On the public citation graph
Thickness Measurement Methods for Physical Vapor Deposited Aluminum Coatings in Packaging Applications: A Review
0 signed · 130 inferred · view as graph
Inferred edges come from two machine sources: sweeps of open repository metadata (mostly SSRN and Zenodo), and a bulk OpenAlex citation snapshot. Every row below is labelled with the one it came from. Neither is a complete citation index — absence here is not evidence of absence.
Is this your work? Sign in with ORCID and put your name on the
claims that are yours.
Reference health. See whether every reference in this work resolves to a
known work and none has been retracted — and get a dated CiteStamped
badge you can embed.
What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
inferredcites →https://doi.org/10.1002/14356007.b06_023openalex-snapshot
Surface and Thin-Film Analysis
inferredcites →https://doi.org/10.1002/adfm.200901363openalex-snapshot
Foldable Printed Circuit Boards on Paper Substrates
inferredcites →https://doi.org/10.1002/app.1971.070150606openalex-snapshot
Surface morphology of polyethylene after treatment in a corona discharge
inferredcites →https://doi.org/10.1002/ceat.200390093openalex-snapshot
Inorganic Layers on Polymeric Films – Influence of Defects and Morphology on Barrier Properties
inferredcites →https://doi.org/10.1002/crat.2170241209openalex-snapshot
H. Frey, G. Kienel. Dünnschichttechnologie. VDI‐Verlag GmbH, Düsseldorf 1987. 691 + XVIII pages, numerous figures and tables, 395.00 DM, ISBN 3‐18‐400670‐0
inferredcites →https://doi.org/10.1002/pen.20850openalex-snapshot
Surface roughness and light transmission of biaxially oriented polypropylene films
inferredcites →https://doi.org/10.1002/pen.760301205openalex-snapshot
Processing characteristics, structure development, and properties of uni and biaxially stretched poly(ethylene 2,6 naphthalate) (PEN) films
inferredcites →https://doi.org/10.1002/pts.563openalex-snapshot
Numerical simulation of permeation through vacuum‐coated laminate films
inferredcites →https://doi.org/10.1002/pts.966openalex-snapshot
Thin Laminate Films for Barrier Packaging Application – Influence of Down Gauging and Substrate Surface Properties on the Permeation Properties
inferredcites →https://doi.org/10.1002/vipr.200500242openalex-snapshot
Transport of Substances Through Polymeric and Inorganic Layers
inferredcites →https://doi.org/10.1002/vipr.200800372openalex-snapshot
Stofftransport durch Schichtsysteme aus Polymeren und dünnen anorganischen Schichten
inferredcites →https://doi.org/10.1007/978-3-642-29541-6openalex-snapshot
Werkstoffe – unsichtbar, aber unverzichtbar
inferredcites →https://doi.org/10.1007/978-3-642-36603-1openalex-snapshot
Materialwissenschaft und Werkstofftechnik
inferredcites →https://doi.org/10.1007/978-3-642-82835-5openalex-snapshot
Oberflächen- und Dünnschicht-Technologie
inferredcites →https://doi.org/10.1007/978-3-662-45240-0openalex-snapshot
Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy
inferredcites →https://doi.org/10.1007/978-4-431-54017-5openalex-snapshot
Porous Metals with Directional Pores
inferredcites →https://doi.org/10.1007/bf00357799openalex-snapshot
Models proposed to explain the electrical conductivity of mixtures made of conductive and insulating materials
inferredcites →https://doi.org/10.1007/bf00543811openalex-snapshot
Structure and oxygen-barrier properties of metallized polymer film
inferredcites →https://doi.org/10.1007/bf00633891openalex-snapshot
Einfaches Interferenz-Wechselobjektiv f�r Mikroskope zur Dickenmessung nach Fizeau-Tolansky
inferredcites →https://doi.org/10.1007/bf01243044openalex-snapshot
ICP-MS for elemental speciation studies
inferredcites →https://doi.org/10.1007/bf01326569openalex-snapshot
Der Einflu� der Unterlage auf die Struktur und Leitf�higkeit metallischer Aufdampfschichten
inferredcites →https://doi.org/10.1007/bf01337937openalex-snapshot
Verwendung von Schwingquarzen zur W�gung d�nner Schichten und zur Mikrow�gung
inferredcites →https://doi.org/10.1016/0040-6090(68)90064-3openalex-snapshot
Der einfluss von strukturunregelmässigkeiten beim zusammenwachsen zweier aufdampfschichten auf das schichtdickenmessverfahren mit hilfe von vielstrahl-interferenzen
