On the public citation graph
Micro-Raman thermometry in the presence of complex stresses in GaN devices
0 signed · 118 inferred · view as graph
Inferred edges come from two machine sources: sweeps of open repository metadata (mostly SSRN and Zenodo), and a bulk OpenAlex citation snapshot. Every row below is labelled with the one it came from. Neither is a complete citation index — absence here is not evidence of absence.
Is this your work? Sign in with ORCID and put your name on the
claims that are yours.
Reference health. See whether every reference in this work resolves to a
known work and none has been retracted — and get a dated CiteStamped
badge you can embed.
What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
inferredcites →https://doi.org/10.1002/1521-396x(200111)188:1<203::aid-pssa203>3.0.co;2-copenalex-snapshot
Reliability Evaluation of High Power AlGaN/GaN HEMTs on SiC Substrate
inferredcites →https://doi.org/10.1002/jrs.1027openalex-snapshot
Effect of pressure and temperature on Raman spectra of solids: anharmonicity
inferredcites →https://doi.org/10.1002/mmce.20015openalex-snapshot
Reliability of capacitive RF MEMS switches at high and low temperatures
inferredcites →https://doi.org/10.1002/pssc.200303466openalex-snapshot
Thermal analysis and design of GaN‐based LEDs for high power applications
inferredcites →https://doi.org/10.1002/pssc.200390116openalex-snapshot
Temperature Distributions in AlGaN/GaN HEMTs Measured by Micro‐Raman Scattering Spectroscopy
inferredcites →https://doi.org/10.1016/0169-4332(91)90141-6openalex-snapshot
Micro-Raman spectroscopy for characterization of semiconductor devices
inferredcites →https://doi.org/10.1016/j.microrel.2006.02.009openalex-snapshot
Reliability of large periphery GaN-on-Si HFETs
inferredcites →https://doi.org/10.1016/j.sse.2005.11.009openalex-snapshot
Effective temperature measurements of AlGaN/GaN-based HEMT under various load lines using micro-Raman technique
inferredcites →https://doi.org/10.1016/s0038-1098(03)00629-xopenalex-snapshot
Thermal conductivity of GaN crystals in 4.2–300 K range
inferredcites →https://doi.org/10.1016/s0167-577x(01)00330-5openalex-snapshot
Thermal conductivity of W–Cu composites at various temperatures
inferredcites →https://doi.org/10.1016/s0961-1290(06)71818-xopenalex-snapshot
Considerations for GaN-powered base stations
inferredcites →https://doi.org/10.1016/s1369-7021(07)70138-4openalex-snapshot
Physical Properties of Crystals
inferredcites →https://doi.org/10.1051/epjap:2005025openalex-snapshot
Temperature measurement in AlGaN/GaN High-Electron-Mobility Transistors using micro-Raman scattering spectroscopy
inferredcites →https://doi.org/10.1063/1.1482796openalex-snapshot
First-principles calculation of the piezoelectric tensor d⇊ of III–V nitrides
inferredcites →https://doi.org/10.1063/1.1654671openalex-snapshot
Raman scattering in thin-film waveguides
inferredcites →https://doi.org/10.1063/1.1793338openalex-snapshot
Phonon deformation potentials of the E2(high) phonon mode of AlxGa1−xN
inferredcites →https://doi.org/10.1063/1.1896619openalex-snapshot
A practical extension of the 3ω method to multilayer structures
inferredcites →https://doi.org/10.1063/1.1906305openalex-snapshot
Self-heating study of an AlGaN∕GaN-based heterostructure field-effect transistor using ultraviolet micro-Raman scattering
inferredcites →https://doi.org/10.1063/1.2041823openalex-snapshot
Thermal mapping of defects in AlGaN∕GaN heterostructure field-effect transistors using micro-Raman spectroscopy
inferredcites →https://doi.org/10.1063/1.2182011openalex-snapshot
Piezoelectric strain in AlGaN∕GaN heterostructure field-effect transistors under bias
inferredcites →https://doi.org/10.1063/1.2395681openalex-snapshot
Self-heating in a GaN based heterostructure field effect transistor: Ultraviolet and visible Raman measurements and simulations
inferredcites →https://doi.org/10.1063/1.2561930openalex-snapshot
Decay of zone-center phonons in GaN with A1, E1, and E2 symmetries
inferredcites →https://doi.org/10.1063/1.2738946openalex-snapshot
