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Subsurface damage in some single crystalline optical materials
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What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
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X-ray measurement of elastic strain and annealing in semiconductors
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State-of-the-art of non-destructive measurement of sub-surface material properties and damages
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Residual Stress and Deformation Energy Under Ground Surfaces of Brittle Solids
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Fracture anisotropy in silicon single crystal
inferredcites →https://doi.org/10.1063/1.341542openalex-snapshot
Comprehensive investigation of polish-induced surface strain in 〈100〉 and 〈111〉 GaAs and InP
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Characterization of subsurface damage in GaAs processed by Ga+ focused ion-beam-assisted Cl2 etching using photoluminescence
inferredcites →https://doi.org/10.1063/1.364340openalex-snapshot
Phase transformations of silicon caused by contact loading
inferredcites →https://doi.org/10.1080/01418610208235704openalex-snapshot
Contact resistance and phase transformations during nanoindentation of silicon
inferredcites →https://doi.org/10.1080/01418610208235709openalex-snapshot
Transmission electron microscopy of amorphization and phase transformation beneath indents in Si
inferredcites →https://doi.org/10.1088/0508-3443/16/3/417openalex-snapshot
Strain energy of (111) and ([111 over bar]) surfaces of InSb
inferredcites →https://doi.org/10.1088/1475-4878/23/3/301openalex-snapshot
The structure of abraded glass surfaces
inferredcites →https://doi.org/10.1103/physrevlett.60.2156openalex-snapshot
Amorphization and Conductivity of Silicon and Germanium Induced by Indentation
inferredcites →https://doi.org/10.1111/j.1151-2916.1994.tb04585.xopenalex-snapshot
Effect of Etching and Imaging Mode on the Measurement of Subsurface Damage in Microground Optical Glasses
inferredcites →https://doi.org/10.1111/j.1151-2916.1994.tb05424.xopenalex-snapshot
Simple Technique for Observing Subsurface Damage in Machining of Ceramics
inferredcites →https://doi.org/10.1115/1.2831057openalex-snapshot
Determination of Surface Residual Stresses in Machined Ceramics Using Indentation Fracture
inferredcites →https://doi.org/10.1115/1.3187111openalex-snapshot
Comparison of Grinding and Lapping of Ferrites and Metals
inferredcites →https://doi.org/10.1149/1.2113775openalex-snapshot
A Study of Lapping and Polishing Damage in Single‐Crystal CdTe
inferredcites →https://doi.org/10.1149/1.2426021openalex-snapshot
Damaged Layers in Abraded Silicon Surfaces
inferredcites →https://doi.org/10.1364/ao.26.004677openalex-snapshot
Optical glass fabrication technology 2: Relationship between surface roughness and subsurface damage
inferredcites →https://doi.org/10.1364/ao.35.005704openalex-snapshot
Twyman effect mechanics in grinding and microgrinding
inferredcites →https://doi.org/10.1557/jmr.2004.0403openalex-snapshot
Examining pressure-induced phase transformations in silicon by spherical indentation and Raman spectroscopy: A statistical study
What points at this work
Incoming claims: where this work appears in other papers’ reference lists and arguments.
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