inferredcites →https://doi.org/10.1016/0040-6090(81)90535-6openalex-snapshot
Electrical conductivity and electron emission from discontinuous metal films of homogeneous structure
inferredcites →https://doi.org/10.1016/0040-6090(81)90627-1openalex-snapshot
Critical assessment of thickness-dependent conductivity of thin metal films
inferredcites →https://doi.org/10.1016/0040-6090(85)90273-1openalex-snapshot
Thin film thickness measurement: A comparison of various techniques
inferredcites →https://doi.org/10.1016/0040-6090(90)90277-kopenalex-snapshot
The preparation of thin films by physical vapour deposition methods
inferredcites →https://doi.org/10.1016/0040-6090(91)90158-topenalex-snapshot
Fundamentals of sol-gel dip coating
inferredcites →https://doi.org/10.1016/0040-6090(94)06349-4openalex-snapshot
The interfacial chemistry of metallized, oxide coated, and nanocomposite coated polymer films
inferredcites →https://doi.org/10.1016/0257-8972(95)02420-4openalex-snapshot
Oxygen diffusion barrier properties of transparent oxide coatings on polymeric substrates
inferredcites →https://doi.org/10.1016/b978-012257251-7/50009-5openalex-snapshot
Characterization of Soft Magnetic Materials
inferredcites →https://doi.org/10.1016/b978-081551422-0.50008-5openalex-snapshot
Arc Vapor Deposition
inferredcites →https://doi.org/10.1016/b978-081551432-9.50005-xopenalex-snapshot
Fundamentals of Chemical Vapor Deposition
inferredcites →https://doi.org/10.1016/j.apsusc.2014.12.045openalex-snapshot
The effect of electron scattering from disordered grain boundaries on the resistivity of metallic nanostructures
inferredcites →https://doi.org/10.1016/j.mee.2004.07.041openalex-snapshot
Influence of the electron mean free path on the resistivity of thin metal films
inferredcites →https://doi.org/10.1016/j.mejo.2005.02.068openalex-snapshot
Morphology and electrical resistivity of metallic nanostructures
inferredcites →https://doi.org/10.1016/j.mspro.2015.11.016openalex-snapshot
An Investigation of Eddy Current, Solid Loss, Induced Voltage and Magnetic Torque in Highly Pure Thin Conductors, Using Finite Element Method
inferredcites →https://doi.org/10.1016/j.ndteint.2013.09.007openalex-snapshot
Improvement of sensitivity of eddy current sensors for nano-scale thickness measurement of Cu films
inferredcites →https://doi.org/10.1016/j.physa.2013.03.007openalex-snapshot
Influence of surface roughness on the electrical conductivity of semiconducting thin films
inferredcites →https://doi.org/10.1016/j.scitotenv.2003.10.039openalex-snapshot
A multidimensional environmental evaluation of packaging materials
inferredcites →https://doi.org/10.1016/j.sna.2015.07.003openalex-snapshot
Transient eddy current oscillations method for the inspection of thickness change in stainless steel
inferredcites →https://doi.org/10.1016/j.tsf.2006.07.024openalex-snapshot
Surface and grain boundary contributions in the electrical resistivity of metallic nanofilms
inferredcites →https://doi.org/10.1016/j.tsf.2007.06.169openalex-snapshot
Impedance spectroscopy characterisation of PEO process and coatings on aluminium
inferredcites →https://doi.org/10.1016/j.tsf.2010.12.171openalex-snapshot
Atomic layer deposition on polymer based flexible packaging materials: Growth characteristics and diffusion barrier properties
inferredcites →https://doi.org/10.1016/j.tsf.2014.04.070openalex-snapshot
Thin film thickness measurement by the conductivity theory in the framework of Born approximation
inferredcites →https://doi.org/10.1016/s0026-0576(01)85301-0openalex-snapshot
Physical vapor deposition (PVD) processes
inferredcites →https://doi.org/10.1016/s0040-6090(00)01818-6openalex-snapshot
Thickness dependent electrical resistivity of ultrathin (<40 nm) Cu films
inferredcites →https://doi.org/10.1016/s0040-6090(02)00117-7openalex-snapshot
Atomic layer deposition (ALD): from precursors to thin film structures
inferredcites →https://doi.org/10.1016/s0169-4332(03)00522-1openalex-snapshot
Thickness dependence of resistivity for Cu films deposited by ion beam deposition
inferredcites →https://doi.org/10.1016/s0376-7388(02)00178-3openalex-snapshot
