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Quantitative electromechanical characterization of materials using conductive ceramic tips
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What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
inferredcites →https://doi.org/10.1002/0471749095openalex-snapshot
Semiconductor Material and Device Characterization
inferredcites →https://doi.org/10.1002/adfm.201002663openalex-snapshot
Nanoscale Characterization of Energy Generation from Piezoelectric Thin Films
inferredcites →https://doi.org/10.1007/bf02914655openalex-snapshot
Transition metal carbides, nitrides, and borides for electronic applications
inferredcites →https://doi.org/10.1007/s11837-998-0131-yopenalex-snapshot
The thermal conductivity of metallic ceramics
inferredcites →https://doi.org/10.1016/j.actamat.2004.12.025openalex-snapshot
Indentation-induced phase transformations in silicon: influences of load, rate and indenter angle on the transformation behavior
inferredcites →https://doi.org/10.1016/j.ijrmhm.2008.09.014openalex-snapshot
Microstructure and mechanical properties of vanadium carbide coatings synthesized by reactive magnetron sputtering
inferredcites →https://doi.org/10.1016/j.pmatsci.2012.08.001openalex-snapshot
In situ nanoindentation: Probing nanoscale multifunctionality
inferredcites →https://doi.org/10.1016/s0008-6223(00)00272-4openalex-snapshot
Elasto-plastic deformation of glass-like carbons heat-treated at different temperatures
inferredcites →https://doi.org/10.1016/s0040-6090(00)00917-2openalex-snapshot
Supertough wear-resistant coatings with ‘chameleon’ surface adaptation
inferredcites →https://doi.org/10.1016/s0927-796x(02)00005-0openalex-snapshot
Diamond-like amorphous carbon
inferredcites →https://doi.org/10.1063/1.113636openalex-snapshot
Characterization of a point-contact on silicon using force microscopy-supported resistance measurements
inferredcites →https://doi.org/10.1063/1.121745openalex-snapshot
The influence of mechanical stress on the dielectric breakdown field strength of thin SiO2 films
inferredcites →https://doi.org/10.1063/1.126300openalex-snapshot
Effect of phase transformations on the shape of the unloading curve in the nanoindentation of silicon
inferredcites →https://doi.org/10.1063/1.1728961openalex-snapshot
An Electromechanical Effect in Semiconductors
inferredcites →https://doi.org/10.1063/1.1778217openalex-snapshot
Quantitative impedance measurement using atomic force microscopy
inferredcites →https://doi.org/10.1063/1.2724803openalex-snapshot
Identification of nanoindentation-induced phase changes in silicon by in situ electrical characterization
inferredcites →https://doi.org/10.1063/1.3130154openalex-snapshot
Understanding pressure-induced phase-transformation behavior in silicon through in situ electrical probing under cyclic loading conditions
inferredcites →https://doi.org/10.1063/1.331969openalex-snapshot
Quantitative model for current-voltage characteristics of metal point contacts on silicon rectifying junctions
inferredcites →https://doi.org/10.1063/1.3549191openalex-snapshot
Room temperature writing of electrically conductive and insulating zones in silicon by nanoindentation
inferredcites →https://doi.org/10.1080/01418610208235699openalex-snapshot
Indentation hysteresis of glassy carbon materials
inferredcites →https://doi.org/10.1080/01418610208235704openalex-snapshot
Contact resistance and phase transformations during nanoindentation of silicon
inferredcites →https://doi.org/10.1088/0268-1242/19/10/r02openalex-snapshot
Si/SiGe heterostructures: from material and physics to devices and circuits
inferredcites →https://doi.org/10.1098/rspa.1966.0242openalex-snapshot
Contact of nominally flat surfaces
inferredcites →https://doi.org/10.1103/physrevb.57.12588openalex-snapshot
Nanomechanical properties of Au (111), (001), and (110) surfaces
inferredcites →https://doi.org/10.1103/physrevb.60.3963openalex-snapshot
Electron transport through a circular constriction
inferredcites →https://doi.org/10.1103/physrevb.61.12725openalex-snapshot
Maxwell and Sharvin conductance in gold point contacts investigated using TEM-STM
inferredcites →https://doi.org/10.1103/physrevb.67.085205openalex-snapshot
In situelectrical characterization of phase transformations in Si during indentation
inferredcites →https://doi.org/10.1103/physrevb.83.075316openalex-snapshot
Experimental evidence for semiconducting behavior of Si-XII
inferredcites →https://doi.org/10.1103/physrevlett.60.2156openalex-snapshot
Amorphization and Conductivity of Silicon and Germanium Induced by Indentation
inferredcites →https://doi.org/10.1103/physrevlett.84.1260openalex-snapshot
Multiscale Simulation of Loading and Electrical Resistance in Silicon Nanoindentation
inferredcites →https://doi.org/10.1103/revmodphys.69.731openalex-snapshot
Random-matrix theory of quantum transport
inferredcites →https://doi.org/10.1109/6144.759357openalex-snapshot
Electrical contact resistance: properties of stationary interfaces
inferredcites →https://doi.org/10.1109/tnano.2009.2030888openalex-snapshot
Direct Tip Shape Determination of a Berkovich Indenter: Effect on Nanomechanical Property Measurement and Description of a Worn Indenter
