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What this work says
Outgoing claims: the papers this work cites, builds on, or argues with.
inferredcites →https://doi.org/10.1016/j.sysarc.2016.07.003openalex-snapshot
Fine grained, direct access file system support for storage class memory
inferredcites →https://doi.org/10.1109/a-sscc36141.2015openalex-snapshot
2015 IEEE Asian Solid-State Circuits Conference (A-SSCC)
inferredcites →https://doi.org/10.1109/asp-dac37448.2017openalex-snapshot
2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC)
inferredcites →https://doi.org/10.1109/aspdac.2017.7858385openalex-snapshot
Temperature-aware data allocation strategy for 3D charge-trap flash memory
inferredcites →https://doi.org/10.1109/asscc.2015.7387432openalex-snapshot
A cell current compensation scheme for 3D NAND FLASH memory
inferredcites →https://doi.org/10.1109/iedm.2009.5424231openalex-snapshot
Reliability of barrier engineered charge trapping devices for sub-30nm NAND flash
inferredcites →https://doi.org/10.1109/iedm.2016.7838394openalex-snapshot
A new ruler on the storage market: 3D-NAND flash for high-density memory and its technology evolutions and challenges on the future
inferredcites →https://doi.org/10.1109/imw.2010.5488390openalex-snapshot
A critical examination of 3D stackable NAND Flash memory architectures by simulation study of the scaling capability
inferredcites →https://doi.org/10.1109/imw16482.2010openalex-snapshot
2010 IEEE International Memory Workshop
inferredcites →https://doi.org/10.1109/jssc.2015.2413841openalex-snapshot
Layer-Aware Program-and-Read Schemes for 3D Stackable Vertical-Gate BE-SONOS NAND Flash Against Cross-Layer Process Variations
inferredcites →https://doi.org/10.1109/led.2013.2260853openalex-snapshot
Investigation of charge loss mechanism of thickness-scalable trapping layer by variable temperature Kelvin probe force microscopy
inferredcites →https://doi.org/10.1109/led.2013.2277653openalex-snapshot
Correction to "Investigation of charge loss mechanism of thickness-scalable trapping layer by variable temperature Kelvin probe force microscopy" [Jul 13 870-872]
inferredcites →https://doi.org/10.1109/tc.2016.2595572openalex-snapshot
Heating Dispersal for Self-Healing NAND Flash Memory
inferredcites →https://doi.org/10.1109/tc.2017.2679180openalex-snapshot
A Block-Level Log-Block Management Scheme for MLC NAND Flash Memory Storage Systems
inferredcites →https://doi.org/10.1109/tcad.2014.2347929openalex-snapshot
A Reliability-Aware Address Mapping Strategy for NAND Flash Memory Storage Systems
inferredcites →https://doi.org/10.1109/ted.2008.925922openalex-snapshot
A Study of Gate-Sensing and Channel-Sensing (GSCS) Transient Analysis Method Part II: Study of the Intra-Nitride Behaviors and Reliability of SONOS-Type Devices
inferredcites →https://doi.org/10.1109/ted.2010.2089013openalex-snapshot
2010 IEEE International Electron Devices Meeting (IEDM)
inferredcites →https://doi.org/10.1109/ted.2014.2318716openalex-snapshot
Modeling the Impact of Random Grain Boundary Traps on the Electrical Behavior of Vertical Gate 3-D NAND Flash Memory Devices
inferredcites →https://doi.org/10.1109/tvlsi.2013.2288687openalex-snapshot
A Reliability Enhanced Address Mapping Strategy for Three-Dimensional (3-D) NAND Flash Memory
inferredcites →https://doi.org/10.1109/vlsit.1992openalex-snapshot
1992 Symposium on VLSI Technology Digest of Technical Papers
inferredcites →https://doi.org/10.1109/vlsit.2016.7573386openalex-snapshot
A Monte Carlo simulation method to predict large-density NAND product memory window from small-array test element group (TEG) verified on a 3D NAND Flash test chip
inferredcites →https://doi.org/10.1145/2593069.2593124openalex-snapshot
Deterministic Crash Recovery for NAND Flash Based Storage Systems
inferredcites →https://doi.org/10.1145/2699866openalex-snapshot
Enhancing the Reliability of MLC NAND Flash Memory Systems by Read Channel Optimization
inferredcites →https://doi.org/10.1145/2905054openalex-snapshot
Exploiting Sequential and Temporal Localities to Improve Performance of NAND Flash-Based SSDs
inferredcites →https://doi.org/10.1145/2934583.2934638openalex-snapshot
A Thermal-Aware Physical Space Allocation Strategy for 3D Flash Memory Storage Systems
inferredcites →https://doi.org/10.1145/2968456.2968465openalex-snapshot
A design to reduce write amplification in object-based NAND flash devices
inferredcites →https://doi.org/10.1145/2968456.2968475openalex-snapshot
How to enable software isolation and boost system performance with sub-block erase over 3D flash memory
inferredcites →https://doi.org/10.1145/2992782openalex-snapshot
Reliability Analysis of SSDs Under Power Fault
inferredcites →https://doi.org/10.1166/jnn.2012.6650openalex-snapshot
Future Prospects of NAND Flash Memory Technology—The Evolution from Floating Gate to Charge Trapping to 3D Stacking
inferredcites →https://doi.org/10.5555/2555692.2555699openalex-snapshot
DHeating: dispersed heating repair for self-healing NAND flash memory
inferredcites →https://doi.org/10.5555/2561828.2561912openalex-snapshot
A disturb-alleviation scheme for 3D flash memory
inferredcites →https://doi.org/10.5555/2840819.2840886openalex-snapshot
On Relaxing Page Program Disturbance over 3D MLC Flash Memory
What points at this work
Incoming claims: where this work appears in other papers’ reference lists and arguments.
