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Post-silicon power characterization using thermal infrared emissions

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What this work says

Outgoing claims: the papers this work cites, builds on, or argues with.

inferredcites →https://doi.org/10.1109/hpca.2009.4798264openalex-snapshot
CAMP: A technique to estimate per-structure power at run-time using a few simple parameters
inferredcites →https://doi.org/10.1109/jproc.2006.879797openalex-snapshot
Thermal Modeling, Analysis, and Management in VLSI Circuits: Principles and Methods
inferredcites →https://doi.org/10.1109/jssc.2006.885064openalex-snapshot
Hotspot-Limited Microprocessors: Direct Temperature and Power Distribution Measurements
inferredcites →https://doi.org/10.1109/micro.2006.30openalex-snapshot
Live, Runtime Phase Monitoring and Prediction on Real Systems with Application to Dynamic Power Management
inferredcites →https://doi.org/10.1109/tcapt.2008.916859openalex-snapshot
Investigation of the Impact of Power Granularity on Chip Thermal Modeling Using White Noise Analysis
inferredcites →https://doi.org/10.1109/ted.2007.909039openalex-snapshot
A Self-Consistent Substrate Thermal Profile Estimation Technique for Nanoscale ICs—Part I: Electrothermal Couplings and Full-Chip Package Thermal Model
inferredcites →https://doi.org/10.1137/1.9780898717570openalex-snapshot
Computational Methods for Inverse Problems
inferredcites →https://doi.org/10.1145/1281700.1281716openalex-snapshot
Measuring performance, power, and temperature from real processors
inferredcites →https://doi.org/10.1145/1391469.1391660openalex-snapshot
Many-core design from a thermal perspective
inferredcites →https://doi.org/10.1145/339647.339657openalex-snapshot
Wattch
inferredcites →https://doi.org/10.1145/566408.566426openalex-snapshot
Modeling and analysis of leakage power considering within-die process variations
inferredcites →https://doi.org/10.1201/9781315157009-18openalex-snapshot
Infrared devices and techniques
inferredcites →https://doi.org/10.1887/0750304359openalex-snapshot
Introduction to Inverse Problems in Imaging

What points at this work

Incoming claims: where this work appears in other papers’ reference lists and arguments.

