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Noninvasive determination of optical lever sensitivity in atomic force microscopy

https://doi.org/10.1063/1.2162455
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Outgoing claims: the papers this work cites, builds on, or argues with.

inferredcites →https://doi.org/10.1021/la010424mopenalex-snapshot
In Situ Calibration of Colloid Probe Cantilevers in Force Microscopy: Hydrodynamic Drag on a Sphere Approaching a Wall
inferredcites →https://doi.org/10.1063/1.100061openalex-snapshot
Novel optical approach to atomic force microscopy
inferredcites →https://doi.org/10.1063/1.1143970openalex-snapshot
Calibration of atomic-force microscope tips
inferredcites →https://doi.org/10.1063/1.1144209openalex-snapshot
A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy
inferredcites →https://doi.org/10.1063/1.1145439openalex-snapshot
Method for the calibration of atomic force microscope cantilevers
inferredcites →https://doi.org/10.1063/1.1146135openalex-snapshot
Calibration of optical lever sensitivity for atomic force microscopy
inferredcites →https://doi.org/10.1063/1.1147177openalex-snapshot
Short cantilevers for atomic force microscopy
inferredcites →https://doi.org/10.1063/1.1150021openalex-snapshot
Calibration of rectangular atomic force microscope cantilevers
inferredcites →https://doi.org/10.1063/1.342563openalex-snapshot
An atomic-resolution atomic-force microscope implemented using an optical lever
inferredcites →https://doi.org/10.1088/0957-4484/14/1/301openalex-snapshot
Comparison of calibration methods for atomic-force microscopy cantilevers
inferredcites →https://doi.org/10.1088/0957-4484/15/9/039openalex-snapshot
Finite optical spot size and position corrections in thermal spring constant calibration
inferredcites →https://doi.org/10.1088/0957-4484/6/1/001openalex-snapshot
Calculation of thermal noise in atomic force microscopy
inferredcites →https://doi.org/10.1103/physrevlett.56.930openalex-snapshot
Atomic Force Microscope

What points at this work

Incoming claims: where this work appears in other papers’ reference lists and arguments.