Invited Article: Simultaneous mapping of temperature and stress in microdevices using micro-Raman spectroscopy
inferredcites →https://doi.org/10.1068/htec142openalex-snapshot
Determination of the thermal diffusivity and conductivity of monocrystalline silicon carbide (300-2300 K)
inferredcites →https://doi.org/10.1109/55.784448openalex-snapshot
Evaluation of the temperature stability of AlGaN/GaN heterostructure FETs
inferredcites →https://doi.org/10.1109/55.974795openalex-snapshot
Measurement of temperature in active high-power AlGaN/GaN HFETs using Raman spectroscopy
inferredcites →https://doi.org/10.1115/1.2409996openalex-snapshot
Raman Thermometry of Polysilicon Microelectro-mechanical Systems in the Presence of an Evolving Stress
inferredcites →https://doi.org/10.1143/jjap.41.l452openalex-snapshot
Temperature Distribution Measurement in AlGaN/GaN High-Electron-Mobility Transistors by Micro-Raman Scattering Spectroscopy
inferredcites →https://doi.org/10.1149/1.2103527openalex-snapshot
The Effect of Thermally Induced Stress on Device Temperature Measurements by Raman Spectroscopy
inferredcites →https://doi.org/10.1149/1.2357206openalex-snapshot
Performance, Reliability, and Manufacturability of AlGaN/GaN High Electron Mobility Transistors on Silicon Carbide Substrates
inferredcites →https://doi.org/10.1366/0003702963905321openalex-snapshot
Theoretical and Experimental Uncertainty in Temperature Measurement of Materials by Raman Spectroscopy
What points at this work
Incoming claims: where this work appears in other papers’ reference lists and arguments.
inferred← citeshttps://doi.org/10.2139/ssrn.4611512openalex-extracted
Assessment of Thermo-Mechanical Phenomena in Si-Based Diodes Via Operando Confocal Raman Microscopy
inferred← citeshttps://doi.org/10.2139/ssrn.4612278openalex-extracted
Assessment of Thermo-Mechanical Phenomena in Si-Based Diodes Via Operando Confocal Raman Microscopy
inferred← citeshttps://doi.org/10.1002/aelm.202201330openalex-snapshot
Thermometry of AlGaN/GaN 2D Channels at High Electric Fields Using Electrical and Optical Methods
inferred← citeshttps://doi.org/10.1002/jrs.5860openalex-snapshot
Temperature dependence of strain–phonon coefficient in epitaxial Ge/Si(001): A comprehensive analysis
inferred← citeshttps://doi.org/10.1002/lpor.202100301openalex-snapshot
Going Above and Beyond: A Tenfold Gain in the Performance of Luminescence Thermometers Joining Multiparametric Sensing and Multiple Regression
inferred← citeshttps://doi.org/10.1007/978-1-4614-4337-7_13openalex-snapshot
Reliability Issues in AlGaN/GaN High Electron Mobility Transistors
inferred← citeshttps://doi.org/10.1007/978-1-4614-4337-7_17openalex-snapshot
The Analysis of Wide Band Gap Semiconductors Using Raman Spectroscopy
inferred← citeshttps://doi.org/10.1007/978-3-642-23351-7_9openalex-snapshot
Raman Spectroscopy of Compound Semiconductors
inferred← citeshttps://doi.org/10.1007/s11664-010-1304-3openalex-snapshot
In Situ Raman Analysis of a Bulk GaN-Based Schottky Rectifier Under Operation
inferred← citeshttps://doi.org/10.1007/s40042-022-00526-7openalex-snapshot
Optical thermometry of anisotropic semimetal of WTe2 using polarization-sensitive microscopy
inferred← citeshttps://doi.org/10.1016/j.ijheatmasstransfer.2017.03.082openalex-snapshot
Energy coupling across low-dimensional contact interfaces at the atomic scale
inferred← citeshttps://doi.org/10.1016/j.ijheatmasstransfer.2023.124555openalex-snapshot
A two-step in situ measurement method for temperature and thermal stress of power device based on a single Raman peak
inferred← citeshttps://doi.org/10.1016/j.measurement.2024.114425openalex-snapshot
Assessment of thermo-mechanical phenomena in Si-based diodes via operando confocal Raman microscopy
inferred← citeshttps://doi.org/10.1016/j.microrel.2011.09.018openalex-snapshot
Investigation of the effect of temperature during off-state degradation of AlGaN/GaN High Electron Mobility Transistors
inferred← citeshttps://doi.org/10.1016/j.microrel.2013.03.004openalex-snapshot
