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When Accuracy Lies: Detecting Data-Induced Bias in Visual Inspection withAggregated XAI

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Towards Measuring Bias in Image Classification
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Unlearning from experience to avoid spurious correlations
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A survey of real-time surface defect inspection methods based on deep learning
inferredcites →https://doi.org/10.1007/s11263-019-01228-7openalex-snapshot
Grad-CAM: Visual Explanations from Deep Networks via Gradient-Based Localization
inferredcites →https://doi.org/10.1016/j.cpc.2009.09.018openalex-snapshot
Variance based sensitivity analysis of model output. Design and estimator for the total sensitivity index
inferredcites →https://doi.org/10.1016/j.eswa.2023.122749openalex-snapshot
Computer vision defect detection on unseen backgrounds for manufacturing inspection
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Quality management in the 21st century enterprises: Research pathway towards Industry 4.0
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Preemptively pruning Clever-Hans strategies in deep neural networks
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Aging workforce and industrial Robots: Industry-Level evidence from Japan
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Explainable artificial intelligence: A survey of needs, techniques, applications, and future direction
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Development and evolution of YOLO in object detection: A survey
inferredcites →https://doi.org/10.1016/j.techsoc.2021.101572openalex-snapshot
Human factors and ergonomics in manufacturing in the industry 4.0 context – A scoping review
inferredcites →https://doi.org/10.1016/s0378-4754(00)00270-6openalex-snapshot
Global sensitivity indices for nonlinear mathematical models and their Monte Carlo estimates
inferredcites →https://doi.org/10.1038/s42256-021-00338-7openalex-snapshot
AI for radiographic COVID-19 detection selects shortcuts over signal
inferredcites →https://doi.org/10.1038/s42256-023-00711-8openalex-snapshot
From attribution maps to human-understandable explanations through Concept Relevance Propagation
inferredcites →https://doi.org/10.1109/cai59869.2024.00018openalex-snapshot
A Review of Data-Centric Artificial Intelligence (DCAI) and its Impact on manufacturing Industry: Challenges, Limitations, and Future Directions
inferredcites →https://doi.org/10.1109/cvpr.2016.90openalex-snapshot
Deep Residual Learning for Image Recognition
inferredcites →https://doi.org/10.1145/3672553openalex-snapshot
Benchmarking Instance-Centric Counterfactual Algorithms for XAI: From White Box to Black Box
inferredcites →https://doi.org/10.1186/s40537-025-01313-4openalex-snapshot
Accuracy, precision, recall, f1-score, or MCC? empirical evidence from advanced statistics, ML, and XAI for evaluating business predictive models
inferredcites →https://doi.org/10.1214/aoms/1177730491openalex-snapshot
On a Test of Whether one of Two Random Variables is Stochastically Larger than the Other
inferredcites →https://doi.org/10.3109/13814788.2013.818655openalex-snapshot
The importance of effect sizes
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