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New automatic polariscope system
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What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
inferredcites →https://doi.org/10.1007/bf02320790openalex-snapshot
On the accuracy of goniometric compensation methods in photoelastic fringe-order measurements
inferredcites →https://doi.org/10.1007/bf02325160openalex-snapshot
An automated process for three-dimensional photoelastic analysis
inferredcites →https://doi.org/10.1007/bf02326009openalex-snapshot
New oblique-incidence method for direct photoelastic measurement of principal strains
inferredcites →https://doi.org/10.1007/bf02326106openalex-snapshot
Obtaining stress maps from photoelastic data using a digital computer
inferredcites →https://doi.org/10.1007/bf02326561openalex-snapshot
On dispersion of birefringence of photoelastic materials
inferredcites →https://doi.org/10.1007/bf02327426openalex-snapshot
A method for determining integral fringe orders in photoelastic analysis
inferredcites →https://doi.org/10.1007/bf02328821openalex-snapshot
Photoelasto-plastic analysis of notched-bar configuration subjected to bending
inferredcites →https://doi.org/10.1016/b978-1-4831-9839-2.50017-1openalex-snapshot
A STUDY OF THE ACCURACY AND LIMITS OF APPLICATION OF PLANE PHOTOPLASTIC EXPERIMENTS**The paper contains the main results of the doctorate thesis of Dipl.-Ing. R. Loreck at the Technische Hochschule, München, Germany.
inferredcites →https://doi.org/10.1063/1.1712945openalex-snapshot
A Rational Approach to the Numerical Solution of Laplace's Equation (The Four-Point Influence Method)
inferredcites →https://doi.org/10.1088/0508-3443/15/5/315openalex-snapshot
New scattered light method in three-dimensional photoelasticity
What points at this work
Incoming claims: where this work appears in other papers’ reference lists and arguments.
inferred← citeshttps://doi.org/10.1002/zamm.201200045openalex-snapshot
Photoelastic‐numerical treatment of Beltrami‐Michell boundary value problems
inferred← citeshttps://doi.org/10.1007/978-3-642-59723-7_5openalex-snapshot
Phase Shifting, Polarization Stepping and Fourier Transform Methods
inferred← citeshttps://doi.org/10.1007/978-94-009-0779-9_50openalex-snapshot
Whole-Field Measurement Of Principal Stress Directions From Photoelastic Experiment Using Image Processing System
inferred← citeshttps://doi.org/10.1007/978-94-009-0779-9_51openalex-snapshot
The Benefits and Pitfalls of Automatic Processing For Photoelastic Test Data
inferred← citeshttps://doi.org/10.1007/bf01524653openalex-snapshot
An automated system of treating experimental data obtained by the photoelastic method
inferred← citeshttps://doi.org/10.1007/bf02317412openalex-snapshot
Digital determination of photoelastic birefringence using two wavelengths
inferred← citeshttps://doi.org/10.1007/bf02317980openalex-snapshot
Computerized image processing for whole-field determination of isoclinics and isochromatics
inferred← citeshttps://doi.org/10.1007/bf02319257openalex-snapshot
Half-fringe photoelasticity: A new approach to whole-field stress analysis
inferred← citeshttps://doi.org/10.1007/bf02319365openalex-snapshot
Photoelastic analysis of frozen stressed specimens using spectral-contents analysis
inferred← citeshttps://doi.org/10.1007/bf02321150openalex-snapshot
New compensation method in photoelasticity
inferred← citeshttps://doi.org/10.1007/bf02321403openalex-snapshot
Automated measurement of birefringence: Development and experimental evaluation of the techniques
inferred← citeshttps://doi.org/10.1007/bf02325991openalex-snapshot
A fully automatic stress-analysis system by using electro-optic modulation
inferred← citeshttps://doi.org/10.1007/bf02326645openalex-snapshot
Rotary birefringent and quarter-wave plates applied to photoelasticimetry
inferred← citeshttps://doi.org/10.1007/bf02328653openalex-snapshot
Complete automatic analysis of photoelastic fringes
inferred← citeshttps://doi.org/10.1007/bf02328805openalex-snapshot
Photoelastic measurements by means of computer-assisted spectral-contents analysis
inferred← citeshttps://doi.org/10.1007/bf02329272openalex-snapshot
Compensation method using synchronized polarizer—Analyzer rotation
inferred← citeshttps://doi.org/10.1007/bf02432082openalex-snapshot
Photoelectric-computer data processing (PCP) program in experimental photo-stress analysis
inferred← citeshttps://doi.org/10.1016/0143-8166(94)90067-1openalex-snapshot
Completely automated photoelastic fringe analysis
inferred← citeshttps://doi.org/10.1016/0143-8166(95)00099-2openalex-snapshot
New approaches to the full-field analysis of photoelastic stress patterns
inferred← citeshttps://doi.org/10.1016/j.optlaseng.2022.106998openalex-snapshot
Digital full-field photoelasticity of tempered architectural glass: A review
inferred← citeshttps://doi.org/10.1046/j.1475-1305.2003.00073.xopenalex-snapshot
Complete Fringe Order Determination in Digital Photoelasticity using Fringe Combination Matching
inferred← citeshttps://doi.org/10.1088/0150-536x/10/5/001openalex-snapshot
Rotating birefringent and achromatic quarter wave plates. Applications to ellipsometry and photoelasticimetry
inferred← citeshttps://doi.org/10.1088/0957-0233/6/9/001openalex-snapshot
Automatic analysis of isochromatic and isoclinic fringes in photoelasticity using phase measuring techniques
inferred← citeshttps://doi.org/10.1111/j.1475-1305.1979.tb00281.xopenalex-snapshot
Infrared photoelasticity
inferred← citeshttps://doi.org/10.1111/j.1475-1305.1985.tb00562.xopenalex-snapshot
The use of a microdensitometer in photoelastic analyses
inferred← citeshttps://doi.org/10.1111/j.1475-1305.1988.tb00650.xopenalex-snapshot
Automated photoelastic analysis
inferred← citeshttps://doi.org/10.1111/j.1475-1305.1991.tb00752.xopenalex-snapshot
Towards full field automated photoelastic analysis of complex components
inferred← citeshttps://doi.org/10.1111/j.1747-1567.1991.tb01144.xopenalex-snapshot
APPLICATION OF THE GENERALIZED MAXIMUM LIKELIHOOD CRITERION TO EVALUATION OF PARTIAL FRINGE ORDERS IN PHOTOELASTICITY
inferred← citeshttps://doi.org/10.1111/j.1747-1567.2010.00669.xopenalex-snapshot
DATA ACQUISITION TECHNIQUES IN PHOTOELASTICITY
inferred← citeshttps://doi.org/10.1243/03093247v221025openalex-snapshot
A micropolariscope for automatic stress analysis
inferred← citeshttps://doi.org/10.1243/03093247v316423openalex-snapshot
Phase-shifting methodologies in photoelastic analysis—the application of Jones calculus
inferred← citeshttps://doi.org/10.1364/ao.38.005384openalex-snapshot
Direct determination of isochromatic fringe order by use of two wavelengths
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