Electrical and structural dependence of operating temperature of AlGaN/GaN HEMTs
inferred← citeshttps://doi.org/10.1016/j.omx.2024.100320openalex-snapshot
Eu3+-doped manganese tungstate for multiparametric and colorimetric luminescence thermometry
inferred← citeshttps://doi.org/10.1016/j.spmi.2018.01.021openalex-snapshot
Raman analysis of phonon modes in a short period AlN/GaN superlattice
inferred← citeshttps://doi.org/10.1017/s1759078718000582openalex-snapshot
Transfer of AlGaN/GaN RF-devices onto diamond substrates via van der Waals bonding
inferred← citeshttps://doi.org/10.1021/acs.nanolett.5c05421openalex-snapshot
Monolayer MoS 2 Sensors for Probing the Self-Heating Effect in Indium Tin Oxide Nanoelectronics
inferred← citeshttps://doi.org/10.1021/acsaelm.0c00574openalex-snapshot
2D Materials for Universal Thermal Imaging of Micro- and Nanodevices: An Application to Gallium Oxide Electronics
inferred← citeshttps://doi.org/10.1021/acsaelm.5c00861openalex-snapshot
Selective Thermal Mapping of Wide and Ultrawide Band Gap Semiconductor Devices Using Mechanically Exfoliated MoS2 Flakes
inferred← citeshttps://doi.org/10.1021/acsami.1c02912openalex-snapshot
Thermal Conductivity of Aluminum Scandium Nitride for 5G Mobile Applications and Beyond
inferred← citeshttps://doi.org/10.1038/s41598-025-01878-3openalex-snapshot
Taphonomic bias of hydrothermal silicification in biodiversity patterns of Cambrian shelly pavements from the Iberian Chains, NE Spain
inferred← citeshttps://doi.org/10.1063/1.3267157openalex-snapshot
Assessment of stress contributions in GaN high electron mobility transistors of differing substrates using Raman spectroscopy
inferred← citeshttps://doi.org/10.1063/1.3267496openalex-snapshot
Predictions of thermal boundary conductance for systems of disordered solids and interfaces
inferred← citeshttps://doi.org/10.1063/1.3698492openalex-snapshot
Fully coupled thermoelectromechanical analysis of GaN high electron mobility transistor degradation
inferred← citeshttps://doi.org/10.1063/1.4918623openalex-snapshot
Invited Review Article: Error and uncertainty in Raman thermal conductivity measurements
inferred← citeshttps://doi.org/10.1063/1.4954203openalex-snapshot
Contributed Review: Experimental characterization of inverse piezoelectric strain in GaN HEMTs via micro-Raman spectroscopy
inferred← citeshttps://doi.org/10.1063/1.4962010openalex-snapshot
Size dictated thermal conductivity of GaN
inferred← citeshttps://doi.org/10.1063/1.4964689openalex-snapshot
Electric field dependence of optical phonon frequencies in wurtzite GaN observed in GaN high electron mobility transistors
inferred← citeshttps://doi.org/10.1063/1.5010225openalex-snapshot
Simultaneous measurement of temperature, stress, and electric field in GaN HEMTs with micro-Raman spectroscopy
inferred← citeshttps://doi.org/10.1063/1.5115013openalex-snapshot
Multidimensional thermal analysis of an ultrawide bandgap AlGaN channel high electron mobility transistor
inferred← citeshttps://doi.org/10.1063/1.5123726openalex-snapshot
Nanoscale electro-thermal interactions in AlGaN/GaN high electron mobility transistors
inferred← citeshttps://doi.org/10.1063/5.0029582openalex-snapshot
Local measurements of domain wall-induced self-heating in released PbZr0.52Ti0.48O3 films
inferred← citeshttps://doi.org/10.1063/5.0056271openalex-snapshot
A perspective on the electro-thermal co-design of ultra-wide bandgap lateral devices
inferred← citeshttps://doi.org/10.1063/5.0164095openalex-snapshot
Thermal analysis of an α -Ga2O3 MOSFET using micro-Raman spectroscopy
inferred← citeshttps://doi.org/10.1063/5.0169886openalex-snapshot
Reducing proton radiation vulnerability in AlGaN/GaN high electron mobility transistors with residual strain relief
inferred← citeshttps://doi.org/10.1063/5.0204385openalex-snapshot
Substrate dependence of the self-heating in lead zirconate titanate (PZT) MEMS actuators
inferred← citeshttps://doi.org/10.1063/5.0260877openalex-snapshot
Characterization of hotspot formation in AlGaN/GaN HEMTs by probing Raman scattering through an optically transparent gate
