On the public citation graph

Complete automatic analysis of photoelastic fringes

https://doi.org/10.1007/bf02328653
0 signed · 67 inferred · view as graph

Inferred edges come from two machine sources: sweeps of open repository metadata (mostly SSRN and Zenodo), and a bulk OpenAlex citation snapshot. Every row below is labelled with the one it came from. Neither is a complete citation index — absence here is not evidence of absence.

Is this your work? Sign in with ORCID and put your name on the claims that are yours.
Claim with ORCID
Reference health. See whether every reference in this work resolves to a known work and none has been retracted — and get a dated CiteStamped badge you can embed.
See reference health

What this work says

Outgoing claims: the papers this work cites, builds on, or argues with.

inferredcites →https://doi.org/10.1007/978-3-642-66236-2_9openalex-snapshot
Digital Picture Processing
inferredcites →https://doi.org/10.1007/bf02323149openalex-snapshot
New automatic polariscope system
inferredcites →https://doi.org/10.1007/bf02329272openalex-snapshot
Compensation method using synchronized polarizer—Analyzer rotation
inferredcites →https://doi.org/10.1016/c2009-0-21955-6openalex-snapshot
Digital Picture Processing

What points at this work

Incoming claims: where this work appears in other papers’ reference lists and arguments.

inferred← citeshttps://doi.org/10.1007/3-540-48800-6_6openalex-snapshot
Digital Photoelasticity
inferred← citeshttps://doi.org/10.1007/978-3-642-59723-7_4openalex-snapshot
Fringe Multiplication, Fringe Thinning and Fringe Clustering
inferred← citeshttps://doi.org/10.1007/978-94-009-0779-9_50openalex-snapshot
Whole-Field Measurement Of Principal Stress Directions From Photoelastic Experiment Using Image Processing System
inferred← citeshttps://doi.org/10.1007/978-94-009-0779-9_51openalex-snapshot
The Benefits and Pitfalls of Automatic Processing For Photoelastic Test Data
inferred← citeshttps://doi.org/10.1007/978-94-009-4416-9_32openalex-snapshot
Digital Image Processing in Experimental Mechanics
inferred← citeshttps://doi.org/10.1007/bf01898223openalex-snapshot
General digital picture processing and texture analysis for photoelasticity
inferred← citeshttps://doi.org/10.1007/bf02319257openalex-snapshot
Half-fringe photoelasticity: A new approach to whole-field stress analysis
inferred← citeshttps://doi.org/10.1007/bf02319657openalex-snapshot
Towards RGB photoelasticity: Full-field automated photoelasticity in white light
inferred← citeshttps://doi.org/10.1007/bf02321416openalex-snapshot
Computerized fringe analysis in photomechanics
inferred← citeshttps://doi.org/10.1007/bf02321498openalex-snapshot
Separation of principal stresses by SOR technique over arbitrary boundaries
inferred← citeshttps://doi.org/10.1007/bf02321656openalex-snapshot
Simulation of errors in automated photoelasticity
inferred← citeshttps://doi.org/10.1007/bf02322821openalex-snapshot
Digital image processing and isoclinics
inferred← citeshttps://doi.org/10.1007/bf02324992openalex-snapshot
Deformation measurement during powder compaction by a scanning-moiré method
inferred← citeshttps://doi.org/10.1007/bf02328536openalex-snapshot
Determination of the stress distribution in assemblies of photoelastic particles
inferred← citeshttps://doi.org/10.1007/bf02329803openalex-snapshot
The application of evolutionary and maximum entropy algorithms to photoelastic spectral analysis
inferred← citeshttps://doi.org/10.1007/bf02410247openalex-snapshot
Hybrid stress analysis by digitized photoelastic data and numerical methods
inferred← citeshttps://doi.org/10.1007/bf02411345openalex-snapshot
