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Molten salt selective etching for emerging dislocations revelation in diamond layers

https://doi.org/10.2139/ssrn.6828218
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Outgoing claims: the papers this work cites, builds on, or argues with.

inferredcites →https://doi.org/10.1002/pssa.200671102openalex-snapshot
Theoretical studies on 〈100〉 dislocations in single crystal CVD diamond
inferredcites →https://doi.org/10.1002/pssa.200675444openalex-snapshot
Core reconstructions of the 〈100〉 edge dislocation in single crystal CVD diamond
inferredcites →https://doi.org/10.1002/pssa.200982210openalex-snapshot
Identification of etch‐pit crystallographic faces induced on diamond surface by H2/O2 etching plasma treatment
inferredcites →https://doi.org/10.1002/pssa.201200069openalex-snapshot
Etch‐pit formation mechanism induced on HPHT and CVD diamond single crystals by H2/O2 plasma etching treatment
inferredcites →https://doi.org/10.1002/pssa.201970068openalex-snapshot
Toward High‐Performance Diamond Electronics: Control and Annihilation of Dislocation Propagation by Metal‐Assisted Termination
inferredcites →https://doi.org/10.1007/bf00550595openalex-snapshot
Etch features on synthetic diamond crystals oxidized in fused salts
inferredcites →https://doi.org/10.1016/j.diamond.2006.08.030openalex-snapshot
Characterization of leakage current on diamond Schottky barrier diodes using thermionic-field emission modeling
inferredcites →https://doi.org/10.1016/j.diamond.2012.01.011openalex-snapshot
High temperature application of diamond power device
inferredcites →https://doi.org/10.1016/j.diamond.2012.07.008openalex-snapshot
Structural analysis of dislocations in type-IIa single-crystal diamond
inferredcites →https://doi.org/10.1016/j.diamond.2015.03.021openalex-snapshot
X-ray topographic study of defect in p− diamond layer of Schottky barrier diode
inferredcites →https://doi.org/10.1016/j.diamond.2015.08.012openalex-snapshot
Characterizations of etch pits formed on single crystal diamond surface using oxygen/hydrogen plasma surface treatment
inferredcites →https://doi.org/10.1016/j.diamond.2016.03.013openalex-snapshot
Single crystal diamond wafers for high power electronics
inferredcites →https://doi.org/10.1016/j.jcrysgro.2003.10.051openalex-snapshot
Defect-selective etching of bulk AlN single crystals in molten KOH/NaOH eutectic alloy
inferredcites →https://doi.org/10.1016/j.mssp.2018.01.007openalex-snapshot
Recent advances in diamond power semiconductor devices
inferredcites →https://doi.org/10.1016/s0924-4247(00)00458-1openalex-snapshot
Etching pits and dislocations in Si{111}
inferredcites →https://doi.org/10.1021/acs.cgd.6b00053openalex-snapshot
Identification of Dislocations in Synthetic Chemically Vapor Deposited Diamond Single Crystals
inferredcites →https://doi.org/10.1063/1.3626791openalex-snapshot
Non-destructive detection of killer defects of diamond Schottky barrier diodes
inferredcites →https://doi.org/10.1063/1.4861860openalex-snapshot
Spectroscopic ellipsometry of homoepitaxial diamond multilayers and delta-doped structures
inferredcites →https://doi.org/10.1063/5.0021076openalex-snapshot
Dislocations in chemical vapor deposition diamond layer detected by confocal Raman imaging
inferredcites →https://doi.org/10.1088/1361-6463/ab4eabopenalex-snapshot
Diamond power devices: state of the art, modelling, figures of merit and future perspective
inferredcites →https://doi.org/10.3938/jkps.69.1677openalex-snapshot
Role of the oxidizing agent in the etching of 4H-SiC substrates with molten KOH
inferredcites →https://doi.org/10.54254/2755-2721/65/20240487openalex-snapshot
A systematic analysis of wide band gap semiconductor used in power electronics
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