inferred← citeshttps://doi.org/10.1016/j.sysarc.2022.102400openalex-snapshot
Adaptive weight-bit inversion for state error reduction for robust and efficient deep neural network inference using MLC NAND Flash
inferred← citeshttps://doi.org/10.1109/hpca53966.2022.00044openalex-snapshot
Efficient Bad Block Management with Cluster Similarity
inferred← citeshttps://doi.org/10.1109/hpca57654.2024.00055openalex-snapshot
Are Superpages Super-fast? Distilling Flash Blocks to Unify Flash Pages of a Superpage in an SSD
inferred← citeshttps://doi.org/10.1109/qrs51102.2020.00051openalex-snapshot
Process-variation Effects on 3D TLC Flash Reliability: Characterization and Mitigation Scheme
inferred← citeshttps://doi.org/10.1109/tc.2019.2959318openalex-snapshot
Exploiting Asymmetric Errors for LDPC Decoding Optimization on 3D NAND Flash Memory
inferred← citeshttps://doi.org/10.1109/tc.2022.3184270openalex-snapshot
LightWarner: Predicting Failure of 3D NAND Flash Memory Using Reinforcement Learning
inferred← citeshttps://doi.org/10.1109/tc.2022.3226305openalex-snapshot
Meta-Block: Exploiting Cross-Layer and Direct Storage Access for Decentralized Blockchain Storage Systems
inferred← citeshttps://doi.org/10.1109/tcad.2018.2808227openalex-snapshot
A Temperature-Aware Reliability Enhancement Strategy for 3-D Charge-Trap Flash Memory
inferred← citeshttps://doi.org/10.1109/tcad.2018.2821442openalex-snapshot
A Thermal-Aware Physical Space Reallocation for Open-Channel SSD With 3-D Flash Memory
inferred← citeshttps://doi.org/10.1109/tcad.2018.2878179openalex-snapshot
DCR: Deterministic Crash Recovery for NAND Flash Storage Systems
inferred← citeshttps://doi.org/10.1109/tcad.2020.2982623openalex-snapshot
Temperature-Aware Persistent Data Management for LSM-Tree on 3-D NAND Flash Memory
inferred← citeshttps://doi.org/10.1145/3219617.3219659openalex-snapshot
Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation
inferred← citeshttps://doi.org/10.1145/3224432openalex-snapshot
Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation
inferred← citeshttps://doi.org/10.1145/3316781.3317759openalex-snapshot
Adapting Layer RBERs Variations of 3D Flash Memories via Multi-granularity Progressive LDPC Reading
inferred← citeshttps://doi.org/10.1145/3352460.3358311openalex-snapshot
Exploiting Process Similarity of 3D Flash Memory for High Performance SSDs
inferred← citeshttps://doi.org/10.1145/3663478openalex-snapshot
Characterizing and Optimizing LDPC Performance on 3D NAND Flash Memories
inferred← citeshttps://doi.org/10.23919/date.2019.8715197openalex-snapshot
PATCH: Process-Variation-Resilient Space Allocation for Open-Channel SSD with 3D Flash
inferred← citeshttps://doi.org/10.3390/computers6040028openalex-snapshot
3D NAND Flash Based on Planar Cells
inferred← citeshttps://doi.org/10.3390/mi12070846openalex-snapshot
Observation and Optimization on Garbage Collection of Flash Memories: The View in Performance Cliff
inferred← citeshttps://doi.org/10.48550/arxiv.1808.04016openalex-snapshot
Architectural Techniques for Improving NAND Flash Memory Reliability
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