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Advanced envelope method for characterization of a single thin film on a substrate from its normal incidence UV-Vis-NIR transmittance spectrum: a case study of a-Si films

https://doi.org/10.2139/ssrn.5572975
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Energy-band-structure calculation by below-band-gap spectrophotometry in thin layers of non-crystalline semiconductors: A case study of unhydrogenated a -Si
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Single-oscillator model and determination of optical constants of some optical thin film materials
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Determination of the optical properties of non-uniformly thick non-hydrogenated sputtered silicon thin films on glass
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Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry
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Optimisation of the envelope method for characterisation of optical thin film on substrate specimens from their normal incidence transmittance spectrum
inferredcites →https://doi.org/10.1016/j.tsf.2020.137984openalex-snapshot
Perfecting the dispersion model free characterization of a thin film on a substrate specimen from its normal incidence interference transmittance spectrum
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An algorithm and computer program for the calculation of envelope curves
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Optical characterization of thin films: Beyond the uniform layer model
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Realistic reflectance spectrum of thin films covering a transparent optically thick substrate
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Methods for the determination of the optical constants of thin films from single transmission measurements: a critical review
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Determination of the thickness and optical constants of amorphous silicon
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Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films
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Comparison of the Richardson–Lucy method and a classical approach for spectrometer bandpass correction
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Optimization of the graphical method of Swanepoel for characterization of thin film on substrate specimens from their transmittance spectrum
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Behavior of the Electronic Dielectric Constant in Covalent and Ionic Materials
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Disorder, defects, and optical absorption in a−Si and a−Si:H
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Refractive-Index Behavior of Amorphous Semiconductors and Glasses
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Noise spectrum estimation in adverse environments: improved minima controlled recursive averaging
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Method for superior denoising of UV/Vis/NIR transmittance spectra of thin films
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Enhancing the Swanepoel method: precise envelope detection of thin-film transmission spectra
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Optical dielectric function of Si(2,6-bis(benzimidazol-2’-yl)pyridine)2 determined by spectroscopic ellipsometry
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Advanced Computer Drawing Envelopes of Transmittance Spectra of Thin Film Specimens
inferredcites →https://doi.org/10.17148/iarjset.2020.7301openalex-snapshot
Selection of Error Metric for Accurate Characterization of a Thin Dielectric or Semiconductor Film on Glass Substrate by the Optimizing Envelope Method
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Partially Coherent Spectral Transmittance of Dielectric Thin Films with Rough Surfaces
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Application of the Holomorphic Tauc-Lorentz-Urbach Function to Extract the Optical Constants of Amorphous Semiconductor Thin Films
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The Evaluation of Noise Spectroscopy Tests
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Optical Characterization of AsxTe100−x Films Grown by Plasma Deposition Based on the Advanced Optimizing Envelope Method
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Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum
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Spectroscopic Ellipsometry: Advancements, Applications and Future Prospects in Optical Characterization
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