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Hardware Trust and Assurance through Reverse Engineering: A Tutorial and Outlook from Image Analysis and Machine Learning Perspectives
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Outgoing claims: the papers this work cites, builds on, or argues with.
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SEMBA: A SEM based acquisition technique for fast invasive Hardware Trojan detection
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Proceedings of the 2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)
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Hardware Trojan detection using path delay fingerprint
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Experiences in Hardware Trojan design and implementation
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TeSR: A robust Temporal Self-Referencing approach for Hardware Trojan detection
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Golden Gates: A New Hybrid Approach for Rapid Hardware Trojan Detection using Testing and Imaging
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On design vulnerability analysis and trust benchmarks development
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Standard cell camouflage method to counter silicon reverse engineering
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Deep Learning for Automatic IC Image Analysis
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Secure Embedded Systems: The Threat of Reverse Engineering
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Incoming claims: where this work appears in other papers’ reference lists and arguments.
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REFICS: Assimilating Data-Driven Paradigms Into Reverse Engineering and Hardware Assurance on Integrated Circuits
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SECURE: A Segmentation Quality Evaluation Metric on SEM Images for Reverse Engineering on Integrated Circuits
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TOP: A Combined Logical and Physical Obfuscation Method for Securing Networks-on-Chip Against Reverse Engineering Attacks
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Structural Reasoning from Incomplete Netlists: Towards Enhanced Hardware Trojan Detection
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Lightning Talk: The Incredible Shrinking Black Box Model
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Gamora: Graph Learning based Symbolic Reasoning for Large-Scale Boolean Networks
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Towards Blockchain-enabled Mask Writing for Security against Hardware Trojan Intrusion
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Risk-Aware and Explainable Framework for Ensuring Guaranteed Coverage in Evolving Hardware Trojan Detection
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Circuit Object Detection and Standard Cell Recognition in IC Images Based on Semantic Segmentation Techniques
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GRACER: Graph-Based Standard Cell Recognition in IC Images for Hardware Assurance
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Hybrid Unsupervised Clustering for Pretext Distribution Learning in IC Image Analysis
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No-Reference Image Quality Assessment for Reverse Engineering of Integrated Circuits
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Unsupervised Domain Adaptation with Pseudo Shape Supervision for IC Image Segmentation
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Parasitic Circus: On the Feasibility of Golden-Free PCB Verification
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HiFi-DRAM: Enabling High-fidelity DRAM Research by Uncovering Sense Amplifiers with IC Imaging
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SAFET-HI: Secure Authentication-Based Framework for Encrypted Testing in Heterogeneous Integration
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Integrated Circuit Mask–Generative Adversarial Network for Circuit Annotation With Targeted Data Augmentation
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Integrated Circuit Image Synthesis for Unsupervised Circuit Annotation via Shape Consistent Image Translation
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A Brief Tutorial on Mixed Signal Approaches to Combat Electronic Counterfeiting
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Preparation, Imaging, and Design Extraction of the Front-End-of-Line and Middle-of-Line in a 14 nm Node FinFET Device
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Towards PCB Netlist Extraction from Multimodal Imagery
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Unsupervised Domain Adaptation with Histogram-gated Image Translation for Delayered IC Image Analysis
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Simulation-Based Approach to Generating Golden Data for PCB-Level Hardware Trojan Detection Using Capacitive Sensor
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Securing Silicon Photonics Supply Chain Threats and Opportunities
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Evaluating Multimodal Foundation Models for Few-Shot PCB Identification and Reasoning
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Security Challenges for Assurance in Silicon Photonic Packaging
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GraphClusNet: A Hierarchical Graph Neural Network for Recovered Circuit Netlist Partitioning
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GNN-RE: Graph Neural Networks for Reverse Engineering of Gate-Level Netlists
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On Modeling and Detecting Trojans in Instruction Sets
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Patch-Based Adversarial Training for Error-Aware Circuit Annotation of Delayered IC Images
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Hardware Trojan Detection for Incomplete Gate-Level Reverse Netlist
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SAMIC: Segment Anything Model for Integrated Circuit Image Analysis
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Portability of Profiling Side-Channel Analysis: A Case Study Using Adjustable Implementations of Block Ciphers
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A RISC-V SoC with Hardware Trojans: Case Study on Trojan-ing the On-Chip Protocol Conversion
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Structural Reconstruction of Analog Circuits Using Graph Neural Networks and Transformers
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Automated Defect Inspection in Reverse Engineering of Integrated Circuits
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SegPCBX: redefining automated PCB inspection with a novel PCB x-ray dataset for component analysis
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CONCEALING-Gate: Optical Contactless Probing Resilient Design
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Towards Unsupervised SEM Image Segmentation for IC Layout Extraction
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A Fast Object Detection-Based Framework for Via Modeling on PCB X-Ray CT Images
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ObNoCs : Protecting Network-on-Chip Fabrics Against Reverse-Engineering Attacks
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Research on the innovative model of counselor studios in higher vocational colleges based on machine learning algorithms
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Software and Hardware Implementations of a Cyber-Physical Firewall
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Netlist Reverse Engineering Practice: Effects of Prior Knowledge, Cognitive Abilities, and Personality Traits
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RETRACTED: LGD_Net: Capsule network with extreme learning machine for classification of lung diseases using CT scans
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Towards Intelligent Hardware Assurance: Human-in-the-loop Error Localization and Resolution with Vision-Language Models
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Physical and Functional Reverse Engineering Challenges for Advanced Semiconductor Solutions
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AIME: Watermarking AI Models by Leveraging Errors
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MANTIS: Machine Learning-Based Approximate ModeliNg of RedacTed Integrated CircuitS
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Specified weight cutting system for irregular solid material based on 3D scanning
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Machine learning for high-dimensional data analysis in hardware assurance applications
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Enhancing manufacturing operations with synthetic data: a systematic framework for data generation, accuracy, and utility
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PCB Component Detection Using Computer Vision for Hardware Assurance
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Why Is Deep Learning Challenging for Printed Circuit Board (PCB) Component Recognition and How Can We Address It?
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An Overview of Medical Electronic Hardware Security and Emerging Solutions
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CAPTIVE: Constrained Adversarial Perturbations to Thwart IC Reverse Engineering
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Preparation, Imaging, and Design Extraction of the Front-End-of-Line and Middle-of-Line in a 14 nm Node FinFET Device
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Preparation, Imaging, and Design Extraction of the Front-End-of-Line and Middle-of-Line in a 14 nm Node FinFET Device
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An Analysis of Two-Dimensional Image Data Using a Grouping Estimator
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