inferred← citeshttps://doi.org/10.1063/5.0354327openalex-snapshot
Correlating biaxial stress to metastable phases in Hf0.5Zr0.5O2 on substrates with different coefficients of thermal expansion
inferred← citeshttps://doi.org/10.1080/15567265.2021.1912865openalex-snapshot
Temperature and Strain Effects in Micro-Raman Thermometry for Measuring In-Plane Thermal Conductivity of Thin Films
inferred← citeshttps://doi.org/10.1088/0268-1242/28/7/074019openalex-snapshot
Reliability studies of AlGaN/GaN high electron mobility transistors
inferred← citeshttps://doi.org/10.1088/1361-6528/28/6/065703openalex-snapshot
On the origins of anomalous elastic moduli and failure strains of GaP nanowires
inferred← citeshttps://doi.org/10.1103/fh33-jjpqopenalex-snapshot
Thermal analysis of GaN-based photonic membranes for optoelectronics
inferred← citeshttps://doi.org/10.1103/physrevapplied.10.034049openalex-snapshot
In Operando Micro-Raman Three-Dimensional Thermometry with Diffraction-Limit Spatial Resolution for GaN -based Light-Emitting Diodes
inferred← citeshttps://doi.org/10.1103/physrevapplied.15.024018openalex-snapshot
Interaction Between a Low-Temperature Plasma and Graphene: An in situ Raman Thermometry Study
inferred← citeshttps://doi.org/10.1103/physrevapplied.9.014005openalex-snapshot
Thermometry of Silicon Nanoparticles
inferred← citeshttps://doi.org/10.1103/physrevb.108.235313openalex-snapshot
Optical and thermal characterization of a group-III nitride semiconductor membrane by microphotoluminescence spectroscopy and Raman thermometry
inferred← citeshttps://doi.org/10.1103/tmw1-74jpopenalex-snapshot
Noncontact thermometry based on direct electron detection of electron-backscattering diffraction patterns
inferred← citeshttps://doi.org/10.1109/itherm.2014.6892416openalex-snapshot
Analysis and characterization of thermal transport in GaN HEMTs on Diamond substrates
inferred← citeshttps://doi.org/10.1109/itherm.2017.7992488openalex-snapshot
Integrated temperature mapping of lateral gallium nitride electronics
inferred← citeshttps://doi.org/10.1109/itherm55368.2023.10177607openalex-snapshot
Thermal Characterization of a Silicon Wafer Utilizing a Non-Fourier Heat Transport Equation and Micro-Raman Spectroscopy
inferred← citeshttps://doi.org/10.1109/itherm55376.2025.11235628openalex-snapshot
Analysis of the Thermal Resistance Network of Packaged GaN HEMTs
inferred← citeshttps://doi.org/10.1109/led.2025.3548853openalex-snapshot
Thermal Characterization and Design of AlN/GaN/AlN HEMTs on Foreign Substrates
inferred← citeshttps://doi.org/10.1109/stherm.2012.6188846openalex-snapshot
Thermoreflectance CCD imaging of self heating in AlGaN/GaN high electron mobility power transistors at high drain voltage
inferred← citeshttps://doi.org/10.1109/tcpmt.2017.2773065openalex-snapshot
Theory of Thermal Time Constants in GaN High-Electron-Mobility Transistors
inferred← citeshttps://doi.org/10.1109/tcpmt.2018.2867788openalex-snapshot
Embedded Microjets for Thermal Management of High Power-Density Electronic Devices
inferred← citeshttps://doi.org/10.1109/ted.2012.2224115openalex-snapshot
The Impact of Bias Conditions on Self-Heating in AlGaN/GaN HEMTs
inferred← citeshttps://doi.org/10.1109/ted.2013.2255102openalex-snapshot
Thermometry of AlGaN/GaN HEMTs Using Multispectral Raman Features
inferred← citeshttps://doi.org/10.1109/ted.2015.2510610openalex-snapshot
Measurement of Temperature in GaN HEMTs by Gate End-to-End Resistance
inferred← citeshttps://doi.org/10.1109/ted.2018.2868807openalex-snapshot
Accurate Measurement of Channel Temperature for AlGaN/GaN HEMTs
inferred← citeshttps://doi.org/10.1109/ted.2019.2935335openalex-snapshot
Measurement of Self-Heating Temperature in AlGaN/GaN HEMTs by Using Cerium Oxide Micro-Raman Thermometers
inferred← citeshttps://doi.org/10.1109/ted.2024.3508656openalex-snapshot
A Comparative Analysis of Electrical and Optical Thermometry Techniques for AlGaN/GaN HEMTs
inferred← citeshttps://doi.org/10.1109/ted.2026.3667665openalex-snapshot
Optimization Factors for the Thermal Design of Packaged GaN High-Electron-Mobility Transistors
