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The physics of amorphous-silicon thin-film transistors
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What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
inferredcites →https://doi.org/10.1002/pssb.2221000253openalex-snapshot
A Simple Scheme for Evaluating Field Effect Data
inferredcites →https://doi.org/10.1007/bf00616310openalex-snapshot
The characteristics and properties of optimised amorphous silicon field effect transistors
inferredcites →https://doi.org/10.1007/bf00618762openalex-snapshot
On the generation and annealing of dangling bond defects in hydrogenated amorphous silicon
inferredcites →https://doi.org/10.1016/0022-3093(85)90831-2openalex-snapshot
Defect model of charge transfer doping at a-SiNx:H/a-Si:H interfaces
inferredcites →https://doi.org/10.1016/0022-3093(87)90217-1openalex-snapshot
Charge trapping effects in amorphous silicon/silicon nitride thin film transistors
inferredcites →https://doi.org/10.1016/0141-9382(86)90042-9openalex-snapshot
Simplified electrode arrangement for TFT-matrix liquid crystal displays
inferredcites →https://doi.org/10.1016/0379-6787(88)90072-5openalex-snapshot
The origin of metastable states in a-Si:H
inferredcites →https://doi.org/10.1049/el:19790126openalex-snapshot
Amorphous-silicon field-effect device and possible application
inferredcites →https://doi.org/10.1063/1.100704openalex-snapshot
Time and temperature dependence of instability mechanisms in amorphous silicon thin-film transistors
inferredcites →https://doi.org/10.1063/1.1661233openalex-snapshot
A Method for the Determination of High-Field Conduction Laws in Insulating Films in the Presence of Charge Trapping
inferredcites →https://doi.org/10.1063/1.331339openalex-snapshot
Annealing and light induced changes in the field effect conductance of amorphous silicon
inferredcites →https://doi.org/10.1063/1.332486openalex-snapshot
The effect of surface states and fixed charge on the field effect conductance of amorphous silicon
inferredcites →https://doi.org/10.1063/1.332893openalex-snapshot
Physics of amorphous silicon based alloy field-effect transistors
inferredcites →https://doi.org/10.1063/1.336994openalex-snapshot
New high field-effect mobility regimes of amorphous silicon alloy thin-film transistor operation
inferredcites →https://doi.org/10.1063/1.337282openalex-snapshot
Photo-field effect in amorphous silicon thin-film transistors
inferredcites →https://doi.org/10.1063/1.337407openalex-snapshot
A self-consistent analysis of temperature-dependent field-effect measurements in hydrogenated amorphous silicon thin-film transistors
inferredcites →https://doi.org/10.1063/1.343947openalex-snapshot
Deep trapping controlled switching characteristics in amorphous silicon thin-film transistors
inferredcites →https://doi.org/10.1063/1.94399openalex-snapshot
Charge trapping instabilities in amorphous silicon-silicon nitride thin-film transistors
inferredcites →https://doi.org/10.1063/1.95158openalex-snapshot
Characteristics of amorphous silicon staggered-electrode thin-film transistors
inferredcites →https://doi.org/10.1063/1.95398openalex-snapshot
Electronic states at the hydrogenated amorphous silicon/silcon nitride interface
inferredcites →https://doi.org/10.1063/1.96851openalex-snapshot
Fast and slow states at the interface of amorphous silicon and silicon nitride
inferredcites →https://doi.org/10.1063/1.97656openalex-snapshot
Instability mechanism in hydrogenated amorphous silicon thin-film transistors
inferredcites →https://doi.org/10.1063/1.98692openalex-snapshot
Bias dependence of instability mechanisms in amorphous silicon thin-film transistors
inferredcites →https://doi.org/10.1063/1.98751openalex-snapshot
Resolution of amorphous silicon thin-film transistor instability mechanisms using ambipolar transistors
inferredcites →https://doi.org/10.1080/01418638108222369openalex-snapshot
An improved field-effect analysis for the determination of the pseudogap-state density in amorphous semiconductors
inferredcites →https://doi.org/10.1080/01418638108225803openalex-snapshot
Analysis of field-effect-conductance measurements on amorphous semiconductors
inferredcites →https://doi.org/10.1080/13642818508240550openalex-snapshot