Gas permeation in silicon-oxide/polymer (SiOx/PET) barrier films: role of the oxide lattice, nano-defects and macro-defects
inferredcites →https://doi.org/10.1017/s0305004100019952openalex-snapshot
The conductivity of thin metallic films according to the electron theory of metals
inferredcites →https://doi.org/10.1021/j150575a017openalex-snapshot
Theory of Permeation through Metal Coated Polymer Films
inferredcites →https://doi.org/10.1023/a:1008701903087openalex-snapshot
Physical Properties of Sol-Gel Coatings
inferredcites →https://doi.org/10.1051/epjap/2010102openalex-snapshot
Ultra high barrier materials for encapsulation of flexible organic electronics
inferredcites →https://doi.org/10.1051/jp3:1994198openalex-snapshot
Fundamentals of sol-gel dip-coating
inferredcites →https://doi.org/10.1051/jphysrad:01950001107039400openalex-snapshot
On the structure and properties of some metal and metal oxide films
inferredcites →https://doi.org/10.1063/1.103950openalex-snapshot
Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope
inferredcites →https://doi.org/10.1063/1.1134301openalex-snapshot
Eddy-current method for measuring the electrical conductivity of metals
inferredcites →https://doi.org/10.1063/1.1143749openalex-snapshot
Thickness and conductivity of metallic layers from eddy current measurements
inferredcites →https://doi.org/10.1063/1.1652680openalex-snapshot
ELECTRICAL RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS: THE CASE OF SPECULAR REFLECTION AT EXTERNAL SURFACES
inferredcites →https://doi.org/10.1063/1.1656680openalex-snapshot
Analytical Solutions to Eddy-Current Probe-Coil Problems
inferredcites →https://doi.org/10.1063/1.1709746openalex-snapshot
Statistical Model for the Size Effect in Electrical Conduction
inferredcites →https://doi.org/10.1063/1.354227openalex-snapshot
Effect of local flaws in polymeric permeation reducing barriers
inferredcites →https://doi.org/10.1080/00018735200101151openalex-snapshot
The mean free path of electrons in metals
inferredcites →https://doi.org/10.1080/14786436608212607openalex-snapshot
An experimental determination of electrical resistivity of dislocations in aluminium
inferredcites →https://doi.org/10.1080/14786437308227562openalex-snapshot
Optical and photoelectric properties and colour centres in thin films of tungsten oxide
inferredcites →https://doi.org/10.1088/0034-4885/23/1/301openalex-snapshot
Optical properties of thin films
inferredcites →https://doi.org/10.1088/0370-1301/65/1/309openalex-snapshot
Optical Properties of Tellurium in the Infra-Red
inferredcites →https://doi.org/10.1088/0508-3443/8/1/310openalex-snapshot
The measurement of the thickness of thin carbon films
inferredcites →https://doi.org/10.1088/0508-3443/8/9/308openalex-snapshot
The optical density and thickness of evaporated carbon films
inferredcites →https://doi.org/10.1088/0957-4484/26/7/075704openalex-snapshot
Effects of nanoscale surface roughness on the resistivity of ultrathin epitaxial copper films
inferredcites →https://doi.org/10.1093/acprof:oso/9780199570454.001.0001openalex-snapshot
Atomic Force Microscopy
inferredcites →https://doi.org/10.1103/physrevb.1.1382openalex-snapshot
Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces
inferredcites →https://doi.org/10.1103/physrevb.30.647openalex-snapshot
Electrical resistivity of metallic thin films with rough surfaces
inferredcites →https://doi.org/10.1103/physrevb.6.4370openalex-snapshot
Optical Constants of the Noble Metals
inferredcites →https://doi.org/10.1103/physrevb.61.11109openalex-snapshot
Electrical conductivity and thin-film growth dynamics
inferredcites →https://doi.org/10.1103/physrevb.66.205401openalex-snapshot
Surface-induced resistivity of thin metallic films bounded by a rough fractal surface
inferredcites →https://doi.org/10.1103/physrevb.79.155406openalex-snapshot
Resistivity of thin Cu films with surface roughness
inferredcites →https://doi.org/10.1116/1.1315731openalex-snapshot
Resistivity and Structure of Evaporated Aluminum Films
inferredcites →https://doi.org/10.1117/12.935508openalex-snapshot
Thickness Measurement, Rate Control And Automation In Thin Film Coating Technology
inferredcites →https://doi.org/10.1143/jjap.9.1326openalex-snapshot
