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Traps in the Nanocomposite Layer of Silicon–Silicon Dioxide and Their Effect on the Luminescent Properties
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What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
inferredcites →https://doi.org/10.1002/pssa.2210700107openalex-snapshot
A model for the non-bridging oxygen center in fused silica
inferredcites →https://doi.org/10.1007/978-1-4615-0215-9openalex-snapshot
Scanning Electron Microscopy and X-ray Microanalysis
inferredcites →https://doi.org/10.1007/s11664-018-6280-zopenalex-snapshot
High-Temperature Annealing as a Method for the Silicon Nanoclusters Growth in Stoichiometric Silicon Dioxide
inferredcites →https://doi.org/10.1016/j.optmat.2017.02.027openalex-snapshot
Cathodoluminescence of YAG:Nd optical nanoceramics in the visible and UV ranges
inferredcites →https://doi.org/10.1016/j.physb.2009.08.133openalex-snapshot
Silicon nanoclusters formation in silicon dioxide by high power density electron beam
inferredcites →https://doi.org/10.1016/j.tsf.2005.12.119openalex-snapshot
Silicon nanostructures for third generation photovoltaic solar cells
inferredcites →https://doi.org/10.1016/s0022-3093(02)00952-3openalex-snapshot
Cathodoluminescence of Ge+, Si+, and O+ implanted SiO2 layers and the role of mobile oxygen in defect transformations
inferredcites →https://doi.org/10.1023/b:inet.0000038392.08043.d6openalex-snapshot
A High-Sensitivity System for Cathodoluminescent Studies with the Camebax Electron Probe Microanalyzer
inferredcites →https://doi.org/10.1063/1.322511openalex-snapshot
Drift mobility determinations using surface-potential decay in insulators
inferredcites →https://doi.org/10.1063/1.3651396openalex-snapshot
Kelvin probe force gradient microscopy of charge dissipation in nano thin dielectric layers
inferredcites →https://doi.org/10.1063/1.4905933openalex-snapshot
Charge trapping of Ge-nanocrystals embedded in TaZrOx dielectric films
inferredcites →https://doi.org/10.1063/1.4916511openalex-snapshot
Direct probing of electron and hole trapping into nano-floating-gate in organic field-effect transistor nonvolatile memories
inferredcites →https://doi.org/10.1109/ted.2016.2588439openalex-snapshot
Charge-Trapping Phenomena in HfO 2 -Based FeFET-Type Nonvolatile Memories
inferredcites →https://doi.org/10.1134/1.1187351openalex-snapshot
Nonequilibrium segregation of phosphorus in the system silicon dioxide-silicon
inferredcites →https://doi.org/10.1134/1.1576471openalex-snapshot
Effect of oxidizing environments on the diffusion-segregation boron distribution in the thermal silicon dioxide-silicon system
inferredcites →https://doi.org/10.1134/s1063782616060099openalex-snapshot
Growth of silicon nanoclusters in thermal silicon dioxide under annealing in an atmosphere of nitrogen
inferredcites →https://doi.org/10.1134/s1063783416100188openalex-snapshot
Transformation of point defects in silicon dioxide during annealing
inferredcites →https://doi.org/10.1142/9789814241137openalex-snapshot
Silicon Nanophotonics - Basic Principles, Present Status and Perspectives
inferredcites →https://doi.org/10.1147/rd.524.0529openalex-snapshot
Flash memories: Successes and challenges
What points at this work
Incoming claims: where this work appears in other papers’ reference lists and arguments.
inferred← citeshttps://doi.org/10.1007/s11664-020-08080-3openalex-snapshot
Charging Effects in Al-SiO2-p-Si Structures After Low-Energy Electron Beam Irradiation
inferred← citeshttps://doi.org/10.1016/j.ceramint.2025.09.157openalex-snapshot
Synthesis, scintillation properties, and the influence of trap states on luminescence of gadolinium-lanthanum-europium germanate borates Gd13-xLaxEuGe2B6O34
inferred← citeshttps://doi.org/10.1016/j.jnoncrysol.2023.122558openalex-snapshot
Synthesis, optical and cathodoluminescent properties of borosilicate glass doped with Eu3+
inferred← citeshttps://doi.org/10.1021/acsanm.3c02178openalex-snapshot
Determination of Type and Concentration of Traps in Nanoscale-Thick HfO2 Films Applicable for Gate Dielectric Stacks
inferred← citeshttps://doi.org/10.1088/1742-6596/1697/1/012061openalex-snapshot
Effect of passivation on the n-InP optical and electronic properties
inferred← citeshttps://doi.org/10.1088/1742-6596/2103/1/012067openalex-snapshot
Kelvin-probe microscopy as a technique of estimation of the charge traps saturation time
inferred← citeshttps://doi.org/10.1088/1742-6596/2103/1/012167openalex-snapshot
Influence of the aluminum content on the luminescent and electronic properties of β-Ga2O3
inferred← citeshttps://doi.org/10.1134/s1063782621080066openalex-snapshot
Optical and Electronic Properties of Passivated InP(001) Surfaces
inferred← citeshttps://doi.org/10.1134/s1063783421040089openalex-snapshot
Charge Carrier Traps in a Bulk Gallium Oxide β-Ga2O3
inferred← citeshttps://doi.org/10.21883/eos.2022.12.55242.4244-22openalex-snapshot
Cathodoluminescence of intrinsic defects in films La : HfZrO
inferred← citeshttps://doi.org/10.21883/os.2022.12.54088.4244-22openalex-snapshot
Катодолюминесценция собственных дефектов в пленках La : HfZrO
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