Determination of the extended-state electron mobility in a-Si
inferredcites →https://doi.org/10.1080/13642818608243177openalex-snapshot
Electron drift mobility in amorphous Si: H
inferredcites →https://doi.org/10.1080/13642818708211222openalex-snapshot
An investigation of the conductivity prefactor in a-Si as a function of Fermi level position using the field-effect experiment
inferredcites →https://doi.org/10.1080/13642818808208511openalex-snapshot
Hole carrier drift-mobility measurements in a-Si: H, and the shape of the valence-band tail
inferredcites →https://doi.org/10.1080/13642818808218382openalex-snapshot
Temperature-dependent effects in field-effect measurements on hydrogenated amorphous silicon thin-film transistors
inferredcites →https://doi.org/10.1103/physrevb.36.6217openalex-snapshot
Creation of near-interface defects in hydrogenated amorphous silicon-silicon nitride heterojunctions: The role of hydrogen
inferredcites →https://doi.org/10.1103/physrevlett.46.1425openalex-snapshot
Evidence for Exponential Band Tails in Amorphous Silicon Hydride
inferredcites →https://doi.org/10.1103/physrevlett.56.2215openalex-snapshot
Metastable Defects in Amorphous-Silicon Thin-Film Transistors
inferredcites →https://doi.org/10.1109/displ.1988.11274openalex-snapshot
A 14-in.-diagonal full-color a-Si TFT LCD
inferredcites →https://doi.org/10.1109/displ.1988.11298openalex-snapshot
An amorphous Si TFT array with TaO/sub x//SiN/sub x/ double layered insulator for liquid crystal displays
inferredcites →https://doi.org/10.1109/displ.1988.11302openalex-snapshot
Page-wide a-Si:H TFT arrays for electronic printing and copying
inferredcites →https://doi.org/10.1109/displ.1988.11313openalex-snapshot
Thin-film transistors for video applications
inferredcites →https://doi.org/10.1143/jjap.26.1565openalex-snapshot
SiOx/TaOx Gate Insulator a-Si TFT for Liquid Crystal Displays
inferredcites →https://doi.org/10.1143/jjap.27.l919openalex-snapshot
Numerical Analysis of the Dynamic Characteristics of Amorphous Silicon Thin-Film Transistors
inferredcites →https://doi.org/10.1557/proc-118-255openalex-snapshot
Effect of Silicon Thickness and Surface Passivation on the Characteristics of Amorphous Silicon thin Film Transistors
inferredcites →https://doi.org/10.1557/proc-33-259openalex-snapshot
Material Properties Controlling the Performance of Amorphous Silicon Thin Film Transistors
inferredcites →https://doi.org/10.1557/proc-95-437openalex-snapshot
a-Si:H TFT Driven Linear Image Sensor
inferredcites →https://doi.org/10.1557/proc-95-445openalex-snapshot
Dynamic Characteristics of Amorphous Silicon Thin Film Transistors
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Incoming claims: where this work appears in other papers’ reference lists and arguments.
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Experimental decomposition of the positive bias temperature stress‐induced instability in self‐aligned coplanar InGaZnO thin‐film transistors and its modeling based on the multiple stretched‐exponential functions
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Electronic Defects in Amorphous Oxide Semiconductors: A Review
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Threshold Voltage Extraction Using Conductance–Voltage Method for Nano‐Organic/Oxide Thin‐Film Transistors: Comparative Study of P‐ and N‐Type Devices
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Suppression of Humidity‐Induced Drain‐Induced Barrier Lowering Degradation in a‐Si:H Thin‐Film Transistors via Structural Field‐Dispersion Engineering
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Disorder and instability processes in amorphous conducting oxides
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Origin of p‐Type Conduction in Amorphous CuI: A First‐Principles Investigation
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Methods of Deposition of Hydrogenated Amorphous Silicon for Device Applications
inferred← citeshttps://doi.org/10.1021/acs.jctc.3c00689openalex-snapshot
Velocity-Gauge Real-Time Time-Dependent Density Functional Tight-Binding for Large-Scale Condensed Matter Systems
inferred← citeshttps://doi.org/10.1021/acs.jpclett.8b00902openalex-snapshot
Realistic Atomistic Structure of Amorphous Silicon from Machine-Learning-Driven Molecular Dynamics