inferred← citeshttps://doi.org/10.2139/ssrn.4135171openalex-extracted
Experimental Evaluation of Individual Hotspots of a Multicore Microprocessor Using Pulsating Heat Sources
inferred← citeshttps://doi.org/10.2139/ssrn.4135173openalex-extracted
Experimental Evaluation of Individual Hotspots of a Multicore Microprocessor Using Pulsating Heat Sources
inferred← citeshttps://doi.org/10.1007/978-3-031-56152-8_4openalex-snapshot
Pre-Silicon Verification and Post-Silicon Validation Methodologies
inferred← citeshttps://doi.org/10.1007/978-3-319-89641-0_7openalex-snapshot
Thermal Scans for Detecting Hardware Trojans
inferred← citeshttps://doi.org/10.1007/978-3-642-24154-3_12openalex-snapshot
Agent-Based Thermal Management Using Real-Time I/O Communication Relocation for 3D Many-Cores
inferred← citeshttps://doi.org/10.1007/978-3-642-30659-4_6openalex-snapshot
Thermal Management in Many Core Systems
inferred← citeshttps://doi.org/10.1016/j.micpro.2017.05.016openalex-snapshot
SAFEPOWER project: Architecture for safe and power-efficient mixed-criticality systems
inferred← citeshttps://doi.org/10.1016/j.vlsi.2011.12.001openalex-snapshot
Post-silicon power mapping techniques for integrated circuits
inferred← citeshttps://doi.org/10.1016/j.vlsi.2013.07.003openalex-snapshot
Compact thermal modeling for packaged microprocessor design with practical power maps
inferred← citeshttps://doi.org/10.1109/date.2012.6176496openalex-snapshot
Runtime power estimator calibration for high-performance microprocessors
inferred← citeshttps://doi.org/10.1109/edaps.2012.6469401openalex-snapshot
Chip-package-PCB thermal co-design for hot spot analysis in SoC
inferred← citeshttps://doi.org/10.1109/fpl.2013.6645567openalex-snapshot
Analyzing the thermal hotspots in FPGA-based embedded systems
inferred← citeshttps://doi.org/10.1109/icccn.2011.6006065openalex-snapshot
Static Thermal Model Learning for High-Performance Multicore Servers
inferred← citeshttps://doi.org/10.1109/iccd.2010.5647690openalex-snapshot
Temperature-to-power mapping
inferred← citeshttps://doi.org/10.1109/iccd.2016.7753336openalex-snapshot
Thermal-aware 3D design for side-channel information leakage
inferred← citeshttps://doi.org/10.1109/iccd.2018.00022openalex-snapshot
Machine Learning on the Thermal Side-Channel: Analysis of Accelerator-Rich Architectures
inferred← citeshttps://doi.org/10.1109/ieeeconf56349.2022.10051994openalex-snapshot
Toward Thermal Imaging Analysis to Characterize Operations of Solid-State Drives via the Temperature Side-Channel
inferred← citeshttps://doi.org/10.1109/islped.2013.6629264openalex-snapshot
Power mapping and modeling of multi-core processors
inferred← citeshttps://doi.org/10.1109/islped65674.2025.11261773openalex-snapshot
Power Map Characterization and Modeling for Commercial CPU/GPUs Considering Temperature Dependence
inferred← citeshttps://doi.org/10.1109/itherm.2012.6231587openalex-snapshot
Thermal imaging and power mapping at IBM
inferred← citeshttps://doi.org/10.1109/jetcas.2011.2158275openalex-snapshot
Thermal and Power Characterization of Real Computing Devices
inferred← citeshttps://doi.org/10.1109/jsen.2017.2774704openalex-snapshot
Blind Identification of Thermal Models and Power Sources From Thermal Measurements
inferred← citeshttps://doi.org/10.1109/micro50266.2020.00088openalex-snapshot
FlexWatts: A Power- and Workload-Aware Hybrid Power Delivery Network for Energy-Efficient Microprocessors
inferred← citeshttps://doi.org/10.1109/tc.2012.293openalex-snapshot
An Effective Gray-Box Identification Procedure for Multicore Thermal Modeling
inferred← citeshttps://doi.org/10.1109/tcad.2013.2253156openalex-snapshot
Sampling in Thermal Simulation of Processors: Measurement, Characterization, and Evaluation
inferred← citeshttps://doi.org/10.1109/tcad.2013.2272542openalex-snapshot
PowerField: A Probabilistic Approach for Temperature-to-Power Conversion Based on Markov Random Field Theory
inferred← citeshttps://doi.org/10.1109/tcad.2014.2354293openalex-snapshot
Novel Techniques for High-Sensitivity Hardware Trojan Detection Using Thermal and Power Maps
inferred← citeshttps://doi.org/10.1109/tcad.2015.2474382openalex-snapshot
Thermal Analysis and Interpolation Techniques for a Logic + WideIO Stacked DRAM Test Chip
inferred← citeshttps://doi.org/10.1109/tcad.2020.3007541openalex-snapshot
Post-Silicon Heat-Source Identification and Machine-Learning-Based Thermal Modeling Using Infrared Thermal Imaging
inferred← citeshttps://doi.org/10.1109/tcad.2021.3088081openalex-snapshot
Full-Chip Power Density and Thermal Map Characterization for Commercial Microprocessors Under Heat Sink Cooling
inferred← citeshttps://doi.org/10.1109/tvlsi.2012.2211111openalex-snapshot
Power Mapping of Integrated Circuits Using AC-Based Thermography
inferred← citeshttps://doi.org/10.1109/tvlsi.2017.2788437openalex-snapshot
Fast and Accurate Emissivity and Absolute Temperature Maps Measurement for Integrated Circuits
inferred← citeshttps://doi.org/10.1145/1950413.1950437openalex-snapshot
Thermal and power characterization of field-programmable gate arrays
inferred← citeshttps://doi.org/10.1145/2024724.2024747openalex-snapshot
Improved post-silicon power modeling using AC lock-in techniques
inferred← citeshttps://doi.org/10.1145/2228360.2228474openalex-snapshot
PowerField
inferred← citeshttps://doi.org/10.1145/2902961.2903512openalex-snapshot
Leveraging 3D Technologies for Hardware Security
inferred← citeshttps://doi.org/10.1145/3566097.3568347openalex-snapshot
Learning Based Spatial Power Characterization and Full-Chip Power Estimation for Commercial TPUs
inferred← citeshttps://doi.org/10.1504/ijhpsa.2014.061448openalex-snapshot
Processor power estimation techniques: a survey
inferred← citeshttps://doi.org/10.1561/1000000022openalex-snapshot
Power Modeling and Characterization of Computing Devices: A Survey
inferred← citeshttps://doi.org/10.23919/date.2017.7927274openalex-snapshot
Blind identification of power sources in processors
inferred← citeshttps://doi.org/10.33099/2311-7249/2021-42-3-55-62openalex-snapshot
Умови застосування методу власного випромінювання при вирішенні задач технічної діагностики напівпровідникових структур
inferred← citeshttps://doi.org/10.3390/electronics12132978openalex-snapshot
Accurate On-Chip Thermal Peak Detection Based on Heuristic Algorithms and Embedded Temperature Sensors
inferred← citeshttps://doi.org/10.5098/hmt.19.30openalex-snapshot
EVALUATION OF THE USE OF CONSTRAINTS IN STEP-BY-STEP ALGORITHMS FOR THE SOLUTION OF A 2D INVERSE HEAT TRANSFER PROBLEM
inferred← citeshttps://doi.org/10.5555/2485288.2485593openalex-snapshot
High-sensitivity hardware trojan detection using multimodal characterization
inferred← citeshttps://doi.org/10.5555/2492708.2492799openalex-snapshot
Runtime power estimator calibration for high-performance microprocessors
inferred← citeshttps://doi.org/10.5555/2648668.2648680openalex-snapshot
Power mapping and modeling of multi-core processors
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