A Novel Instrument for Transient Photoelasticity
inferred← citeshttps://doi.org/10.1007/bf02463714openalex-snapshot
CCD automated polariscope system and the stress analysis methods
inferred← citeshttps://doi.org/10.1007/bf02463715openalex-snapshot
CCD automated polariscope system and the stress analysis methods
inferred← citeshttps://doi.org/10.1016/0013-7944(89)90209-9openalex-snapshot
Half-fringe photoelastic determination of opening mode stress intensity factor for edge cracked strips
inferred← citeshttps://doi.org/10.1016/0013-7944(90)90399-2openalex-snapshot
A digital imaging algorithm for extracting stress intensity factor from the photoelastic fringe pattern
inferred← citeshttps://doi.org/10.1016/0029-5493(84)90120-1openalex-snapshot
Strain distribution around a crack tip in high temperature environment using picture processing
inferred← citeshttps://doi.org/10.1016/0143-8166(81)90021-xopenalex-snapshot
A review of the scattered-light method in photoelasticity
inferred← citeshttps://doi.org/10.1016/0143-8166(91)90062-xopenalex-snapshot
Adaptive filter for enhancement of fringe patterns
inferred← citeshttps://doi.org/10.1016/0143-8166(93)90014-copenalex-snapshot
Photoelasticity stress analysis using carrier fringe and FFT techniques
inferred← citeshttps://doi.org/10.1016/0143-8166(94)90067-1openalex-snapshot
Completely automated photoelastic fringe analysis
inferred← citeshttps://doi.org/10.1016/0143-8166(95)00099-2openalex-snapshot
New approaches to the full-field analysis of photoelastic stress patterns
inferred← citeshttps://doi.org/10.1016/0263-8223(85)90001-7openalex-snapshot
Stress analysis of adhesive joints in composite structures through half-fringe photoelasticity
inferred← citeshttps://doi.org/10.1016/j.jmbbm.2024.106454openalex-snapshot
Experimental evaluation of corneal stress-optic coefficients using a pair of force test
inferred← citeshttps://doi.org/10.1016/j.prostr.2017.07.147openalex-snapshot
A GTN Failure Analysis of an AA6061-T6 Bi-Failure Specimen
inferred← citeshttps://doi.org/10.1016/s0030-3992(01)00064-0openalex-snapshot
Adaptive filter for unwrapping noisy phase image in phase-stepping interferometry
inferred← citeshttps://doi.org/10.1016/s0143-8166(01)00157-9openalex-snapshot
The influence of the quarter wave plates in automated photoelasticity
inferred← citeshttps://doi.org/10.1016/s0143-8166(96)00060-7openalex-snapshot
On image analysis for Birefringence measurements in photoelasticity
inferred← citeshttps://doi.org/10.1046/j.1475-1305.2003.00055.xopenalex-snapshot
An Arctangent Unwrapping Technique of Photoelasticity Using Linearly Polarized Light at Three Wavelengths
inferred← citeshttps://doi.org/10.1063/1.5024176openalex-snapshot
Advanced image based methods for structural integrity monitoring: Review and prospects
inferred← citeshttps://doi.org/10.1088/0957-0233/6/9/001openalex-snapshot
Automatic analysis of isochromatic and isoclinic fringes in photoelasticity using phase measuring techniques
inferred← citeshttps://doi.org/10.1109/iembs.1995.575178openalex-snapshot
Photoelastic analysis using chromatic interpretation of digitized video
inferred← citeshttps://doi.org/10.1111/j.1475-1305.1985.tb00562.xopenalex-snapshot
The use of a microdensitometer in photoelastic analyses
inferred← citeshttps://doi.org/10.1111/j.1475-1305.1988.tb00650.xopenalex-snapshot
Automated photoelastic analysis
inferred← citeshttps://doi.org/10.1111/j.1475-1305.1991.tb00752.xopenalex-snapshot
Towards full field automated photoelastic analysis of complex components
inferred← citeshttps://doi.org/10.1111/j.1475-1305.2006.00284.xopenalex-snapshot
A Measurement Method for Birefringent Plate using Elliptically Polarized Light
