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Room-temperature deposition of a poling-free ferroelectric AlScN film by reactive sputtering

https://doi.org/10.1063/5.0035335
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Outgoing claims: the papers this work cites, builds on, or argues with.

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An accurate semi-empirical equation for sputtering yields, II: for neon, argon and xenon ions
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Piezoelectricity and Biocompatibility of Flexible Sc x Al(1– x )N Thin Films for Compliant MEMS Transducers
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Bandgap in Al1− x Sc x N
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Upward ferroelectric self-poling in (001) oriented PbZr0.2Ti0.8O3 epitaxial films with compressive strain
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Fabrication and investigation of three-dimensional ferroelectric capacitors for the application of FeRAM
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Kinetic pathway of the ferroelectric phase formation in doped HfO2 films
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AlScN: A III-V semiconductor based ferroelectric
inferredcites →https://doi.org/10.1063/1.5140612openalex-snapshot
Room-temperature deposition of ferroelectric HfO2-based films by the sputtering method
inferredcites →https://doi.org/10.1063/5.0015281openalex-snapshot
Effects of deposition conditions on the ferroelectric properties of (Al1−xScx)N thin films
inferredcites →https://doi.org/10.1080/00150199208015102openalex-snapshot
Ferroelectric memories
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Thickness dependence of polarization in ferroelectric perovskite thin films
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Memory technology—a primer for material scientists
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A Passive UHF RF Identification CMOS Tag IC Using Ferroelectric RAM in 0.35-$\mu{\hbox {m}}$ Technology
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High Endurance Ferroelectric Hafnium Oxide-Based FeFET Memory Without Retention Penalty
inferredcites →https://doi.org/10.1111/jace.14387openalex-snapshot
Scaling Effects in Perovskite Ferroelectrics: Fundamental Limits and Process‐Structure‐Property Relations
inferredcites →https://doi.org/10.1126/science.246.4936.1400openalex-snapshot
Ferroelectric Memories
inferredcites →https://doi.org/10.1143/apex.2.011003openalex-snapshot
Room-Temperature Epitaxial Growth of High Quality AlN on SiC by Pulsed Sputtering Deposition
inferredcites →https://doi.org/10.12785/ijtfst/030203openalex-snapshot
Study of Properties of AlN Thin Films Deposited by Reactive Magnetron Sputtering
inferredcites →https://doi.org/10.1557/mrs2004.235openalex-snapshot
Current Status of Ferroelectric Random-Access Memory
inferredcites →https://doi.org/10.2109/jcersj2.118.1166openalex-snapshot
Preparation of scandium aluminum nitride thin films by using scandium aluminum alloy sputtering target and design of experiments
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Ferroelectricity in Layered Perovskites as a Model of Ultra-Thin Films

What points at this work

Incoming claims: where this work appears in other papers’ reference lists and arguments.

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Low‐Field‐Driven Domain Wall Motion in Wurtzite Ferroelectrics
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Nonvolatile Control of Optical and Electronic Responses in Two-Dimensional MoS 2 via Ferroelectric ScAlN Thin Films
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Effects of local cation distribution on nitrogen vacancy formation in wurtzite A l 1 − x S c x N ferroelectrics
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Atomistic Structure of Transient Switching States in Ferroelectric AlScN
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Strain-induced bent domains in ferroelectric nitrides
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Surface-Mountable VZO Film-Based Piezoelectric Sensors Array in Foil for Underwater Fluctuating Pressure Measurements
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Wide-Range Threshold Voltage Tunable β-Ga₂O₃FETs With a Sputtered AlScN Ferroelectric Gate Dielectric
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Oxygen-Atom Incorporated Ferroelectric AlScN Capacitors for Multi-Level Operation
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Suppressed Negative DIBL of Ferroelectric HEMT With Gate-Align Patterned AlScN Stack
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N Penetration Enhances Vacancy Filling, Al/Sc-N Bonding, and Ferroelectric Properties in AlScN Films
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Impact of Scaling Thickness on the Ferroelectric Properties of Pt/Al₀.₈Sc₀.₂N/Pt Capacitors
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A Wide Memory Window of 10.3 V With Ferroelectric AlScN Layer In 2 O 3 FeFET
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Ferroelectricity in amorphous aluminum oxynitride films synthesized by inductively coupled plasma assisted atomic layer deposition
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Alternating atomic-dipole layers and switching dynamics in Al 1-x Sc x N ferroelectrics
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Low Voltage Operation of Ferroelectric AlScN Films by Oxygen Profiling
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Growth of wurtzite ferroelectrics
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Investigation of Asymmetric Ferroelectric Switching in AlScN MFM Capacitors
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inferred← citeshttps://doi.org/10.3390/electronics14214353openalex-snapshot
Rapid Thermal Annealing for Reduced Leakage and Enhanced Endurance of Reactive-Sputtered AlScN-Based Ferroelectric Memory Capacitors
inferred← citeshttps://doi.org/10.3390/mi13060887openalex-snapshot
High-Temperature Ferroelectric Behavior of Al0.7Sc0.3N
inferred← citeshttps://doi.org/10.3390/mi13101561openalex-snapshot
High Rate Deposition of Piezoelectric AlScN Films by Reactive Magnetron Sputtering from AlSc Alloy Targets on Large Area
inferred← citeshttps://doi.org/10.35848/1347-4065/abe644openalex-snapshot
A possible origin of the large leakage current in ferroelectric Al 1− x Sc x N films
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inferred← citeshttps://doi.org/10.35848/1347-4065/ac4a00openalex-snapshot
c -Axis-tilted ScAlN films grown on silicon substrates for surface acoustic wave devices
inferred← citeshttps://doi.org/10.35848/1347-4065/ac54f6openalex-snapshot
Field cycling behavior and breakdown mechanism of ferroelectric Al 0.78 Sc 0.22 N films
inferred← citeshttps://doi.org/10.35848/1347-4065/ac5d13openalex-snapshot
GaN high electron mobility transistors (HEMTs) with self-upward-polarized AlScN gate dielectrics toward enhancement-mode operation
inferred← citeshttps://doi.org/10.35848/1347-4065/ac5db0openalex-snapshot
Influence of sputtering power on the switching and reliability of ferroelectric Al 0.7 Sc 0.3 N films
inferred← citeshttps://doi.org/10.35848/1347-4065/ad21bdopenalex-snapshot
Reactive sputtering of ferroelectric AlScN films with H2 gas flow for endurance improvement
inferred← citeshttps://doi.org/10.35848/1347-4065/ad2f16openalex-snapshot
Identification of compressive strain in thin ferroelectric Al1–x Sc x N films by Raman spectroscopy
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Scandium-doped aluminum nitride thin films by scanning combinatorial pulsed laser deposition
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Polarity-dependent asymmetric switching of ferroelectric AlScN thin films
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Polarity-dependent time-dependent dielectric breakdown in ferroelectric AlScN
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On the enhancement of capacitive memory window for ferroelectric AlScN films using metal-capping oxidation (MCO) process
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Electrical Properties of Binary Thin Films
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