inferred← citeshttps://doi.org/10.1021/acsaelm.1c00463openalex-snapshot
Facile and Stable n+ Doping Process Via Simultaneous Ultraviolet and Thermal Energy for Coplanar ALD-IGZO Thin-Film Transistors
inferred← citeshttps://doi.org/10.1021/acsami.2c12006openalex-snapshot
Charge Transfer Dynamics of Doped Graphene Electrodes for Organic Light-Emitting Diodes
inferred← citeshttps://doi.org/10.1021/acsami.2c18865openalex-snapshot
Synthesis of Vacancy-Controlled Copper Iodide Semiconductor for High-Performance p-Type Thin-Film Transistors
inferred← citeshttps://doi.org/10.1021/acsami.6b06647openalex-snapshot
Electronically Pure Single-Chirality Semiconducting Single-Walled Carbon Nanotube for Large-Scale Electronic Devices
inferred← citeshttps://doi.org/10.1021/acsmaterialslett.5c01126openalex-snapshot
The Collapse of p-type Mobility in the Amorphous Phase
inferred← citeshttps://doi.org/10.1021/acsnano.6b07836openalex-snapshot
Unusually High and Anisotropic Thermal Conductivity in Amorphous Silicon Nanostructures
inferred← citeshttps://doi.org/10.1021/cm000480topenalex-snapshot
Low-Temperature Fabrication of Si Thin-Film Transistor Microstructures by Soft Lithographic Patterning on Curved and Planar Substrates
inferred← citeshttps://doi.org/10.1021/nl202695vopenalex-snapshot
Separated Carbon Nanotube Macroelectronics for Active Matrix Organic Light-Emitting Diode Displays
inferred← citeshttps://doi.org/10.1021/nl5009037openalex-snapshot
All Two-Dimensional, Flexible, Transparent, and Thinnest Thin Film Transistor
inferred← citeshttps://doi.org/10.1021/nl5029717openalex-snapshot
Black Phosphorus Radio-Frequency Transistors
inferred← citeshttps://doi.org/10.1021/nn3026172openalex-snapshot
Rigid/Flexible Transparent Electronics Based on Separated Carbon Nanotube Thin-Film Transistors and Their Application in Display Electronics
inferred← citeshttps://doi.org/10.1021/nn402348ropenalex-snapshot
Electric Stress-Induced Threshold Voltage Instability of Multilayer MoS2 Field Effect Transistors
inferred← citeshttps://doi.org/10.1038/s41427-021-00314-yopenalex-snapshot
Nanonet: Low-temperature-processed tellurium nanowire network for scalable p-type field-effect transistors and a highly sensitive phototransistor array
inferred← citeshttps://doi.org/10.1038/s41467-025-57406-4openalex-snapshot
Signatures of paracrystallinity in amorphous silicon from machine-learning-driven molecular dynamics
inferred← citeshttps://doi.org/10.1038/s41565-019-0585-9openalex-snapshot
Evaporated tellurium thin films for p-type field-effect transistors and circuits
inferred← citeshttps://doi.org/10.1038/s41598-021-90924-xopenalex-snapshot
Enhanced thin-film transistor driven high-aperture in-plane switching liquid crystal displays without common line and black matrix
inferred← citeshttps://doi.org/10.1038/s41928-019-0354-7openalex-snapshot
A conformable imager for biometric authentication and vital sign measurement
inferred← citeshttps://doi.org/10.1038/srep11755openalex-snapshot
Carbon Nanotube Driver Circuit for 6 × 6 Organic Light Emitting Diode Display
inferred← citeshttps://doi.org/10.1038/srep22567openalex-snapshot
Conduction Threshold in Accumulation-Mode InGaZnO Thin Film Transistors
inferred← citeshttps://doi.org/10.1038/srep24734openalex-snapshot
Sub-kT/q Subthreshold-Slope Using Negative Capacitance in Low-Temperature Polycrystalline-Silicon Thin-Film Transistor
inferred← citeshttps://doi.org/10.1039/c5tc00355eopenalex-snapshot
The structure–property relationship study of electron-deficient dihydroindeno[2,1-b]fluorene derivatives for n-type organic field effect transistors
inferred← citeshttps://doi.org/10.1039/c8nr03173hopenalex-snapshot
Stretchable thin-film transistors with molybdenum disulfide channels and graphene electrodes
inferred← citeshttps://doi.org/10.1039/c9cp01121hopenalex-snapshot
Electronic structure and localized states in amorphous Si and hydrogenated amorphous Si
inferred← citeshttps://doi.org/10.1039/c9tc00054bopenalex-snapshot
Synergistic combination of amorphous indium oxide with tantalum pentoxide for efficient electron transport in low-power electronics
inferred← citeshttps://doi.org/10.1039/c9tc03933copenalex-snapshot
Amorphous InGaZnO and metal oxide semiconductor devices: an overview and current status
