On the public citation graph
System design for PCB defects detection based on AOI technology
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Inferred edges come from two machine sources: sweeps of open repository metadata (mostly SSRN and Zenodo), and a bulk OpenAlex citation snapshot. Every row below is labelled with the one it came from. Neither is a complete citation index — absence here is not evidence of absence.
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What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
inferredcites →https://doi.org/10.1006/cviu.1996.0020openalex-snapshot
Automatic PCB Inspection Algorithms: A Survey
inferredcites →https://doi.org/10.1016/0166-3615(95)00063-1openalex-snapshot
Automated inspection of printed circuit boards through machine vision
inferredcites →https://doi.org/10.1109/34.3867openalex-snapshot
A rule based approach for visual pattern inspection
inferredcites →https://doi.org/10.1109/cisp.2009.5303494openalex-snapshot
New Method for Image Denoising while Keeping Edge Information
inferredcites →https://doi.org/10.1109/cisp.2009.5305490openalex-snapshot
Application of Facial Feature Localization Using Constrained Local Models in Template-Based Caricature Synthesis
inferredcites →https://doi.org/10.1109/iccda.2010.5540701openalex-snapshot
Cr image enhancement based on human visual characteristics
inferredcites →https://doi.org/10.1109/iccet.2010.5486012openalex-snapshot
A color image segmentation algorithm based on region growing
inferredcites →https://doi.org/10.1109/is.2004.1344839openalex-snapshot
On the use of PDL, for domain independent and extensible pattern recognition
inferredcites →https://doi.org/10.1109/tip.2010.2051753openalex-snapshot
Adaptive Color Feature Extraction Based on Image Color Distributions
inferredcites →https://doi.org/10.1109/tsmc.1984.6313300openalex-snapshot
A system for the automatic visual inspection of bare-printed circuit boards
What points at this work
Incoming claims: where this work appears in other papers’ reference lists and arguments.
inferred← citeshttps://doi.org/10.1002/jnm.3134openalex-snapshot
Power amplifier circuit defect detection based on improved Patch SVDD
inferred← citeshttps://doi.org/10.1007/978-981-96-4467-4_15openalex-snapshot
Defect Detection Method for Printed Circuit Boards Based on Photometric Stereo
inferred← citeshttps://doi.org/10.1007/978-981-96-6596-9_21openalex-snapshot
YOLO-Pdd: A Novel Multi-scale PCB Defect Detection Method Using Deep Representations with Sequential Images
inferred← citeshttps://doi.org/10.1007/978-981-99-0405-1_18openalex-snapshot
Object Detection Based Automated Optical Inspection of Printed Circuit Board Assembly Using Deep Learning
inferred← citeshttps://doi.org/10.1007/978-981-99-2443-1_13openalex-snapshot
An Improved Perspective Transformation and Subtraction Operation for PCB Defect Detection
inferred← citeshttps://doi.org/10.1007/s00170-023-11087-9openalex-snapshot
FDD: a deep learning–based steel defect detectors
inferred← citeshttps://doi.org/10.1007/s44163-023-00081-5openalex-snapshot
Automatic printed circuit board inspection: a comprehensible survey
inferred← citeshttps://doi.org/10.1016/j.measurement.2024.114315openalex-snapshot
Metal surface defect detection based on Latitude-Longitude light sources
inferred← citeshttps://doi.org/10.1016/j.optlaseng.2021.106633openalex-snapshot
An intelligent and automated 3D surface defect detection system for quantitative 3D estimation and feature classification of material surface defects
inferred← citeshttps://doi.org/10.1016/j.procs.2017.03.147openalex-snapshot
A Method of Gate-level Circuit Yield Calculation Based on PTM
inferred← citeshttps://doi.org/10.1038/s41598-026-49162-2openalex-snapshot
SCMEO-DETR provides a lightweight and high efficiency solution for PCB defect detection based on RT-DETR
inferred← citeshttps://doi.org/10.1109/access.2016.2631658openalex-snapshot
A Machine Vision Based Automatic Optical Inspection System for Measuring Drilling Quality of Printed Circuit Boards