inferredcites →https://doi.org/10.1111/j.1151-2916.1997.tb02976.xopenalex-snapshot
Chemical, Mechanical, and Tribological Properties of Pulsed‐Laser‐Deposited Titanium Carbide and Vanadium Carbide
inferredcites →https://doi.org/10.1149/1.2404240openalex-snapshot
Contact Resistance and Contact Resistivity
inferredcites →https://doi.org/10.1149/1.2423927openalex-snapshot
A Spreading Resistance Technique for Resistivity Measurements on Silicon
inferredcites →https://doi.org/10.1557/jmr.1992.0961openalex-snapshot
Electrical resistance of metallic contacts on silicon and germanium during indentation
inferredcites →https://doi.org/10.1557/jmr.1992.1564openalex-snapshot
An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments
inferredcites →https://doi.org/10.1557/jmr.1998.0185openalex-snapshot
Determination of indenter tip geometry and indentation contact area for depth-sensing indentation experiments
inferredcites →https://doi.org/10.1557/jmr.2000.0253openalex-snapshot
Size-dependent Phase Transformations During Point Loading of Silicon
inferredcites →https://doi.org/10.1557/jmr.2001.0209openalex-snapshot
Mechanical deformation in silicon by micro-indentation
inferredcites →https://doi.org/10.1557/jmr.2007.0100openalex-snapshot
An in situ electrical measurement technique via a conducting diamond tip for nanoindentation in silicon
inferredcites →https://doi.org/10.1557/jmr.2011.377openalex-snapshot
Structural characterization of B-doped diamond nanoindentation tips
inferredcites →https://doi.org/10.1557/jmr.2011.432openalex-snapshot
Plastic response of the native oxide on Cr and Al thin films from in situ conductive nanoindentation
What points at this work
Incoming claims: where this work appears in other papers’ reference lists and arguments.
inferred← citeshttps://doi.org/10.2139/ssrn.4639117openalex-extracted
Nanoscale Electro-Mechanical Stability of Carbon Films: The Ex-Situ and In-Situ Electro-Nanoindentation Study
inferred← citeshttps://doi.org/10.1002/adem.202001494openalex-snapshot
Understanding Nanoscale Plasticity by Quantitative In Situ Conductive Nanoindentation
inferred← citeshttps://doi.org/10.1007/s00339-016-0142-4openalex-snapshot
Volumetric and timescale analysis of phase transformation in single-crystal silicon during nanoindentation
inferred← citeshttps://doi.org/10.1007/s00339-016-9973-2openalex-snapshot
In situ characterization of formation and growth of high-pressure phases in single-crystal silicon during nanoindentation
inferred← citeshttps://doi.org/10.1016/bs.semsem.2014.12.002openalex-snapshot
Nanoindentation of Silicon and Germanium
inferred← citeshttps://doi.org/10.1016/j.apsusc.2025.162334openalex-snapshot
Electrical contact mechanical stability of nanostructured carbon films by in-situ conductive nanoindentation
inferred← citeshttps://doi.org/10.1016/j.cirp.2023.03.034openalex-snapshot
Improvement of instrumented indentation test accuracy by data augmentation with electrical contact resistance
inferred← citeshttps://doi.org/10.1016/j.sna.2018.09.035openalex-snapshot
Nanoindentation of crystalline silicon pillars fabricated by soft UV nanoimprint lithography and cryogenic deep reactive ion etching
inferred← citeshttps://doi.org/10.1016/j.triboint.2024.109397openalex-snapshot
Comprehensive mechanical and tribological characterization of metal-polymer PTFE+Pb/Bronze coating by in-situ electrical contact resistance measurement augmented tribo-mechanical tests
inferred← citeshttps://doi.org/10.1016/j.tsf.2021.138891openalex-snapshot
Development of a multifunctional nanoindenter integrated in-situ Scanning Electron Microscope - application to the monitoring of piezoresponse and electro-mechanical failures
inferred← citeshttps://doi.org/10.1063/1.4899194openalex-snapshot
Nanoscale electro-mechanical dynamics of nano-crystalline platinum thin films: An in situ electrical nanoindentation study
inferred← citeshttps://doi.org/10.1063/5.0032682openalex-snapshot
Resistive-nanoindentation on gold: Experiments and modeling of the electrical contact resistance
inferred← citeshttps://doi.org/10.1088/1361-6528/aa7be8openalex-snapshot
Phase transformation in AFM silicon tips
inferred← citeshttps://doi.org/10.1109/holm.2019.8923946openalex-snapshot
Development and Application of a Multifunctional Nanoindenter: Coupling to Electrical Measurements and Integration In-Situ in a Scanning Electron Microscope
inferred← citeshttps://doi.org/10.1557/mrc.2019.74openalex-snapshot
Resistive-nanoindentation: contact area monitoring by real-time electrical contact resistance measurement
inferred← citeshttps://doi.org/10.1557/s43578-026-01800-1openalex-snapshot
Mechanical and electrical properties of copper oxide thin films formed by thermal oxidation
inferred← citeshttps://doi.org/10.21741/9781644902714-37openalex-snapshot
Augmented multi-scale instrumented indentation test characterization of complex multi-layered coatings for tribological application
inferred← citeshttps://doi.org/10.3901/jme.2023.17.258openalex-snapshot
Electrical Contact Properties of Nanostructured Carbon Films under Transverse Current-carrying Condition
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