoelectron spectroscopy
inferredcites →https://doi.org/10.1116/1.582927openalex-snapshot
Screening energy variations in silicon, silicon dioxide, and silicides
inferredcites →https://doi.org/10.1116/1.584977openalex-snapshot
I n s i t u x-ray photoelectron spectroscopic study of remote plasma enhanced chemical vapor deposition of silicon nitride on sulfide passivated InP
inferredcites →https://doi.org/10.1149/1.2134014openalex-snapshot
An ESCA Study of the Oxide at the Si ‐ SiO2 Interface
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Structural and Electronic Properties of a Mn Oxide Diffusion Barrier Layer Formed by Chemical Vapor Deposition
inferred← citeshttps://doi.org/10.1111/jace.13388openalex-snapshot
Flexible Porous SiO 2 –Bi 2 WO 6 Nanofibers Film for Visible‐Light Photocatalytic Water Purification
inferred← citeshttps://doi.org/10.1116/6.0005180openalex-snapshot
Toward reliable x-ray photoelectron spectroscopy: Understanding fundamental differences between analyses performed on samples with and without electrical contact to spectrometer
inferred← citeshttps://doi.org/10.1116/6.0005735openalex-snapshot
Sample charging in x-ray photoelectron spectroscopy
inferred← citeshttps://doi.org/10.1126/sciadv.adi2958openalex-snapshot
Low-temperature 3D printing of transparent silica glass microstructures
inferred← citeshttps://doi.org/10.1134/s0023158408060086openalex-snapshot
Use of the differential charging effect in XPS to determine the nature of surface compounds resulting from the interaction of a Pt/BaCO3/Al2O3 model catalyst with NO x
inferred← citeshttps://doi.org/10.1134/s0023158411040161openalex-snapshot
Use of the differential charging effect in XPS to determine the nature of surface compounds resulting from the interaction of a Pt/(BaCO3 + CeO2) model catalyst with SO x
inferred← citeshttps://doi.org/10.1143/jjap.50.06ge12openalex-snapshot
Study of Graphene Growth by Gas-Source Molecular Beam Epitaxy Using Cracked Ethanol: Influence of Gas Flow Rate on Graphitic Material Deposition
inferred← citeshttps://doi.org/10.1149/1.3494150openalex-snapshot
Thermal Stability Improvement of the Lanthanum Aluminate/Silicon Interface Using a Thin Yttrium Interlayer
inferred← citeshttps://doi.org/10.1177/0885328220934323openalex-snapshot
Koh group influence on titanium surfaces and pure sol-gel silica for enhanced osteogenic activity
inferred← citeshttps://doi.org/10.1246/bcsj.20100317openalex-snapshot
Functionalization of Silica Surface by Tetrahydroxyporphyrin via Si–O Linkages
inferred← citeshttps://doi.org/10.13140/rg.2.1.2098.6327openalex-snapshot
Photo-Dynamic XPS for Investigating Photoinduced Voltage Changes in Semiconducting Materials
inferred← citeshttps://doi.org/10.1364/oe.537025openalex-snapshot
Femtosecond laser-induced black silicon: a dual application in photodetection and surface-enhanced Raman scattering
inferred← citeshttps://doi.org/10.2138/rmg.2025.91a.09openalex-snapshot
Measurements of the Electrostatic Potential at the Mineral/Electrolyte Interface
inferred← citeshttps://doi.org/10.2139/ssrn.6664561openalex-snapshot
Synthesis of Fe3O4-modified rice husk biochar for As(V) remediation by adsorption: Is sodium silicate formation involved?
inferred← citeshttps://doi.org/10.2320/matertrans.46.3044openalex-snapshot
Characterization of Si-Based Nanoparticulates Produced by Carbothermic Reduction of Silica-Containing Slag
inferred← citeshttps://doi.org/10.3390/nano16171120openalex-snapshot
Selective Chlorination of Toluene and Halobenzenes Using Modified BaSO4-Supported Catalysts: A Sustainable Approach with (NH4)2S2O8 and H2O2 as Oxidants
inferred← citeshttps://doi.org/10.3724/sp.j.1010.2011.00237openalex-snapshot
Low-temperature deposition of SiO2 nanophotonic film
inferred← citeshttps://doi.org/10.70675/2d55545czc2c2z4899zb672z1c1db00ffc8aopenalex-snapshot
Couches conductrices par voie organométallique pour les dispositifs 3D en microélectronique
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