Resistivity and Temperature Coefficient of Thin Metal Films with Rough Surface
inferredcites →https://doi.org/10.1179/imr.1982.27.1.209openalex-snapshot
Structure and growth of thin films
inferredcites →https://doi.org/10.1201/9780367801113openalex-snapshot
The Physical Properties of Thin Metal Films
inferredcites →https://doi.org/10.1364/josa.44.000357openalex-snapshot
The Optical Constants of Silver, Gold, Copper, and Aluminum I The Absorption Coefficient k
inferredcites →https://doi.org/10.1364/josa.51.000719openalex-snapshot
Optical Constants and Reflectance and Transmittance of Evaporated Aluminum in the Visible and Ultraviolet*
inferredcites →https://doi.org/10.1364/oe.15.010744openalex-snapshot
Refractive index and extinction coefficient dependence of thin Al and Ir films on deposition technique and thickness
inferredcites →https://doi.org/10.2478/s11534-009-0056-2openalex-snapshot
Multilayer coatings for flexible high-barrier materials
inferredcites →https://doi.org/10.3139/217.920327openalex-snapshot
Effect of Biaxial Stretching on Thickness Uniformity and Surface Roughness of PET and PPS Films
inferredcites →https://doi.org/10.3233/978-1-60750-750-5-330openalex-snapshot
In-Line Thin Film Characterization Using Eddy Current Techniques
inferredcites →https://doi.org/10.3390/nano6080150openalex-snapshot
Recent Prospects in the Inline Monitoring of Nanocomposites and Nanocoatings by Optical Technologies
inferredcites →https://doi.org/10.3390/s110302525openalex-snapshot
Non-Destructive Techniques Based on Eddy Current Testing
inferredcites →https://doi.org/10.6028/jres.067a.040openalex-snapshot
Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometry
What points at this work
Incoming claims: where this work appears in other papers’ reference lists and arguments.
inferred← citeshttps://doi.org/10.2139/ssrn.4508031openalex-extracted
Unveiling the Impact of Surface Deformation and Ph on the Surface Reaction of Pvd Aluminum in Basic Solutions
inferred← citeshttps://doi.org/10.1002/pts.2626openalex-snapshot
Understanding barrier degradation during water vapour transmission rate testing of high barrier metallized paper
inferred← citeshttps://doi.org/10.1007/s10854-024-12219-xopenalex-snapshot
Low emissivity thin film coating on glass fiber reinforced plastic used for cryogenic application
inferred← citeshttps://doi.org/10.1007/s11665-026-14941-5openalex-snapshot
Microstructural, Mechanical, and Corrosion Behavior of Al-TiO2 Composite Coatings Deposited via Different Thermal Spray Routes
inferred← citeshttps://doi.org/10.1007/s41871-024-00228-7openalex-snapshot
Sensitivity Improvements for Picosecond Ultrasonic Thickness Measurements in Gold and Tungsten Nanoscale Films
inferred← citeshttps://doi.org/10.1016/b978-0-323-91593-9.00016-xopenalex-snapshot
Textiles for heat generation
inferred← citeshttps://doi.org/10.1016/b978-0-323-99531-3.00005-8openalex-snapshot
Growth and requirements of barrier materials in packaging
inferred← citeshttps://doi.org/10.1016/b978-0-443-34158-8.00130-4openalex-snapshot
Vacuum Metallization of Paper for Improving Moisture Barrier
inferred← citeshttps://doi.org/10.1016/j.apsusc.2022.153363openalex-snapshot
Bond formation at polycarbonate | X interfaces (X = Ti, Al, TiAl) probed by X-ray photoelectron spectroscopy and density functional theory molecular dynamics simulations
inferred← citeshttps://doi.org/10.1016/j.cjph.2018.05.028openalex-snapshot
Theoretical study of the normal-incidence reflective spectra for determining the thickness and refractive index of dielectric film
inferred← citeshttps://doi.org/10.1016/j.fpsl.2020.100513openalex-snapshot
Effectiveness of PECVD deposited nano-silicon oxide protective layer for polylactic acid film: Barrier and surface properties
inferred← citeshttps://doi.org/10.1016/j.fpsl.2025.101540openalex-snapshot
Characterizing direct vacuum metallized paper substrates for improving moisture barrier performance with paper packaging
inferred← citeshttps://doi.org/10.1016/j.ijadhadh.2026.104386openalex-snapshot
Surface engineering and coating strategies for biaxially oriented polypropylene (BOPP) films: performance, processability, and environmental trade-offs
