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Optical interference method to obtain thickness and refractive indices of a uniaxial medium

https://doi.org/10.1063/1.1144707
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What this work says

Outgoing claims: the papers this work cites, builds on, or argues with.

inferredcites →https://doi.org/10.1016/0022-2860(93)80063-2openalex-snapshot
Interference spectra in the visible region of transparent coatings applied to plastic industrial lenses
inferredcites →https://doi.org/10.1016/b978-0-12-524975-1.x5000-9openalex-snapshot
Materials Science of Thin Films
inferredcites →https://doi.org/10.1016/c2009-0-20920-2openalex-snapshot
Handbook of Optical Constants of Solids
inferredcites →https://doi.org/10.1017/9781108769914openalex-snapshot
Principles of Optics
inferredcites →https://doi.org/10.1063/1.1658758openalex-snapshot
Refractive Index of Thin Monocrystal Films of InSe
inferredcites →https://doi.org/10.1063/1.1713951openalex-snapshot
Optical Thickness Measurement of Thin Transparent Films on Silicon
inferredcites →https://doi.org/10.1063/1.1714393openalex-snapshot
Refractive Index of SiO2 Films Grown on Silicon
inferredcites →https://doi.org/10.1063/1.1736089openalex-snapshot
Interference Method for Measuring the Thickness of Epitaxially Grown Films
inferredcites →https://doi.org/10.1063/1.3059910openalex-snapshot
Optical Properties of Thin Solid Films
inferredcites →https://doi.org/10.1080/00387019208021520openalex-snapshot
Measuring Properties of Industrial Polymer Films Using Interference Fringes in the Infrared Region
inferredcites →https://doi.org/10.1080/09500348814551501openalex-snapshot
General Formulae for the Optical Characterization of Single Layers with Spectroscopic Reflectometry
inferredcites →https://doi.org/10.1080/713823672openalex-snapshot
Etude des Propriétés Optiques des Couches Minces Transparentes en Liaison avec leur Structure
inferredcites →https://doi.org/10.1117/12.943475openalex-snapshot
Improvement Of Photothermoplastic Devices For Programmable Holographic Interconnections
inferredcites →https://doi.org/10.1364/ao.10.002344openalex-snapshot
Determination of Refractive Index and Film Thickness from Interference Fringes
inferredcites →https://doi.org/10.1364/ao.17.002779openalex-snapshot
Optical interference method for the approximate determination of refractive index and thickness of a transparent layer
inferredcites →https://doi.org/10.1364/ao.17.003738openalex-snapshot
Weakly absorbing layers: interferometric determination of their optical parameters
inferredcites →https://doi.org/10.1364/ao.32.002292openalex-snapshot
Automatic interference method for measuring transparent film thickness

What points at this work

Incoming claims: where this work appears in other papers’ reference lists and arguments.

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Electrical, Optical and Inelastic Properties of Tin Oxide Thin Films
inferred← citeshttps://doi.org/10.1016/0040-6090(95)06584-9openalex-snapshot
Use of spectrogoniometric—ellipsometric techniques for the determination of optical properties of films of trinitrofluorenone and poly-n-vinylcarbazole
inferred← citeshttps://doi.org/10.1016/j.infrared.2016.07.020openalex-snapshot
Adhesive As-S-Se-I immersion lenses for enhancing radiation characteristics of mid-IR LEDs operating in wide temperature range
inferred← citeshttps://doi.org/10.1016/j.mssp.2017.10.017openalex-snapshot
Study of the stabilizer influence on the structural and optical properties of sol-gel spin coated zinc oxide films
inferred← citeshttps://doi.org/10.1016/j.tsf.2024.140504openalex-snapshot
Inelastic relaxation in tin oxide thin films with an amorphous structure
inferred← citeshttps://doi.org/10.1063/1.370972openalex-snapshot
Observation and application of optical interference and diffraction effects in reflection from photochemically fabricated Gaussian interfaces
inferred← citeshttps://doi.org/10.1063/1.5025405openalex-snapshot
A fibre-coupled UHV-compatible variable angle reflection-absorption UV/visible spectrometer
inferred← citeshttps://doi.org/10.1080/009140390517722openalex-snapshot
Optical Properties of Highly Birefringent Polymer Films Using Simple Techniques
inferred← citeshttps://doi.org/10.1080/03602559909351558openalex-snapshot
Influence of Crystal-Fiber Structure of Blown Polyethylene Films on Diffused Light: a Crystal Dimensional Determination
inferred← citeshttps://doi.org/10.1088/0957-0233/11/8/307openalex-snapshot
A robust photo-interferometric technique to obtain the refractive index and thickness of non-absorbing stand-alone films
inferred← citeshttps://doi.org/10.1134/s1063784224020117openalex-snapshot
Electrical and Optical Properties of Thin-Film Bismuth Ferrite
inferred← citeshttps://doi.org/10.1149/1.2129558openalex-snapshot
Effects of Stain Etchant Composition on the Photoluminescence and Morphology of Porous Silicon
inferred← citeshttps://doi.org/10.1149/2162-8777/ac0a51openalex-snapshot
Electrical and Optical Studies of Reactively Sputtered Indium Oxide Thin Films
inferred← citeshttps://doi.org/10.1149/2162-8777/ac844copenalex-snapshot
Investigation on the Intermixing of Cu and In Layers for the Formation of Cu2In2O5 Thin Films
inferred← citeshttps://doi.org/10.20381/ruor-6066openalex-snapshot
Measurement of Refractive Index and Thickness of Multi Layer Systems Using Fourier Domain Optical Coherence Tomography
inferred← citeshttps://doi.org/10.21883/jtf.2022.12.53762.182-22openalex-snapshot
Электрические и оптические свойства тонкопленочного феррита висмута
inferred← citeshttps://doi.org/10.21883/tp.2022.12.55208.182-22openalex-snapshot
Electrical and optical properties of thin-film bismuth ferrite
inferred← citeshttps://doi.org/10.3390/coatings13010071openalex-snapshot
Comparison of RF and High Impulse Magnetron Sputtered Gallium-Doped Zinc Oxide Thin Films
inferred← citeshttps://doi.org/10.3390/ma17071609openalex-snapshot
Deposition and Optical Characterization of Sputter Deposited p-Type Delafossite CuGaO2 Thin Films Using Cu2O and Ga2O3 Targets
inferred← citeshttps://doi.org/10.70675/658a1a2azce40z4eebz92f8z375562a543b3openalex-snapshot
Density of states measurements on semiconductor and thin film materials using photocurrent methods
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