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inferred← citeshttps://doi.org/10.1063/1.4757398openalex-snapshot
Spring constant calibration of atomic force microscope cantilevers of arbitrary shape
inferred← citeshttps://doi.org/10.1063/1.4772477openalex-snapshot
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inferred← citeshttps://doi.org/10.1063/1.4812979openalex-snapshot
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inferred← citeshttps://doi.org/10.1063/1.4869353openalex-snapshot
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inferred← citeshttps://doi.org/10.1063/1.4885464openalex-snapshot
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inferred← citeshttps://doi.org/10.1063/1.4897966openalex-snapshot
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inferred← citeshttps://doi.org/10.1063/1.4900864openalex-snapshot
Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope
inferred← citeshttps://doi.org/10.1063/1.4901221openalex-snapshot
A non-contact, thermal noise based method for the calibration of lateral deflection sensitivity in atomic force microscopy
inferred← citeshttps://doi.org/10.1063/1.4914003openalex-snapshot
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inferred← citeshttps://doi.org/10.1063/1.4991471openalex-snapshot
Nonlinear dynamics for estimating the tip radius in atomic force microscopy
inferred← citeshttps://doi.org/10.1063/1.5013259openalex-snapshot
History, rare, and multiple events of mechanical unfolding of repeat proteins
inferred← citeshttps://doi.org/10.1063/1.5038967openalex-snapshot
Calibrating torsional eigenmodes of micro-cantilevers for dynamic measurement of frictional forces
inferred← citeshttps://doi.org/10.1063/1.5045679openalex-snapshot
Static and dynamic calibration of torsional spring constants of cantilevers
inferred← citeshttps://doi.org/10.1063/1.5046648openalex-snapshot
A non-destructive method to calibrate the torsional spring constant of atomic force microscope cantilevers in viscous environments
inferred← citeshttps://doi.org/10.1063/1.5060727openalex-snapshot
Intermodulation spectroscopy as an alternative to pump-probe for the measurement of fast dynamics at the nanometer scale
inferred← citeshttps://doi.org/10.1063/5.0036263openalex-snapshot
Determination of calibration parameters of cantilevers of arbitrary shape by finite element analysis
inferred← citeshttps://doi.org/10.1063/5.0054256openalex-snapshot
Thermal noise in contact atomic force microscopy
inferred← citeshttps://doi.org/10.1063/5.0067429openalex-snapshot
Flexoelectric control of physical properties by atomic force microscopy
inferred← citeshttps://doi.org/10.1063/5.0147341openalex-snapshot
Low frequency photothermal excitation of AFM microcantilevers
inferred← citeshttps://doi.org/10.1080/15583724.2010.493255openalex-snapshot
Probing Soft Matter with the Atomic Force Microscopies: Imaging and Force Spectroscopy
inferred← citeshttps://doi.org/10.1088/0953-8984/19/47/473201openalex-snapshot
Measurement and interpretation of elastic and viscoelastic properties with the atomic force microscope
inferred← citeshttps://doi.org/10.1088/0957-0233/17/8/040openalex-snapshot
An optical lever approach to photodetector measurements of the pickup-head flying height in an optical disk drive
inferred← citeshttps://doi.org/10.1088/0957-4484/20/19/195701openalex-snapshot
Intermittent contact mode piezoresponse force microscopy in a liquid environment
inferred← citeshttps://doi.org/10.1088/0957-4484/22/29/295703openalex-snapshot
Error in dynamic spring constant calibration of atomic force microscope probes due to nonuniform cantilevers
inferred← citeshttps://doi.org/10.1088/0957-4484/22/45/455703openalex-snapshot
Uncertainty quantification in nanomechanical measurements using the atomic force microscope
inferred← citeshttps://doi.org/10.1088/0957-4484/23/2/025503openalex-snapshot
The noise of coated cantilevers
inferred← citeshttps://doi.org/10.1088/0957-4484/23/24/245705openalex-snapshot
Electromechanical and elastic probing of bacteria in a cell culture medium
inferred← citeshttps://doi.org/10.1088/0957-4484/23/26/265705openalex-snapshot
The role of nonlinear dynamics in quantitative atomic force microscopy
inferred← citeshttps://doi.org/10.1088/0957-4484/23/37/375702openalex-snapshot
Accurate and precise calibration of AFM cantilever spring constants using laser Doppler vibrometry
inferred← citeshttps://doi.org/10.1088/0957-4484/24/50/505716openalex-snapshot
Complex force dynamics in atomic force microscopy resolved by wavelet transforms
inferred← citeshttps://doi.org/10.1088/0957-4484/25/17/175701openalex-snapshot
High viscosity environments: an unexpected route to obtain true atomic resolution with atomic force microscopy
inferred← citeshttps://doi.org/10.1088/0957-4484/26/17/175701openalex-snapshot
Transient eigenmodes analysis of single-impact cantilever dynamics combining Fourier and wavelet transforms
inferred← citeshttps://doi.org/10.1088/1361-6501/aad397openalex-snapshot
Investigation of position detectors for atomic force microscopes
inferred← citeshttps://doi.org/10.1088/1361-6501/acf4b1openalex-snapshot
Accurate determination of stiffness and strength of graphene via AFM-based membrane deflection