inferred← citeshttps://doi.org/10.1016/j.jspr.2026.103020openalex-snapshot
Phytoextract-based edible coatings for protein-rich perishables: Mechanistic insights and application strategies for sustainable preservation
inferred← citeshttps://doi.org/10.1016/j.physb.2021.413348openalex-snapshot
Impact of TiO2/Graphene-Oxide coated on quartz crystal resonator on the sensing performance of NH3, N2 and ethanol at room temperature
inferred← citeshttps://doi.org/10.1016/j.tsf.2018.09.032openalex-snapshot
Comparison of thickness determination methods for physical-vapor-deposited aluminum coatings in packaging applications
inferred← citeshttps://doi.org/10.1021/acs.analchem.8b01118openalex-snapshot
Controlled Deposition Number of Organic Molecules Using Quartz Crystal Microbalance Evaluated by Scanning Tunneling Microscopy Single-Molecule-Counting
inferred← citeshttps://doi.org/10.1039/d4ra07985jopenalex-snapshot
Intermolecular interaction of Al 8 O 12 oxymetallic clusters in the detection of atmospheric pollutants: a DFT exploration of CO, CO 2 , H 2 , N 2 , NO, NO 2 , O 2 , and SO 2 , binding mechanisms
inferred← citeshttps://doi.org/10.1063/5.0295260openalex-snapshot
Functional laser-induced damage threshold of aluminum coating deposited by magnetron sputtering with different power supply modes
inferred← citeshttps://doi.org/10.1177/87560879251376253openalex-snapshot
Functionalization of PLA films with ALD Al 2 O 3 coatings for safe food packaging
inferred← citeshttps://doi.org/10.1515/mt-2022-0251openalex-snapshot
Effect of boric acid addition to seawater on wear and corrosion properties of ultrashort physical vapor deposited Ti layer on a 304 stainless steel
inferred← citeshttps://doi.org/10.24247/ijmperdjun2020660openalex-snapshot
Evaluation of Physicochemical Properties of Guar Gum- Antioxidants Emulsion Coatings
inferred← citeshttps://doi.org/10.3390/app10217861openalex-snapshot
Preparation and Characterization of a Selective Polymer-Based Solar Absorber for Building Integration
inferred← citeshttps://doi.org/10.3390/app8122424openalex-snapshot
Four-Probe Bridges for In-Line Determination of Thickness and Sidewall Etch Angle of Surface Micromachined Thin Films
inferred← citeshttps://doi.org/10.3390/coatings16050556openalex-snapshot
Interfacial Quality Control and Performance Optimization of PET Composite Aluminum Foil via Vacuum Evaporation
inferred← citeshttps://doi.org/10.3390/coatings9010033openalex-snapshot
Hygroexpansion and Surface Roughness Cause Defects and Increase the Electrical Resistivity of Physical Vapor Deposited Aluminum Coatings on Paper
inferred← citeshttps://doi.org/10.3390/coatings9010038openalex-snapshot
Erratum: Lindner, M. and Schmid, M. Thickness Measurement Methods for Physical Vapor Deposited Aluminum Coatings in Packaging Applications: A Review. Coatings 2017, 7, 9
inferred← citeshttps://doi.org/10.3390/coatings9050295openalex-snapshot
Hygroexpansion, Surface Roughness and Porosity Affect the Electrical Resistance of EVOH-Aluminum- Coated Paper
inferred← citeshttps://doi.org/10.3390/coatings9070425openalex-snapshot
Industrial X-ray Fluorescence Analyzer for Real-Time Thickness Measurements of Aluminium Coatings on Rolled Steel
inferred← citeshttps://doi.org/10.3390/ma16144919openalex-snapshot
PVD for Decorative Applications: A Review
inferred← citeshttps://doi.org/10.3390/s18103541openalex-snapshot
Significance Testing and Multivariate Analysis of Datasets from Surface Plasmon Resonance and Surface Acoustic Wave Biosensors: Prediction and Assay Validation for Surface Binding of Large Analytes
inferred← citeshttps://doi.org/10.5937/tekstind2503013mopenalex-snapshot
Aluminium materials and applications for functional textile products
inferred← citeshttps://doi.org/10.70675/bd78bc8az6feaz4928z833czdea5ec9040c0openalex-snapshot
Structural and thermal characterization of AIN thin films and their integration in laser devices
Editorial review for independent work. ICSAC — the Institute for Complexity
Science and Advanced Computing — runs a structured editorial panel for researchers
publishing outside journals, and publishes on CiteStamp rails. Submission is free
and goes through ORCID: icsacinstitute.org/submit.