On the public citation graph

Impact of Constant Bias Stress on Reliability of A-Igzo Thin-Film Transistors

https://doi.org/10.2139/ssrn.4675787
0 signed · 20 inferred · view as graph

Inferred edges come from two machine sources: sweeps of open repository metadata (mostly SSRN and Zenodo), and a bulk OpenAlex citation snapshot. Every row below is labelled with the one it came from. Neither is a complete citation index — absence here is not evidence of absence.

Is this your work? Sign in with ORCID and put your name on the claims that are yours.
Claim with ORCID
Reference health. See whether every reference in this work resolves to a known work and none has been retracted — and get a dated CiteStamped badge you can embed.
See reference health

What this work says

Outgoing claims: the papers this work cites, builds on, or argues with.

inferredcites →https://doi.org/10.1002/adma.201504366openalex-extracted
Monitoring of Vital Signs with Flexible and Wearable Medical Devices
inferredcites →https://doi.org/10.1002/aelm.201700221openalex-extracted
Highly Stable Indium‐Gallium‐Zinc‐Oxide Thin‐Film Transistors on Deformable Softening Polymer Substrates
inferredcites →https://doi.org/10.1002/aisy.202100253openalex-extracted
Active Matrix Flexible Sensory Systems: Materials, Design, Fabrication, and Integration
inferredcites →https://doi.org/10.1016/j.mee.2021.111618openalex-extracted
Electrical characterization of flexible hafnium oxide capacitors on deformable softening polymer substrate
inferredcites →https://doi.org/10.1016/j.mssp.2018.08.010openalex-extracted
Lifetime of hafnium oxide dielectric in thin-film devices fabricated on deformable softening polymer substrate
inferredcites →https://doi.org/10.1016/j.tsf.2016.01.035openalex-extracted
Investigating degradation behavior of hole-trapping effect under static and dynamic gate-bias stress in a dual gate a-InGaZnO thin film transistor with etch stop layer
inferredcites →https://doi.org/10.1021/acs.chemmater.9b00165openalex-extracted
Emerging Trends in Flexible Active Multielectrode Arrays
inferredcites →https://doi.org/10.1039/c7cs00730bopenalex-extracted
Wearable and flexible electronics for continuous molecular monitoring
inferredcites →https://doi.org/10.1039/c9tc03933copenalex-extracted
Amorphous InGaZnO and metal oxide semiconductor devices: an overview and current status
inferredcites →https://doi.org/10.1063/1.3609873openalex-extracted
Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor
inferredcites →https://doi.org/10.1063/1.4953034openalex-extracted
Metal oxide semiconductor thin-film transistors for flexible electronics
inferredcites →https://doi.org/10.1063/1.4960200openalex-extracted
Improving positive and negative bias illumination stress stability in parylene passivated IGZO transistors
inferredcites →https://doi.org/10.1088/1361-6641/aad293openalex-extracted
Effect of annealing atmosphere on IGZO thin film transistors on a deformable softening polymer substrate
inferredcites →https://doi.org/10.1088/2058-8585/ac7186openalex-extracted
Threshold voltage reliability in flexible amorphous In–Ga–ZnO TFTs under simultaneous electrical and mechanical stress
inferredcites →https://doi.org/10.1088/2058-8585/ac8492openalex-extracted
Indium-gallium-zinc oxide Schottky diodes on softening substrates for rectifying bioelectronic circuits
inferredcites →https://doi.org/10.1088/2399-7532/aaed58openalex-extracted
From softening polymers to multimaterial based bioelectronic devices
inferredcites →https://doi.org/10.1109/jproc.2015.2405767openalex-extracted
Transparent Semiconducting Oxide Technology for Touch Free Interactive Flexible Displays
inferredcites →https://doi.org/10.1109/jssc.2004.829373openalex-extracted
Amorphous silicon thin film transistor circuit integration for organic LED displays on glass and plastic
inferredcites →https://doi.org/10.1109/mcom.2015.7295482openalex-extracted
Flexible thin-film NFC tags
inferredcites →https://doi.org/10.1557/s43577-021-00228-8openalex-extracted
Metal oxide semiconductor thin-film transistor backplanes for displays and imaging
Editorial review for independent work. ICSAC — the Institute for Complexity Science and Advanced Computing — runs a structured editorial panel for researchers publishing outside journals, and publishes on CiteStamp rails. Submission is free and goes through ORCID: icsacinstitute.org/submit.