inferred← citeshttps://doi.org/10.1109/tim.2023.3251405openalex-snapshot
2-D Photo-Thermal Distribution and Structures of Flip-Chip Mini Light-Emitting Diodes by Microscopic Hyperspectral Imaging
inferred← citeshttps://doi.org/10.1109/tmag.2015.2438298openalex-snapshot
Investigation of Temperature Dependence of Raman Shift of Diamond-Like Carbon Coatings Used in Heat-Assisted Magnetic Recording
inferred← citeshttps://doi.org/10.1115/1.4024359openalex-snapshot
A Comparative Study of Thermal Metrology Techniques for Ultraviolet Light Emitting Diodes
inferred← citeshttps://doi.org/10.1115/1.4041813openalex-snapshot
Thermal Management and Characterization of High-Power Wide-Bandgap Semiconductor Electronic and Photonic Devices in Automotive Applications
inferred← citeshttps://doi.org/10.1115/1.4046620openalex-snapshot
Guidelines for Reduced-Order Thermal Modeling of Multifinger GaN HEMTs
inferred← citeshttps://doi.org/10.1115/1.4047100openalex-snapshot
Device-Level Multidimensional Thermal Dynamics With Implications for Current and Future Wide Bandgap Electronics
inferred← citeshttps://doi.org/10.1115/1.4047578openalex-snapshot
The Doping Dependence of the Thermal Conductivity of Bulk Gallium Nitride Substrates
inferred← citeshttps://doi.org/10.1115/ipack2019-6440openalex-snapshot
Integrated Optical Probing of the Thermal Dynamics of Wide Bandgap Power Electronics
inferred← citeshttps://doi.org/10.1116/1.3605304openalex-snapshot
Deep traps and thermal measurements on AlGaN/GaN on Si transistors
inferred← citeshttps://doi.org/10.1364/ome.488564openalex-snapshot
Comparing the thermal performance and endurance of resistive and PIN silicon microheaters for phase-change photonic applications
inferred← citeshttps://doi.org/10.1615/annualrevheattransfer.2015011335openalex-snapshot
NEAR-JUNCTION THERMAL MANAGEMENT: THERMAL CONDUCTION IN GALLIUM NITRIDE COMPOSITE SUBSTRATES
inferred← citeshttps://doi.org/10.2139/ssrn.5669533openalex-snapshot
Combustion Temperature Measurement Using Spontaneous Raman Spectroscopy Asymmetric Voigt Function Fitting
inferred← citeshttps://doi.org/10.31489/2024no4/131-139openalex-snapshot
ENHANCEMENT OF POWER CONVERSION EFFICIENCY OF DYE-SENSITIZED SOLAR CELLS VIA INCORPORATION OF GAN SEMICONDUCTOR MATERIAL SYNTHESIZED IN HOT-WALL CHEMICAL VAPOR DEPOSITION FURNACE
inferred← citeshttps://doi.org/10.3390/bios11040102openalex-snapshot
Contactless Temperature Sensing at the Microscale Based on Titanium Dioxide Raman Thermometry
inferred← citeshttps://doi.org/10.3390/iecb2020-07086openalex-snapshot
Biocompatible Temperature Nanosensors Based on Titanium Dioxide
inferred← citeshttps://doi.org/10.3390/ma5122498openalex-snapshot
Degradation Mechanisms for GaN and GaAs High Speed Transistors
inferred← citeshttps://doi.org/10.4028/www.scientific.net/amr.895.439openalex-snapshot
Temperature Dependent DC and RF Performance of n-GaN Schottky Diode: A Numerical Approach
inferred← citeshttps://doi.org/10.59324/stss.2026.3(2).08openalex-snapshot
A Comprehensive Review on Characterization of Thermal Anisotropy in Inorganic Functional Materials
inferred← citeshttps://doi.org/10.70675/546a3cf1ze571z428czb019za4e189cec44eopenalex-snapshot
Comparaison de méthodes de caractérisation thermique de transistors de puissance hyperfréquence de la filière nitrure de gallium
inferred← citeshttps://doi.org/10.70675/9332be57zeddbz4721zbd52z1b7392c6c199openalex-snapshot
Caractérisation et modélisation électro-thermique distribuée d'une puce IGBT : Application aux effets du vieillissement de la métallisation d'émetteur
inferred← citeshttps://doi.org/10.70675/959d8f15z3432z4253z9d68z93788d651215openalex-snapshot
High efficiency THz photomixers based on indium metallic wafer bonding
Editorial review for independent work. ICSAC — the Institute for Complexity
Science and Advanced Computing — runs a structured editorial panel for researchers
publishing outside journals, and publishes on CiteStamp rails. Submission is free
and goes through ORCID: icsacinstitute.org/submit.