inferred← citeshttps://doi.org/10.1088/1361-6501/ad490dopenalex-snapshot
Step height measurement of monoatomic silicon crystal lattice steps with a commercial atomic force microscope
inferred← citeshttps://doi.org/10.1088/1361-6501/ae59a3openalex-snapshot
Characterizing tip-sample interaction dynamics on extreme ultraviolet nanostructures using atomic force microscopy with a high-aspect ratio tip
inferred← citeshttps://doi.org/10.1088/1361-6528/ab2435openalex-snapshot
Metasurface-enhanced optical lever sensitivity for atomic force microscopy
inferred← citeshttps://doi.org/10.1088/1361-6528/aba0f2openalex-snapshot
Near-zero contact force atomic force microscopy investigations using active electromagnetic cantilevers
inferred← citeshttps://doi.org/10.1088/1361-6528/acf29dopenalex-snapshot
In situ thermal noise measurements under nanoindentation of suspended graphene
inferred← citeshttps://doi.org/10.1088/1402-4896/acb973openalex-snapshot
The effect of sample viscoelastic properties and cantilever amplitudes on maximum repulsive force, indentation, and energy dissipation in bimodal AFM
inferred← citeshttps://doi.org/10.1088/1674-1056/ac720eopenalex-snapshot
Precisely controlling the twist angle of epitaxial MoS2/graphene heterostructure by AFM tip manipulation
inferred← citeshttps://doi.org/10.1088/1757-899x/256/1/012004openalex-snapshot
Multi-frequency data analysis in AFM by wavelet transform
inferred← citeshttps://doi.org/10.1088/1757-899x/443/1/012026openalex-snapshot
Adaptive time-frequency analysis of signals in AFM
inferred← citeshttps://doi.org/10.1093/jxb/erw117openalex-snapshot
Mapping nano-scale mechanical heterogeneity of primary plant cell walls
inferred← citeshttps://doi.org/10.1101/812396openalex-snapshot
Combined Atomic Force Microscope and Volumetric Light Sheet System for Mechanobiology
inferred← citeshttps://doi.org/10.1103/physrevapplied.10.024017openalex-snapshot
Modeling and Measuring Viscoelasticity with Dynamic Atomic Force Microscopy
inferred← citeshttps://doi.org/10.1103/physrevapplied.7.064018openalex-snapshot
Background-Force Compensation in Dynamic Atomic Force Microscopy
inferred← citeshttps://doi.org/10.1103/physrevb.85.195449openalex-snapshot
Model-based extraction of material properties in multifrequency atomic force microscopy
inferred← citeshttps://doi.org/10.1103/physrevb.86.205405openalex-snapshot
Nonlinear dynamics of the atomic force microscope at the liquid-solid interface
inferred← citeshttps://doi.org/10.1109/acc.2014.6859224openalex-snapshot
Thermal tune method for AFM oscillatory resonant imaging in air and liquid
inferred← citeshttps://doi.org/10.1109/isse.2018.8443688openalex-snapshot
The Effect of Surface Inclination on AFM Force-Curve Calibration and Evaluation
inferred← citeshttps://doi.org/10.1109/jsen.2021.3107909openalex-snapshot
Visualization of Mechanical Microvibration and Machine Diagnosis
inferred← citeshttps://doi.org/10.1109/jsen.2021.3139072openalex-snapshot
Visualization of Microvibrations by Mechanical Frequency Tuner
inferred← citeshttps://doi.org/10.1109/sas60918.2024.10636489openalex-snapshot
Improving Calibration of an Optical Beam Deflection System
inferred← citeshttps://doi.org/10.1109/tase.2016.2538319openalex-snapshot
Improvement in the Imaging Performance of Atomic Force Microscopy: A Survey
inferred← citeshttps://doi.org/10.1109/tim.2026.3659642openalex-snapshot
Enhancing the Accuracy and Range of Cantilever-Based Measurements in Optical Beam Deflection Systems
inferred← citeshttps://doi.org/10.1111/jop.12486openalex-snapshot
Stressors alter intercellular communication and exosome profile of nasopharyngeal carcinoma cells
inferred← citeshttps://doi.org/10.1111/nyas.14189openalex-snapshot
Pituitary adenylate cyclase activating polypeptide acts against neovascularization in retinal pigment epithelial cells
inferred← citeshttps://doi.org/10.1115/1.4000160openalex-snapshot
DMCMN: Experimental/Analytical Evaluation of the Effect of Tip Mass on Atomic Force Microscope Cantilever Calibration
inferred← citeshttps://doi.org/10.1115/detc2010-28762openalex-snapshot
Effect of Material Stiffness on Intermodulation Response in Dynamic Atomic Force Microscopy
inferred← citeshttps://doi.org/10.1116/6.0003136openalex-snapshot
Some considerations in nanoindentation measurement and analysis by atomic force microscopy
inferred← citeshttps://doi.org/10.1167/iovs.10-5470openalex-snapshot
The Applications of Atomic Force Microscopy to Vision Science
inferred← citeshttps://doi.org/10.1177/1464419320951343openalex-snapshot
Effects of laser spot positioning with optical beam deflection method on tapping mode and bimodal AFM
inferred← citeshttps://doi.org/10.1179/1743280415y.0000000013openalex-snapshot
Applications of piezoresponse force microscopy in materials research: from inorganic ferroelectrics to biopiezoelectrics and beyond
inferred← citeshttps://doi.org/10.1371/journal.pone.0181369openalex-snapshot
Oligo(ethylene glycol)-sidechain microgels prepared in absence of cross-linking agent: Polymerization, characterization and variation of particle deformability
inferred← citeshttps://doi.org/10.14232/phd.9727openalex-snapshot
Role of nano-biomechanics in brain metastasis formation and amyotrophic lateral sclerosis
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