inferred← citeshttps://doi.org/10.1039/d2ma00581fopenalex-snapshot
From stretchable and healable to self-healing semiconducting polymers: design and their TFT devices
inferred← citeshttps://doi.org/10.1039/d3ra08447gopenalex-snapshot
Low voltage-driven, high-performance TiO 2 thin film transistors with MHz switching speed
inferred← citeshttps://doi.org/10.1039/d4tc03560gopenalex-snapshot
Charge transport properties of high-mobility indium–gallium–zinc oxide thin-film transistors fabricated through atomic-layer deposition
inferred← citeshttps://doi.org/10.1049/el.2013.3795openalex-snapshot
Charge emission induced transient leakage currents of a ‐Si:H and IGZO TFTs on flexible plastic substrates
inferred← citeshttps://doi.org/10.1049/el:19960288openalex-snapshot
Tetrahedrally bonded amorphous carbon (ta-C) thinfilm transistors
inferred← citeshttps://doi.org/10.1063/1.108093openalex-snapshot
Reactive ion etch damages in inverted, trilayer thin-film transistor
inferred← citeshttps://doi.org/10.1063/1.109905openalex-snapshot
Determination of the density of states at the Fermi level of hydrogenated amorphous silicon in thin-film transistor structure by space charge limited current measurement
inferred← citeshttps://doi.org/10.1063/1.111009openalex-snapshot
Performance improvement of amorphous silicon thin-film transistors with SiO2 gate insulator by N2 plasma treatment
inferred← citeshttps://doi.org/10.1063/1.112937openalex-snapshot
Polycrystalline silicon thin film transistors deposited at low substrate temperature by remote plasma chemical vapor deposition using SiF4/H2
inferred← citeshttps://doi.org/10.1063/1.120435openalex-snapshot
Reducing threshold voltage shifts in amorphous silicon thin film transistors by hydrogenating the gate nitride prior to amorphous silicon deposition
inferred← citeshttps://doi.org/10.1063/1.121484openalex-snapshot
Investigation of intrinsic channel characteristics of hydrogenated amorphous silicon thin-film transistors by gated-four-probe structure
inferred← citeshttps://doi.org/10.1063/1.2403241openalex-snapshot
Reversible memory effects and acceptor states in pentacene-based organic thin-film transistors
inferred← citeshttps://doi.org/10.1063/1.2425020openalex-snapshot
Investigating the stability of zinc oxide thin film transistors
inferred← citeshttps://doi.org/10.1063/1.2806934openalex-snapshot
The influence of visible light on transparent zinc tin oxide thin film transistors
inferred← citeshttps://doi.org/10.1063/1.2825422openalex-snapshot
Stable indium oxide thin-film transistors with fast threshold voltage recovery
inferred← citeshttps://doi.org/10.1063/1.2902499openalex-snapshot
Analysis of the off current in nanocrystalline silicon bottom-gate thin-film transistors
inferred← citeshttps://doi.org/10.1063/1.2904704openalex-snapshot
Trap densities in amorphous-InGaZnO4 thin-film transistors
inferred← citeshttps://doi.org/10.1063/1.3413939openalex-snapshot
Investigation of the effects of Mg incorporation into InZnO for high-performance and high-stability solution-processed thin film transistors
inferred← citeshttps://doi.org/10.1063/1.346354openalex-snapshot
Effect of NH3 plasma treatment of gate nitride on the performance of amorphous silicon thin-film transistors
inferred← citeshttps://doi.org/10.1063/1.348716openalex-snapshot
Performance of thin hydrogenated amorphous silicon thin-film transistors
inferred← citeshttps://doi.org/10.1063/1.349433openalex-snapshot
Electrically neutral nitrogen dangling-bond defects in amorphous hydrogenated silicon nitride thin films
inferred← citeshttps://doi.org/10.1063/1.349584openalex-snapshot
Pulsed laser-induced amorphization of silicon films
inferred← citeshttps://doi.org/10.1063/1.3499288openalex-snapshot
Hydrogenated amorphous silicon nanowire transistors with Schottky barrier source/drain junctions
inferred← citeshttps://doi.org/10.1063/1.351246openalex-snapshot
Current-stress induced asymmetry in hydrogenated amorphous silicon n-i-n devices
inferred← citeshttps://doi.org/10.1063/1.3551536openalex-snapshot
Water-related abnormal instability of transparent oxide/organic hybrid thin film transistors
inferred← citeshttps://doi.org/10.1063/1.355835openalex-snapshot
Microvoids in diamond-like amorphous silicon carbide