inferred← citeshttps://doi.org/10.1111/j.1475-1305.2008.00432.xopenalex-snapshot
An Edge Detection Algorithm for Photoelasticity Analysis
inferred← citeshttps://doi.org/10.1111/j.1747-1567.1987.tb00625.xopenalex-snapshot
EXTRACTING ISOCLINICS USING IMAGE-PROCESSING TECHNIQUES
inferred← citeshttps://doi.org/10.1111/j.1747-1567.1989.tb01446.xopenalex-snapshot
AUTOMATIC STRESS ANALYSIS OF PHOTOELASTIC EXPERIMENT BY USE OF IMAGE PROCESSING
inferred← citeshttps://doi.org/10.1111/j.1747-1567.1991.tb01144.xopenalex-snapshot
APPLICATION OF THE GENERALIZED MAXIMUM LIKELIHOOD CRITERION TO EVALUATION OF PARTIAL FRINGE ORDERS IN PHOTOELASTICITY
inferred← citeshttps://doi.org/10.1111/j.1747-1567.1991.tb01212.xopenalex-snapshot
DIGITAL IMAGE PROCESSING OF PHOTOELASTIC FRINGES– A NEW APPROACH
inferred← citeshttps://doi.org/10.1111/j.1747-1567.1992.tb01270.xopenalex-snapshot
PHOTOELASTIC DATA ACQUISITION BY THE DIGITIZING TECHNIQUE OVER ARBITRARY BOUNDARIES
inferred← citeshttps://doi.org/10.1111/j.1747-1567.1993.tb00269.xopenalex-snapshot
PHASE SHIFTING IN PHOTOELASTICITY
inferred← citeshttps://doi.org/10.1111/j.1747-1567.1994.tb00299.xopenalex-snapshot
SEPARATION OF ISOCHROMATICS AND ISOCLINICS USING FOURIER TRANSFORM
inferred← citeshttps://doi.org/10.1111/j.1747-1567.2010.00669.xopenalex-snapshot
DATA ACQUISITION TECHNIQUES IN PHOTOELASTICITY
inferred← citeshttps://doi.org/10.1117/12.191333openalex-snapshot
Comparative performance evaluation of various fringe thinning algorithms in photomechanics
inferred← citeshttps://doi.org/10.1146/annurev.fl.20.010188.002225openalex-snapshot
Digital Image Processing in Flow Visualization
inferred← citeshttps://doi.org/10.1243/030932405x16025openalex-snapshot
An overdetermined phase-stepping strategy for the capture of high-quality photoelastic data
inferred← citeshttps://doi.org/10.1243/0309324981512779openalex-snapshot
Simultaneous observation of phase-stepped images for automated photoelasticity
inferred← citeshttps://doi.org/10.1243/0309324981512832openalex-snapshot
A review of automated methods for the collection and analysis of photoelastic data
inferred← citeshttps://doi.org/10.1299/jsmeatem.2003.2._os01w0006openalex-snapshot
OS01W0006 Identification of photoelastic parameters through digital image processing and phase shifting method
inferred← citeshttps://doi.org/10.1364/ao.20.003245openalex-snapshot
Image processing applied to the interactive analysis of interferometric fringes
inferred← citeshttps://doi.org/10.1364/ao.27.003782openalex-snapshot
Spin filtering processes and automatic extraction of fringe centerlines in digitial interferometric patterns
inferred← citeshttps://doi.org/10.1364/ao.28.004323openalex-snapshot
Fringe multiplication methods for digital interferometric fringes
inferred← citeshttps://doi.org/10.1364/ao.39.002043openalex-snapshot
Model for quantifying photoelastic fringe degradation by imperfect retroreflective backings
inferred← citeshttps://doi.org/10.1364/ao.40.000052openalex-snapshot
Full-field automated photoelasticity by Fourier polarimetry with three wavelengths
inferred← citeshttps://doi.org/10.1520/jte12099jopenalex-snapshot
A Novel Instrument for Automated Principal Strain Separation in Reflection Photoelasticity
inferred← citeshttps://doi.org/10.31274/rtd-180813-7926openalex-snapshot
Stress intensity factors for near surface cracks by boundary collocation
Editorial review for independent work. ICSAC — the Institute for Complexity Science and Advanced Computing — runs a structured editorial panel for researchers publishing outside journals, and publishes on CiteStamp rails. Submission is free and goes through ORCID: icsacinstitute.org/submit.