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Optical Properties of a Znte Thin Film with Incoherent Substrate

https://doi.org/10.2139/ssrn.5389306
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Outgoing claims: the papers this work cites, builds on, or argues with.

inferredcites →https://doi.org/10.1002/0470021942openalex-snapshot
Optical Properties of Condensed Matter and Applications
inferredcites →https://doi.org/10.1007/978-3-319-21602-7openalex-snapshot
The Physics of Thin Film Optical Spectra
inferredcites →https://doi.org/10.1007/978-3-319-75377-5openalex-snapshot
Spectroscopic Ellipsometry for Photovoltaics
inferredcites →https://doi.org/10.1007/978-3-642-54063-9openalex-snapshot
Optical Coatings: Material Aspects in Theory and Practice
inferredcites →https://doi.org/10.1007/s00339-020-04045-9openalex-snapshot
Observation of mixed types of energy gaps in some II–VI semiconductors nanostructured films: towards enhanced solar cell performance
inferredcites →https://doi.org/10.1007/s12596-019-00550-0openalex-snapshot
Characterization of electrodeposited ZnTe thin films
inferredcites →https://doi.org/10.1016/0022-0248(95)00620-6openalex-snapshot
Native defect identification in II–VI materials
inferredcites →https://doi.org/10.1016/j.apsusc.2005.11.009openalex-snapshot
Determination of optical properties in nanostructured thin films using the Swanepoel method
inferredcites →https://doi.org/10.1016/j.matchemphys.2023.128458openalex-snapshot
Swanepoel method for estimating the film thickness and complex index of refraction by using only the lower envelope: Special case
inferredcites →https://doi.org/10.1016/j.optlastec.2008.05.022openalex-snapshot
Optical parameters of epitaxial GaN thin film on Si substrate from the reflection spectrum
inferredcites →https://doi.org/10.1016/j.optmat.2023.114584openalex-snapshot
A simple new method for retrieving spectral changes of the refractive index of thin films from transmission spectra
inferredcites →https://doi.org/10.1016/j.physb.2009.06.002openalex-snapshot
Microstructural parameters and optical constants of ZnTe thin films with various thicknesses
inferredcites →https://doi.org/10.1016/j.physb.2021.413266openalex-snapshot
Refractive index of WO3 thin films grown under various temperatures determined by the Swanepoel method
inferredcites →https://doi.org/10.1016/s0040-6090(00)01697-7openalex-snapshot
Study of ZnTe thin films deposited by r.f. sputtering
inferredcites →https://doi.org/10.1016/s0040-6090(98)01483-7openalex-snapshot
Simple method for the determination of optical parameters of inhomogeneous thin films
inferredcites →https://doi.org/10.1016/s0040-6090(99)00808-1openalex-snapshot
Electrodeposition of ZnTe for photovoltaic cells
inferredcites →https://doi.org/10.1016/s0169-4332(00)00498-0openalex-snapshot
Optical and structural properties of two-sourced evaporated ZnTe thin films
inferredcites →https://doi.org/10.1063/1.555705openalex-snapshot
Refractive Index of ZnS, ZnSe, and ZnTe and Its Wavelength and Temperature Derivatives
inferredcites →https://doi.org/10.1088/0022-3735/16/12/023openalex-snapshot
Determination of the thickness and optical constants of amorphous silicon
inferredcites →https://doi.org/10.1117/12.941038openalex-snapshot
Growth And Characterization Of Wide Gap II-VI Heterostructures
inferredcites →https://doi.org/10.1149/1.1837335openalex-snapshot
Properties of Zinc Telluride Containing Impurities Introduced during Spray Pyrolysis
inferredcites →https://doi.org/10.12693/aphyspola.121.628openalex-snapshot
Validity of Swanepoel's Method for Calculating the Optical Constants of Thick Films
inferredcites →https://doi.org/10.1364/oe.25.000440openalex-snapshot
Improvement of Swanepoel method for deriving the thickness and the optical properties of chalcogenide thin films
inferredcites →https://doi.org/10.5860/choice.46-2147openalex-snapshot
Wave propagation: from electrons to photonic crystals and left-handed materials
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