inferred← citeshttps://doi.org/10.1063/1.357606openalex-snapshot
A back-side passivation film on a-Si:H thin film transistor
inferred← citeshttps://doi.org/10.1063/1.3589120openalex-snapshot
Reliability of bottom-gate graphene field-effect transistors prepared by using inductively coupled plasma-chemical vapor deposition
inferred← citeshttps://doi.org/10.1063/1.359593openalex-snapshot
Ultraviolet light induced annihilation of silicon dangling bonds in hydrogenated amorphous silicon nitride films
inferred← citeshttps://doi.org/10.1063/1.362526openalex-snapshot
Electrical characterization of n-amorphous/p-crystalline silicon heterojunctions
inferred← citeshttps://doi.org/10.1063/1.368579openalex-snapshot
Back-channel-oxidized a-Si:H thin-film transistors
inferred← citeshttps://doi.org/10.1063/1.369487openalex-snapshot
Improved stability of deuterated amorphous silicon thin film transistors
inferred← citeshttps://doi.org/10.1063/1.371836openalex-snapshot
Relative importance of the Si–Si bond and Si–H bond for the stability of amorphous silicon thin film transistors
inferred← citeshttps://doi.org/10.1063/1.4794061openalex-snapshot
Investigation of the charge transport mechanism and subgap density of states in p-type Cu2O thin-film transistors
inferred← citeshttps://doi.org/10.1063/1.4861168openalex-snapshot
Molecular doping for control of gate bias stress in organic thin film transistors
inferred← citeshttps://doi.org/10.1063/1.4916227openalex-snapshot
Ion polarization behavior in alumina under pulsed gate bias stress
inferred← citeshttps://doi.org/10.1063/1.4938014openalex-snapshot
Effects of interface and bulk properties of gate-dielectric on the performance and stability of hydrogenated amorphous silicon thin-film transistors
inferred← citeshttps://doi.org/10.1063/1.4948333openalex-snapshot
Short range atomic migration in amorphous silicon
inferred← citeshttps://doi.org/10.1063/1.4991812openalex-snapshot
Low temperature fabrication of CuxO thin-film transistors and investigation on the origin of low field effect mobility
inferred← citeshttps://doi.org/10.1063/1.5114652openalex-snapshot
Dependence of a cooling rate on structural and vibrational properties of amorphous silicon: A neural network potential-based molecular dynamics study
inferred← citeshttps://doi.org/10.1063/5.0078015openalex-snapshot
Atomistic simulations on the relationship between solid-phase epitaxial recrystallization and self-diffusion in amorphous silicon
inferred← citeshttps://doi.org/10.1063/5.0093441openalex-snapshot
Topological descriptor of thermal conductivity in amorphous Si
inferred← citeshttps://doi.org/10.1063/5.0218645openalex-snapshot
Strain mapping in amorphous germanium thin films with scanning reflectance anisotropy microscopy
inferred← citeshttps://doi.org/10.1063/5.0319177openalex-snapshot
Tunable threshold thin film transistor
inferred← citeshttps://doi.org/10.1080/01418639408240112openalex-snapshot
Transient and stress effects in amorphous silicon thin-film transistors
inferred← citeshttps://doi.org/10.1080/10408439008242189openalex-snapshot
The doping of hydrogenated amorphous silicon and its impact on devices
inferred← citeshttps://doi.org/10.1080/15421400802619917openalex-snapshot
Characteristics of Photo Leakage Currents of a-Si:H TFT Caused by the Illuminations from CCFL and White LED Backlight
inferred← citeshttps://doi.org/10.1080/15421400903054204openalex-snapshot
Analysis on the Photocurrent in a-Si:H Thin Film Transistor in Terms of Spectral Characteristics of CCFL Backlight
inferred← citeshttps://doi.org/10.1080/15421406.2010.497058openalex-snapshot
A Study on the Relationship Between Photo Leakage Currents of a-Si:H TFT and Photon Energy Transmittance of Various Color Spectrum Filters
inferred← citeshttps://doi.org/10.1080/15567265.2014.948233openalex-snapshot
Mechanical Strain Dependence of Thermal Transport in Amorphous Silicon Thin Films
inferred← citeshttps://doi.org/10.1080/15980316.2017.1385544openalex-snapshot
Review of recent advances in flexible oxide semiconductor thin-film transistors
inferred← citeshttps://doi.org/10.1088/0022-3727/32/16/302openalex-snapshot
Remote plasma chemical vapour deposition of silicon films at low temperature with H2and He plasma gases
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