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Measurement of the silicon (220) lattice spacing

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What this work says

Outgoing claims: the papers this work cites, builds on, or argues with.

inferredcites →https://doi.org/10.1002/pssa.2211180205openalex-snapshot
Silicon lattice parameters as an absolute scale of length for high precision measurements of fundamental constants
inferredcites →https://doi.org/10.1007/bf01323484openalex-snapshot
Lattice bending in x-ray interferometers
inferredcites →https://doi.org/10.1007/bf02026423openalex-snapshot
The lattice parameter of highly pure silicon single crystals
inferredcites →https://doi.org/10.1063/1.1144362openalex-snapshot
A displacement and angle interferometer with subatomic resolution
inferredcites →https://doi.org/10.1063/1.1144420openalex-snapshot
Servopositioning with picometer resolution
inferredcites →https://doi.org/10.1063/1.1754212openalex-snapshot
AN X-RAY INTERFEROMETER
inferredcites →https://doi.org/10.1080/01418618808209936openalex-snapshot
Lattice distortions induced by carbon in silicon
inferredcites →https://doi.org/10.1080/09500349214552101openalex-snapshot
Phase Holonomy in Optical Interferometry
inferredcites →https://doi.org/10.1088/0026-1394/22/1/004openalex-snapshot
On the Construction of a Zerodur Translation Device for X-Ray Interferometric Scanning
inferredcites →https://doi.org/10.1088/0026-1394/26/2/002openalex-snapshot
Diffraction Effects in Optical Interferometers Illuminated by Laser Sources
inferredcites →https://doi.org/10.1088/0026-1394/26/4/002openalex-snapshot
Non-Linear Analysis of the Elastic Behaviour of a Translation Device for X-Ray Interferometry
inferredcites →https://doi.org/10.1088/0026-1394/28/6/003openalex-snapshot
Phase Modulation in High-resolution Optical Interferometry
inferredcites →https://doi.org/10.1088/0957-0233/2/8/004openalex-snapshot
Accuracy assessment of a least-squares estimator for scanning X-ray interferometry
inferredcites →https://doi.org/10.1103/physrevlett.31.972openalex-snapshot
X-Ray to Visible Wavelength Ratios
inferredcites →https://doi.org/10.1103/physrevlett.46.1540openalex-snapshot
Absolute Measurement of the (220) Lattice Plane Spacing in a Silicon Crystal
inferredcites →https://doi.org/10.1109/19.192274openalex-snapshot
Progress at IMGC in the absolute determination of the silicon d
inferredcites →https://doi.org/10.1109/tim.1990.1032891openalex-snapshot
Silicon lattice constant: limits in IMGC X-ray/optical interferometry

What points at this work

Incoming claims: where this work appears in other papers’ reference lists and arguments.

