On the public citation graph
https://doi.org/10.2139/ssrn.4675786
0 signed · 33 inferred · view as graph
Inferred edges come from two machine sources: sweeps of open repository metadata (mostly SSRN and Zenodo), and a bulk OpenAlex citation snapshot. Every row below is labelled with the one it came from. Neither is a complete citation index — absence here is not evidence of absence.
Is this your work? Sign in with ORCID and put your name on the
claims that are yours.
Reference health. See whether every reference in this work resolves to a
known work and none has been retracted — and get a dated CiteStamped
badge you can embed.
What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
inferredcites →https://doi.org/10.1002/adma.202200659openalex-extracted
Review of Semiconductor Flash Memory Devices for Material and Process Issues
inferredcites →https://doi.org/10.1006/jcph.1995.1039openalex-extracted
Fast Parallel Algorithms for Short-Range Molecular Dynamics
inferredcites →https://doi.org/10.1007/s10853-016-0242-8openalex-extracted
Molecular dynamics simulations of the structure and mechanical properties of silica glass using ReaxFF
inferredcites →https://doi.org/10.1016/j.apsusc.2018.09.253openalex-extracted
A molecular dynamics study on stress generation during thin film growth
inferredcites →https://doi.org/10.1016/j.jallcom.2019.152552openalex-extracted
Annealing influence on optical performance of HfO2 thin films
inferredcites →https://doi.org/10.1016/j.mser.2013.07.001openalex-extracted
Classical atomistic simulations of surfaces and heterogeneous interfaces with the charge-optimized many body (COMB) potentials
inferredcites →https://doi.org/10.1016/j.solener.2014.04.012openalex-extracted
Residual stress and mechanical property measurements in amorphous Si photovoltaic thin films
inferredcites →https://doi.org/10.1039/c3nr02608fopenalex-extracted
Electron beam induced local crystallization of HfO2 nanopores for biosensing applications
inferredcites →https://doi.org/10.1063/1.328693openalex-extracted
Polymorphic transitions in single crystals: A new molecular dynamics method
inferredcites →https://doi.org/10.1063/1.3634052openalex-extracted
Ferroelectricity in hafnium oxide thin films
inferredcites →https://doi.org/10.1063/1.468398openalex-extracted
Dynamical fluctuating charge force fields: Application to liquid water
inferredcites →https://doi.org/10.1063/1.4825197openalex-extracted
Unified interatomic potential and energy barrier distributions for amorphous oxides
inferredcites →https://doi.org/10.1063/1.5009439openalex-extracted
Effect of annealing on structural changes and oxygen diffusion in amorphous HfO2 using classical molecular dynamics
inferredcites →https://doi.org/10.1063/1.5023707openalex-extracted
New optimization scheme to obtain interaction potentials for oxide glasses
inferredcites →https://doi.org/10.1088/0022-3719/18/6/010openalex-extracted
Potential models for ionic oxides
inferredcites →https://doi.org/10.1088/0965-0393/18/1/015012openalex-extracted
Visualization and analysis of atomistic simulation data with OVITO–the Open Visualization Tool
inferredcites →https://doi.org/10.1103/physrev.140.a1133openalex-extracted
Self-Consistent Equations Including Exchange and Correlation Effects
inferredcites →https://doi.org/10.1103/physreva.31.1695openalex-extracted
Canonical dynamics: Equilibrium phase-space distributions
inferredcites →https://doi.org/10.1103/physrevb.43.5068openalex-extracted
Interatomic force fields for silicas, aluminophosphates, and zeolites: Derivation based onab initiocalculations
inferredcites →https://doi.org/10.1103/physrevb.81.125328openalex-extracted
Charge-optimized many-body potential for the hafnium/hafnium oxide system
inferredcites →https://doi.org/10.1103/physrevlett.64.1955openalex-extracted
Force fields for silicas and aluminophosphates based on ab initio calculations
inferredcites →https://doi.org/10.1103/physrevlett.88.156103openalex-extracted
Origin of Compressive Residual Stress in Polycrystalline Thin Films
inferredcites →https://doi.org/10.1109/irps.2019.8720410openalex-extracted
Impact of Mechanical Stress on the Electrical Performance of 3D NAND
inferredcites →https://doi.org/10.1109/jproc.2017.2665781openalex-extracted
Reviewing the Evolution of the NAND Flash Technology
inferredcites →https://doi.org/10.1109/nvmts.2018.8603104openalex-extracted
Overview of 3D NAND Technologies and Outlook Invited Paper
inferredcites →https://doi.org/10.1109/ted.2018.2838524openalex-extracted
Characterization and Modeling of Temperature Effects in 3-D NAND Flash Arrays—Part I: Polysilicon-Induced Variability
inferredcites →https://doi.org/10.1109/ted.2019.2917785openalex-extracted
Reliability of NAND Flash Arrays: A Review of What the 2-D–to–3-D Transition Meant
inferredcites →https://doi.org/10.1109/ted.2020.3024450openalex-extracted
Impact of Mechanical Stress on 3-D NAND Flash Current Conduction
inferredcites →https://doi.org/10.1557/jmr.2004.0155openalex-extracted
Molecular-Dynamics Analysis of Interfacial Diffusion Between High-Permittivity Gate Dielectrics And Silicon Substrates
inferredcites →https://doi.org/10.3938/jkps.70.1041openalex-extracted
Simulation of residual stress and its impact on a poly-silicon channel for three-dimensional, stacked, vertical-NAND flash memories
Editorial review for independent work. ICSAC — the Institute for Complexity
Science and Advanced Computing — runs a structured editorial panel for researchers
publishing outside journals, and publishes on CiteStamp rails. Submission is free
and goes through ORCID: icsacinstitute.org/submit.