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Dual-Channel Wafer Defect Segmentation and Classification Algorithm Based on Adaptive Data Augumentation

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inferredcites →https://doi.org/10.1007/978-3-030-57077-4_10openalex-extracted
PyTorch
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U-Net: Convolutional Networks for Biomedical Image Segmentation
inferredcites →https://doi.org/10.1007/978-3-662-56472-1_16openalex-extracted
Wafer Processing
inferredcites →https://doi.org/10.1016/j.array.2023.100318openalex-extracted
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High-performance one-stage detector for SiC crystal defects based on convolutional neural network
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Retinal vessel segmentation of color fundus images using multiscale convolutional neural network with an improved cross-entropy loss function
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The chips are down for Moore’s law
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inferredcites →https://doi.org/10.1109/access.2021.3068378openalex-extracted
Unsupervised Pre-Training of Imbalanced Data for Identification of Wafer Map Defect Patterns
inferredcites →https://doi.org/10.1109/asmc.2019.8791815openalex-extracted
A Deep Learning Model for Identification of Defect Patterns in Semiconductor Wafer Map
inferredcites →https://doi.org/10.1109/cvpr.2016.90openalex-extracted
Deep Residual Learning for Image Recognition
inferredcites →https://doi.org/10.1109/cvpr46437.2021.01306openalex-extracted
Rethinking the Heatmap Regression for Bottom-up Human Pose Estimation
inferredcites →https://doi.org/10.1109/icdm50108.2020.00094openalex-extracted
Rethinking Dice Loss for Medical Image Segmentation
inferredcites →https://doi.org/10.1109/itsc57777.2023.10422368openalex-extracted
A Deeply Supervised Semantic Segmentation Method Based on GAN
inferredcites →https://doi.org/10.1109/tim.2020.3007292openalex-extracted
A Novel Method Based on Deep Convolutional Neural Networks for Wafer Semiconductor Surface Defect Inspection
inferredcites →https://doi.org/10.1109/tiv.2023.3274536openalex-extracted
Motion Planning for Autonomous Driving: The State of the Art and Future Perspectives
inferredcites →https://doi.org/10.1109/tpami.2017.2699184openalex-extracted
DeepLab: Semantic Image Segmentation with Deep Convolutional Nets, Atrous Convolution, and Fully Connected CRFs
inferredcites →https://doi.org/10.1109/tsm.2018.2795466openalex-extracted
Wafer Map Defect Pattern Classification and Image Retrieval Using Convolutional Neural Network
inferredcites →https://doi.org/10.1109/tsm.2019.2902657openalex-extracted
Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class
inferredcites →https://doi.org/10.1109/tsm.2019.2904306openalex-extracted
A Voting Ensemble Classifier for Wafer Map Defect Patterns Identification in Semiconductor Manufacturing
inferredcites →https://doi.org/10.1109/tsm.2019.2916835openalex-extracted
A Novel DBSCAN-Based Defect Pattern Detection and Classification Framework for Wafer Bin Map
inferredcites →https://doi.org/10.1109/tsm.2020.2994357openalex-extracted
A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes
inferredcites →https://doi.org/10.1109/tsm.2020.3013004openalex-extracted
A Light-Weight Neural Network for Wafer Map Classification Based on Data Augmentation
inferredcites →https://doi.org/10.1109/tsm.2020.3020985openalex-extracted
Deformable Convolutional Networks for Efficient Mixed-Type Wafer Defect Pattern Recognition
inferredcites →https://doi.org/10.1117/12.2657960openalex-extracted
On-line real-time detection system for wafer surface defects based on deep learning and generative adversarial network
inferredcites →https://doi.org/10.3390/mi14050905openalex-extracted
Wafer Surface Defect Detection Based on Background Subtraction and Faster R-CNN
inferredcites →https://doi.org/10.3390/s23177579openalex-extracted
Rectangular Amplitude Mask-Based Auto-Focus Method with a Large Range and High Precision for a Micro-LED Wafer Defects Detection System
inferredcites →https://doi.org/10.3934/mbe.2023526openalex-extracted
A full-flow inspection method based on machine vision to detect wafer surface defects
inferredcites →https://doi.org/10.48550/arxiv.2012.15175openalex-snapshot
Rethinking the Heatmap Regression for Bottom-up Human Pose Estimation
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