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Physical Properties for Silicon Allotropes in Hexagonal 8 Stacking Order: First-Principles Study
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Spectrometers, X‐ray
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Silicon Nanocrystals Synthesized from Silicon Tetrachloride Using Electron Beam Reduction Reaction#
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t‐Si64: A Novel Silicon Allotrope
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Silicon (Si) lattice parameters
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Unsuitability of 12C60 as a standard of atomic weight
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Mechanical properties of silicon microstructures
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Mechanical Properties of Silicon Microstructures
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Mechanical Properties of Silicon Microstructures
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Mechanical and electronic properties of a novel cubic silicon allotrope with direct band gap: First-principles calculation
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Two novel silicon allotropes in monoclinic phase
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Primary mass standard based on atomic masses
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Continuous tuning of band gap by strain engineering in new predicted 13H-Si allotrope
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Contemporary x-ray wavelength metrology and traceability
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Direct and quasi-direct band gap silicon allotropes with low energy and strong absorption in the visible for photovoltaic applications
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The GAMS4 flat crystal facility
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Precision determination of pion mass using X-ray CCD spectroscopy
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A new determination of the mass of the charged pion
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Balmer α transitions in antiprotonic hydrogen and deuterium
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The deuteron binding energy and the neutron mass
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Two-Photon Excitation Spectroscopy of Silicon Quantum Dots and Ramifications for Bio-Imaging
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X-ray spectroscopy at PSI
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Six new silicon phases with direct band gaps
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Quantized positioning of x-ray interferometers
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Simulation of the thermoelastic behavior of an LLL x-ray interferometer
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The high-flux backscattering spectrometer at the NIST Center for Neutron Research
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CODATA recommended values of the fundamental physical constants: 2006
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Lattice parameter and thermal expansion of monocrystalline silicon
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Novel silicon allotropes: Stability, mechanical, and electronic properties
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Precise lattice parameter comparison of highly perfect silicon crystals
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The Role ofNAin the SI: An Atomic Path to the Kilogram
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The Lattice Parameter of Silicon: A Survey
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The Takagi Equations in Evaluating the Contributions of some Systematic Errors in Scanning LLL X-ray Interferometers
inferred← citeshttps://doi.org/10.1088/0026-1394/35/6/4openalex-snapshot
The silicon lattice parameter - an invariant quantity of nature?
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Tracing the definition of the kilogram to the Avogadro constant using a silicon single crystal
inferred← citeshttps://doi.org/10.1088/0026-1394/41/1/008openalex-snapshot
Measurement repetitions of the Si(220) lattice spacing
inferred← citeshttps://doi.org/10.1088/0026-1394/46/3/011openalex-snapshot
Comparison of the INRIM and PTB lattice-spacing standards
inferred← citeshttps://doi.org/10.1088/0026-1394/48/2/s06openalex-snapshot
Measurement of the {2 2 0} lattice-plane spacing of a28Si x-ray interferometer
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Accurate atomic mass measurements from Penning trap mass comparisons of individual ions
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History and progress in the accurate determination of the Avogadro constant
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Optically polished surfaces parallel to the (220) lattice planes of silicon monocrystals
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The use of x-ray interferometry to investigate the linearity of the NPL Differential Plane Mirror Optical Interferometer
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Precision neutron-interferometric measurement of the coherent neutron-scattering length in silicon
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Characterization of Kα spectral profiles for vanadium, component redetermination for scandium, titanium, chromium, and manganese, and development of satellite structure for Z=21 to Z=25
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Ab initiostudy of the β-ti n→ Imma→sh phase transitions in silicon and germanium
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Ab initiolattice dynamical studies of silicon clathrate frameworks and their negative thermal expansion
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Precision neutron interferometric measurements and updated evaluations of the n−p and n−d coherent neutron scattering lengths
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Precision measurement of the Si29 , S33 , and Cl36 binding energies
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Accurate Atomic Masses for Fundamental Metrology
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X-Ray Interferometry with Microelectronvolt Resolution
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CODATA recommended values of the fundamental physical constants: 1998
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X-ray transition energies: new approach to a comprehensive evaluation
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CODATA recommended values of the fundamental physical constants: 2002
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CODATA recommended values of the fundamental physical constants: 2006
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CODATA recommended values of the fundamental physical constants: 2010
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The (220) lattice spacing of silicon
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A new determination of N/sub A/
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Beam-astigmatism in laser interferometry
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Intercomparison of silicon samples from the Avogadro projects
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Scanning X-ray interferometry over a millimeter baseline
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About the existing discrepancy in the determinations of the Avogadro constant
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The silicon (220) lattice spacing: analysis of a new measurement
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Beam-astigmatism in laser interferometry
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Intercomparison of silicon samples from the Avogadro project
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Scanning X-ray interferometry over a millimeter baseline
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Progress in the measurement of lattice spacing d
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Critical aspects of scanning X-ray/optical interferometry
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Lattice spacing mapping in large silicon ingot using high resolution lattice comparator
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Comparison of IMGC and PTB Absolute Determinations of the Si(220) Lattice Spacing
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Joint IMGC-NMIJ Measurement of the Si (220) Lattice Spacing
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Confirmation of the INRiM and PTB Determinations of the Si Lattice Parameter
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A Possible Solution for the Discrepancy Between the INRIM and NMIJ Values of the Si Lattice-Parameter
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Use of diffracting optics in metrology and sensing
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Calculation of x-ray wave fields in perfect crystals by applying Riemann’s method to solve the Takagi-Taupin equations
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X-ray phase measurements by time-energy correlated photon pairs
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Pionic deuterium
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Hadronic shift in pionic hydrogen
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Redetermination of the strong-interaction width in pionic hydrogen
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Line shape analysis of the Kβ transition in muonic hydrogen
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A validity test of E = m ⋅ c 2
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Absolute Measurement of Lattice Spacing d(220) in Floating Zone Silicon Crystal
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Light Bounces in Two-Beam Scanning Laser Interferometers
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Angstrom ruler for high-accuracy pitch measurement
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Aberration effects in two-beam laser interferometers
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Si lattice parameter measurement by centimeter X-ray interferometry
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The Avogadro and the Planck constants for redefinition of the kilogram
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X-ray crystal interferometers
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X-ray crystal interferometers
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A Novel Silicon Allotrope in the Monoclinic Phase
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The Lattice Spacing Variability of Intrinsic Float-Zone Silicon
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