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What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
inferredcites →https://doi.org/10.1007/978-3-540-72383-7_91openalex-snapshot
Neural Network Based Algorithm for Multi-Constrained Shortest Path Problem
inferredcites →https://doi.org/10.1109/icicdt.2009.5166300openalex-snapshot
Machine learning based lithographic hotspot detection with critical-feature extraction and classification
inferredcites →https://doi.org/10.1109/tcad.2009.2018876openalex-snapshot
ELIAD: Efficient Lithography Aware Detailed Routing Algorithm With Compact and Macro Post-OPC Printability Prediction
inferredcites →https://doi.org/10.1117/12.692949openalex-snapshot
Fast dual graph-based hotspot detection
inferredcites →https://doi.org/10.1117/12.712491openalex-snapshot
Automated full-chip hotspot detection and removal flow for interconnect layers of cell-based designs
inferredcites →https://doi.org/10.1117/12.814316openalex-snapshot
Detecting context sensitive hot spots in standard cell libraries
inferredcites →https://doi.org/10.1117/3.665802.p82openalex-snapshot
Optical Proximity Correction (OPC)
inferredcites →https://doi.org/10.1145/1120725.1120804openalex-snapshot
Maze routing with OPC consideration
inferredcites →https://doi.org/10.1145/1233501.1233630openalex-snapshot
Efficient process-hotspot detection using range pattern matching
inferredcites →https://doi.org/10.1145/1391469.1391599openalex-snapshot
Predictive formulae for OPC with applications to lithography-friendly routing
inferredcites →https://doi.org/10.1145/1629911.1630053openalex-snapshot
Predicting variability in nanoscale lithography processes
inferredcites →https://doi.org/10.1145/996566.996622openalex-snapshot
Optical proximity correction (OPC)
inferredcites →https://doi.org/10.5555/1870926.1871255openalex-snapshot
SAT based multi-net rip-up-and-reroute for manufacturing hotspot removal
What points at this work
Incoming claims: where this work appears in other papers’ reference lists and arguments.
inferred← citeshttps://doi.org/10.1007/978-3-030-04666-8_4openalex-snapshot
Machine Learning in Physical Verification, Mask Synthesis, and Physical Design
inferred← citeshttps://doi.org/10.1049/iet-cds.2018.5083openalex-snapshot
Effective datapath logic extraction techniques using connection vectors
inferred← citeshttps://doi.org/10.1080/00207160.2013.804512openalex-snapshot
A study of hotspot data prediction model in I/O workloads
inferred← citeshttps://doi.org/10.1109/apccas.2016.7804022openalex-snapshot
Multiple-patterning lithography-aware routing for standard cell layout synthesis
inferred← citeshttps://doi.org/10.1109/asicon.2013.6811917openalex-snapshot
Lithography hotspot detection and mitigation in nanometer VLSI
inferred← citeshttps://doi.org/10.1109/aspdac.2012.6164956openalex-snapshot
EPIC: Efficient prediction of IC manufacturing hotspots with a unified meta-classification formulation
inferred← citeshttps://doi.org/10.1109/aspdac.2015.7059020openalex-snapshot
Machine learning and pattern matching in physical design
inferred← citeshttps://doi.org/10.1109/tcad.2013.2276751openalex-snapshot
Design for Manufacturing With Emerging Nanolithography
inferred← citeshttps://doi.org/10.1109/tvlsi.2012.2214491openalex-snapshot
RegularRoute: An Efficient Detailed Router Applying Regular Routing Patterns
inferred← citeshttps://doi.org/10.1109/vlsid.2016.102openalex-snapshot
A Novel EPE Aware Hybrid Global Route Planner after Floorplanning
inferred← citeshttps://doi.org/10.1117/1.jmm.13.4.043018openalex-snapshot
Layout pattern-driven design rule evaluation
inferred← citeshttps://doi.org/10.1117/1.jmm.22.2.023401openalex-snapshot
Geometrical positioning surveying-based features for BEOL line-end-pull-back modeling using regression-based machine-learning
inferred← citeshttps://doi.org/10.1145/2451916.2451938openalex-snapshot
Simultaneous OPC- and CMP-aware routing based on accurate closed-form modeling
inferred← citeshttps://doi.org/10.1145/3394885.3431624openalex-snapshot
Deep Learning for Mask Synthesis and Verification
inferred← citeshttps://doi.org/10.1145/3451179openalex-snapshot
Machine Learning for Electronic Design Automation: A Survey
inferred← citeshttps://doi.org/10.1145/3563391openalex-snapshot
A Survey and Perspective on Artificial Intelligence for Security-Aware Electronic Design Automation
inferred← citeshttps://doi.org/10.1145/3721129openalex-snapshot
LithoExp: Explainable Two-stage CNN-based Lithographic Hotspot Detection with Layout Defect Localization
inferred← citeshttps://doi.org/10.11575/prism/33224openalex-snapshot
A Machine Learning Predictor and Corrector Framework to Identify and Resolve VLSI Routing Short Violations
inferred← citeshttps://doi.org/10.3390/electronics12040935openalex-snapshot
Towards Machine Learning-Based FPGA Backend Flow: Challenges and Opportunities
inferred← citeshttps://doi.org/10.48550/arxiv.1810.12789openalex-snapshot
Early Routability Assessment in VLSI Floorplans: A Generalized Routing Model
inferred← citeshttps://doi.org/10.5555/2132325.2132398openalex-snapshot
DOPPLER: DPL-aware and OPC-friendly gridless detailed routing with mask density balancing
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