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Atomically Resolved Graphitic Surfaces in Air by Atomic Force Microscopy
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What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
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Atomic layer deposited aluminum oxide films on graphite and graphene studied by XPS and AFM
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Hydrogen intercalation of graphene grown on 6H-SiC(0001)
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Surface-Energy Engineering of Graphene
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Molecular Layer of Gaslike Domains at a Hydrophobic–Water Interface Observed by Frequency-Modulation Atomic Force Microscopy
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True Atomic-Resolution Imaging of (1014) Calcite in Aqueous Solution by Frequency Modulation Atomic Force Microscopy
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Wettability and Surface Free Energy of Graphene Films
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Graphene Oxidation: Thickness-Dependent Etching and Strong Chemical Doping
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Anomalously Large Reactivity of Single Graphene Layers and Edges toward Electron Transfer Chemistries
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Charge Inhomogeneity Determines Oxidative Reactivity of Graphene on Substrates
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Observation of 4 nm Pitch Stripe Domains Formed by Exposing Graphene to Ambient Air
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Optical-beam-deflection atomic force microscopy: The NaCl (001) surface
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Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork
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True atomic resolution in liquid by frequency-modulation atomic force microscopy
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The quasi-free-standing nature of graphene on H-saturated SiC(0001)
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Revealing the hidden atom in graphite by low-temperature atomic force microscopy
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Slippery pores: anti-adhesive effect of nanoporous substrates on the beetle attachment system
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Electron states of mono- and bilayer graphene on SiC probed by scanning-tunneling microscopy
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Atomic and electronic structure of few-layer graphene on SiC(0001) studied with scanning tunneling microscopy and spectroscopy
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Optimizing atomic resolution of force microscopy in ambient conditions
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Quasi-Free-Standing Epitaxial Graphene on SiC Obtained by Hydrogen Intercalation
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Breakdown in the Wetting Transparency of Graphene
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Gas Enrichment at Liquid-Wall Interfaces
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Force Microscopy with Light-Atom Probes
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The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy
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Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
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Frequency Modulation Atomic Force Microscopy in Ionic Liquid Using Quartz Tuning Fork Sensors
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qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution
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Incoming claims: where this work appears in other papers’ reference lists and arguments.
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