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Review of electrical stimulus methods of in situ transmission electron microscope to study resistive random access memory

https://doi.org/10.1039/d2nr01872a
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What this work says

Outgoing claims: the papers this work cites, builds on, or argues with.

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Radiation damage in the TEM and SEM
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Dynamic Evolution of Conducting Nanofilament in Resistive Switching Memories
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Revealing Controllable Nanowire Transformation through Cationic Exchange for RRAM Application
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inferredcites →https://doi.org/10.1103/physrevb.70.165313openalex-snapshot
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inferredcites →https://doi.org/10.1109/ted.2008.2010583openalex-snapshot
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inferredcites →https://doi.org/10.1109/ted.2012.2202320openalex-snapshot
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What points at this work

Incoming claims: where this work appears in other papers’ reference lists and arguments.

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inferred← citeshttps://doi.org/10.1039/d4qi02179gopenalex-snapshot
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inferred← citeshttps://doi.org/10.1039/d5ma00337gopenalex-snapshot
Advances in resistive switching memory: comprehensive insights into ECM mechanisms through TEM observations and analysis
inferred← citeshttps://doi.org/10.1093/mam/ozae044.781openalex-snapshot
Towards Atomic-Scale Investigation of Resistive Switching in Memristive Systems via MEMS-based In Situ Electron Microscopy
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