inferred← citeshttps://doi.org/10.1109/aiiot58432.2024.10574777openalex-snapshot
A Novel ROI-based Dataset for PCB Defects Detection and Classification
inferred← citeshttps://doi.org/10.1109/aris50834.2020.9205786openalex-snapshot
Development and Implementation of Novel Six-Sided Automated Optical Inspection for Metallic Objects
inferred← citeshttps://doi.org/10.1109/ccdc.2015.7161835openalex-snapshot
3-D reconstruction for SMT solder joint based on joint shadow
inferred← citeshttps://doi.org/10.1109/eaic66483.2025.11101424openalex-snapshot
TR-YOLO: An Enhanced Model for PCB Mixed Defect Detection and Classification
inferred← citeshttps://doi.org/10.1109/iccece54139.2022.9712737openalex-snapshot
PCB Defect Detection based on Generative Adversarial Network
inferred← citeshttps://doi.org/10.1109/icept56209.2022.9873220openalex-snapshot
Defect detection of printed circuit board based on small target recognition network
inferred← citeshttps://doi.org/10.1109/icesc70182.2026.11687176openalex-snapshot
Automated PCB Defect Detection and Grid-based Localization using YOLOv8 for Industrial Quality Inspection
inferred← citeshttps://doi.org/10.1109/icmlca66850.2025.11336522openalex-snapshot
Research on Pin-Type Solder Joint Detection under Three-Color Light Attenuation and Scene Variability
inferred← citeshttps://doi.org/10.1109/isie45063.2020.9152533openalex-snapshot
Automatic Industry PCB Board DIP Process Defect Detection with Deep Ensemble Method
inferred← citeshttps://doi.org/10.1109/jestie.2024.3365030openalex-snapshot
3-D Vision and Intelligent Online Inspection in SMT Microelectronic Packaging: A Review
inferred← citeshttps://doi.org/10.1109/soli66289.2025.11396321openalex-snapshot
Vision-Language RAG for Post-AOI PCB Inspection
inferred← citeshttps://doi.org/10.1109/taai.2016.7880155openalex-snapshot
Speed control in AOI system by using neural networks algorithm
inferred← citeshttps://doi.org/10.1109/tcpmt.2020.3047089openalex-snapshot
Automatic Industry PCB Board DIP Process Defect Detection System Based on Deep Ensemble Self-Adaption Method
inferred← citeshttps://doi.org/10.1109/tim.2022.3229708openalex-snapshot
Multiscale Convolution-Based Probabilistic Classification for Detecting Bare PCB Defects
inferred← citeshttps://doi.org/10.1109/tim.2024.3386210openalex-snapshot
U2D2PCB: Uncertainty-Aware Unsupervised Defect Detection on PCB Images Using Reconstructive and Discriminative Models
inferred← citeshttps://doi.org/10.1145/3576841.3585918openalex-snapshot
Autonomous and Cost-effective Defect Detection System for Molded Pulp Products
inferred← citeshttps://doi.org/10.1155/2023/2024237openalex-snapshot
Conditional TransGAN‐Based Data Augmentation for PCB Electronic Component Inspection
inferred← citeshttps://doi.org/10.1631/fitee.2400975openalex-snapshot
AOI-OPEN: federated operation and control for DAO-based trustworthy and intelligent AOI ecology
inferred← citeshttps://doi.org/10.26438/ijcse/v7i6.837841openalex-snapshot
A Survey on Various Approaches of Automatic Optical Inspection for PCB Defect Detection
inferred← citeshttps://doi.org/10.3390/machines10020094openalex-snapshot
An Effective Multi-Scale Feature Network for Detecting Connector Solder Joint Defects
inferred← citeshttps://doi.org/10.3390/machines13080712openalex-snapshot
A Two-Stage Deep-Learning Framework for Industrial Anomaly Detection: Integrating Small-Sample Semantic Segmentation and Knowledge Distillation
inferred← citeshttps://doi.org/10.3390/s26020689openalex-snapshot
YOLO-UMS: Multi-Scale Feature Fusion Based on YOLO Detector for PCB Surface Defect Detection
inferred← citeshttps://doi.org/10.5954/icarob.2023.gs1-1openalex-snapshot
Defect Solder Classification in Print Circuit Boards using Machine Learning
inferred← citeshttps://doi.org/10.7717/peerj-cs.2548openalex-snapshot
YOLOv8-DEE: a high-precision model for printed circuit board defect detection
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